• Title/Summary/Keyword: Probe length

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Realization for Each Element for capturing image in Scanning Electron Microscopy (주사 전자 현미경에서 영상 획득에 필요한 구성 요소 구현)

  • Lim, Sun-Jong;Lee, Chan-Hong
    • Laser Solutions
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    • v.12 no.2
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    • pp.26-30
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    • 2009
  • Scanning Electron Microscopy (SEM) includes high voltage generator, electron gun, column, secondary electron detector, scan coil system and image grabber. Column includes electron lenses (condenser lens and objective lens). Condenser lens generates fringe field, makes focal length and control spot size. Focal length represents property of lens. Objective lens control focus. Most of the electrons emitted from the filament, are captured by the anode. The portion of the electron current that leaves the gun through the hole in the anode is called the beam current. Electron beam probe is called the focused beam on the specimen. Because of the lens and aperture, the probe current becomes smaller than the beam current. It generate various signals(backscattered electron, secondary electron) in an interaction with the specimen atoms. In this paper, we describe the result of research to develop the core elements for low-resolution SEM.

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A Study on 3-Dimensional Profilometry of Steam Generator Tube Using a New Eddy Current Probe

  • Kim, Young-Kyu;Song, Myung-Ho;Choi, Myung-Sik
    • Journal of the Korean Society for Nondestructive Testing
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    • v.30 no.3
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    • pp.225-235
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    • 2010
  • There are many types of the geometric transitions such as dent, bulge, protrusion, expansion, etc, on the inner and outer surfaces of heat exchanger tubes, steam generator tubes, and condenser tubes of nuclear power plants. Such geometric transition causes a local residual stress in heat exchanger tubes and acts as a structural factor accelerating the evolution of defects, in particular stress corrosion cracks. In the conventional eddy current test methods, the bobbin coil profilometry can provide 2-dimensional geometric information on the variation of the average inner diameter along the tube length, but the 3-dimensional distribution and the quantitative size of a local geometric transition existing in the tube cannot be measured. In this paper, a new eddy current probe, developed for the 3-dimensional profile measurement, is introduced and its superior performance is compared with that from the conventional bobbin coil profilometry for the various types of geometric transition. Also, the accuracy of the probe for the quantitative profile measurement is verified by comparing the results with that from the laser profilometry. It is expected that the new eddy current probe and techniques can be effectively used for an optimization of the tube expansion process, and the management of tubes with geometric transitions in service.

Fabrication of Bump-type Probe Card Using Bulk Micromachining (벌크 마이크로머시닝을 이용한 Bump형 Probe Card의 제조)

  • 박창현;최원익;김용대;심준환;이종현
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.3 no.3
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    • pp.661-669
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    • 1999
  • A probe card is one of the most important pan of test systems as testing IC(integrated circuit) chips. This work was related to bump-type silicon vertical probe card which enabled simultaneous tests for multiple semiconductor chips. The probe consists of silicon cantilever with bump tip. In order to obtain optimum size of the cantilever, the dimensions were determined by FEM(finite element method) analysis. The probe was fabricated by RIE(reactive ion etching), isotropic etching, and bulk-micromachining using SDB(silicon direct bonding) wafer. The optimum height of the bump of the probe detemimed by FEM simulation was 30um. The optimum thickness, width, and length of the cantilever were 20 $\mum$, 100 $\mum$,and 400 $\mum$,respectively. Contact resistance of the fabricated probe card measured at contact resistance testing was less than $2\Omega$. It was also confirmed that its life time was more than 20,000 contacts because there was no change of contact resistance after 20,000 contacts.

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The Effect of n-Alkanols on the Lateral Diffusion of Synaptosomal Plasma Membrane Vesicles Isolated from Bovine Cerebral Cortex (n-Alkanols가 소의 대뇌피질로부터 분리한 Synaptosomal Plasma Membrane Vesicles의 측방확산운동 범위와 속도에 미치는 영향)

