Evaluation of Performance on Attribute Control Chart using Variable Sampling Intervals

가변추출구간을 이용한 계수치 관리도의 수행도 평가

In case of pn control chart often used in mass production system of plant industry and so on, we could evaluate it's performance by the approximation to normal distribution. It has many differences according to sample sizes and defective fraction, and have disadvantage that needs much samples to use the normal distribution approximation. Existent control charts can not detect the cause of process something wrong because it is taking the sampling intervals of fixed length about all times from the process. Therefore, to overcome this shortcoming we use VSI(variable sampling intervals) techniques in this paper. This technique takes a long sampling interval to have the next sampling point if the sample point is in stable state, and if the sample point is near control lines, it takes short sampling interval because the probability to escape control limit is high. To analyze performance of pn control charts that have existent fixed sampling intervals(FSI) and that use VSI technique, we compare ATS of two charts, and analyze the performance of each control chart by the sample sizes, process fraction defective and control limits that Ryan and Schwertman had proposed.