  • Chung, In-Kyo;Kang, Jung-Sook;Yun, Il
    • The Korean Journal of Pharmacology
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    • v.29 no.1
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    • pp.157-163
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    • 1993
  • Intramolecular excimer formation with the fluorescent probe 1,3-di(1-pyrenyl)propane (Py-3-Py) was used to investigate the effects of methanol, ethanol, 1-propanol, 1-butanol, 1-pentanol, 1-hexanol, 1-heptanol, 1-octanol, 1-nonanol and 1-decanol on the lateral diffusion of synaptosomal plasma membrane vesicles isolated from bovine cerebral cortex (SPMV). The n-alkanols increased the excimer to monomer fluorescence intensity ratio (I'/I) of Py-3-Py in the SPMV. In a dose-dependent manner, n-alkanols increased lateral diffusion of hydrocarbon region of bulk (inner+outer monolayers) SPMV lipid bilayers, and the potencies of n-alkanols up to l-nonanol increased with carbon chain length. It appears that the potencies in bilayer fluidization due to the lateral diffusion increase by 1 order of magnitude as the carbon chain length increases by two carbon atoms. The cut-off phenomenon was reached at 1-decanol, where further increase in hydrocarbon length resulted in a decrease in pharmacological activity.

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Cytogenetic and Molecular Genetic Studies on Duchenne Muscular Dystrophy (Duchenne Muscular Dystrophy에 관한 세포유전학 및 분자유전학적 연구)

  • Hong, Hea-Sook
    • Journal of Korean Biological Nursing Science
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    • v.7 no.1
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    • pp.29-46
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    • 2005
  • Purpose ; 본 연구는 X-염색체와 관련된 장애 중에서 가장 흔하고 심한 Duchenne Muscular Dystrophy(DMD)의 세포유전학 및 분자유전학적 특성을 설명하기 위해서 DMD에 영향을 받고 있는 두 가계의 13명을 대상으로 가계도 분석과 염색체 분석 및 DNA 분석을 하였다. Method ; DNA분석은 DNA probe을 이용한 Southern blotting method로써 RFLPs와 DMD유전자 부위의 exon소실 유무를 조사하여 아래와 같은 결과를 얻었다. Conclusion ; A 염색체 분석 : 말초혈액과 양수를 표본으로 High-Resolution GTG염색에서 A가계와 B가계의 염색체 분석에서 12명의 염색체는 정상 X-염색체였으나 B가계의 I-2(DMD여성)에서 46, x,-x,+t(2:x)(q 21.1 : p21.2)로 나타난다. B. DNA분석3 : 1) RFLPs의 분석 J66,XJ-1.1,754-11로써 B가계의 RELPs(Restriction Fragment Length Polymorphisms)에서 J66/Pst I은 1.7hb(E), 1.6kb(e)을 보여 주었고 XJ-1.1/Taq I은 3.6kb(F), 3.0kb(f), 754-11/EoR I은 4.2kb(G), 2.0kb(g)의 대립인자를 나타내었다. 이상의 결과를 바탕으로 영향을 받고 있는 남자 (II-2)의 haplotype는 보인자인 어머니의 한쪽 인자를 받았으며 어머니와 딸은 보인자이고 임산부의 태아는 남아였고 태아의 인자들은 그의 할아버지로부터 물려받아 DMD에 영향을 받지 않은 것으로 진단되었다. 2) DMD 유전자의 exon 소실에 대한 분석 cDNA probe 8과 cDNA probe 2b-3으로써 소실에 대한 진단은 영향을 받은 남자(II-2)는 cDNA probe 8에서 12, 7.3, 6.6, 4.2kb에 소실이 있고 cDNA 2b-3은 1.7kb에 소실에 나타났다.

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Non-Destructive Evaluation of Material Properties of Nanoscale Thin-Films Using Ultrafast Optical Pump-Probe Methods

  • Kim, Yun-Young;Krishnaswamy, Sridhar
    • Journal of the Korean Society for Nondestructive Testing
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    • v.32 no.2
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    • pp.115-121
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    • 2012
  • Exploration in microelectromechanical systems(MEMS) and nanotechnology requires evaluation techniques suitable for sub-micron length scale so that thermal and mechanical properties of novel materials can be investigated for optimal design of miro/nanostructures. The ultrafast optical pump-probe technique provides a contact-free and non-destructive way to characterize nanoscale thin-films, and its ultrahigh temporal resolution enables the study of heat-transport phenomena down to a sub-picosecond regime. This paper reviews the principle of optical pump-probe technique and introduces its application to the area of micro/nano-NDE.

Fabrication of Test Socket from BeCu Metal Sheet (BeCu 금속박판을 이용한 테스트 소켓 제작)

  • Kim, Bong-Hwan
    • Journal of Sensor Science and Technology
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    • v.21 no.1
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    • pp.34-38
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    • 2012
  • We have developed a cost effective test socket for ball grid array(BGA) integrated circuit(IC) packages using BeCu metal sheet as a test probe. The BeCu furnishes the best combination of electrical conductivity and corrosion resistance. The probe of the test socket was designed with a BeCu cantilever. The cantilever was designed with a length of 450 ${\mu}m$, a width of 200 ${\mu}m$, a thickness of 10 ${\mu}m$, and a pitch of 650 ${\mu}m$ for $11{\times}11$ BGA. The fabrication of the test socket used techniques such as through-silicon-via filling, bonding silicon wafer and BeCu metal sheet with dry film resist(DFR). The test socket is applicable for BGA IC chip.

Diffusion of Probe Molecule in Small Liquid n-Alkanes: A Molecular Dynamics Simulation Study

  • Yoo, Choong-Do;Kim, Soon-Chul;Lee, Song-Hi
    • Bulletin of the Korean Chemical Society
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    • v.29 no.8
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    • pp.1554-1560
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    • 2008
  • The probe diffusion and friction constants of methyl yellow (MY) in liquid n-alkanes of increasing chain length were calculated by equilibrium molecular dynamics (MD) simulations at temperatures of 318, 418, 518 and 618 K. Lennard-Jones particles with masses of 225 and 114 g/mol are modeled for MY. We observed that the diffusion constant of the probe molecule follows a power law dependence on the molecular weight of nalkanes, DMY${\sim}M^{-\gamma}$ well. As the molecular weight of n-alkanes increases, the exponent $\gamma$ shows sharp transitions near n-dotriacontane ($C_{32}$) for the large probe molecule (MY2) at low temperatures of 318 and 418 K. For the small probe molecule (MY1) $D_{MY1}$ in $C_{12}$ to C80 at all the temperatures are always larger than Dself of n-alkanes and longer chain n-alkanes offer a reduced friction relative to the shorter chain n-alkanes, but this reduction in the microscopic friction for MY1 is not large enough to cause a transition in the power law exponent in the log-log plot of DMY1 vs M of n-alkane. For the large probe molecule (MY2) at high temperatures, the situation is very similar to that for MY1. At low temperatures and at low molecular weights of n-alkanes, $D_{MY2}$ are smaller than $D_{self}$ of n-alkanes due to the relatively large molecular size of MY2, and MY2 experiences the full shear viscosity of the medium. As the molecular weight of n-alkane increases, $D_{self}$ of n-alkanes decreases much faster than $D_{MY2}$ and at the higher molecular weights of n-alkane, MY2 diffuses faster than the solvent fluctuations. Therefore there is a large reduction of friction in longer chains compared to the shorter chains, which enhances the diffusion of MY2. The calculated friction constants of MY1 and MY2 in liquid n-alkanes supported these observations. We deem that this is the origin of the so-called“solventoligomer”transition.

Fabrication of Probe Beam by Using Joule Heating and Fusing (절연절단법을 이용한 프로브 빔의 제작)

  • Hong, Pyo-Hwan;Kong, Dae-Young;Lee, Dong-In;Kim, Bonghwan;Cho, Chan-Seob;Lee, Jong-Hyun
    • Journal of Sensor Science and Technology
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    • v.22 no.1
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    • pp.89-94
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    • 2013
  • In this paper, we developed a beam of MEMS probe card using a BeCu sheet. Silicon wafer thickness of $400{\mu}m$ was fabricated by using deep reactive ion etching (RIE) process. After forming through silicon via (TSV), the silicon wafer was bonded with BeCu sheet by soldering process. We made BeCu beam stress-free owing to removing internal stress by using joule heating. BeCu beam was fused by using joule heating caused by high current. The fabricated BeCu beam measured length of 1.75 mm and width of 0.44 mm, and thickness of $15{\mu}m$. We measured fusing current as a function of the cutting planes. Maximum current was 5.98 A at cutting plane of $150{\mu}m^2$. The proposed low-cost and simple fabrication process is applicable for producing MEMS probe beam.

Design of Shielded Encircling Send-Receive Type Pulsed Eddy Current Probe Using Numerical Analysis Method

  • Shin, Young-Kil
    • Journal of the Korean Society for Nondestructive Testing
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    • v.33 no.6
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    • pp.505-510
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    • 2013
  • An encircling send-receive type pulsed eddy current (PEC) probe is designed for use in aluminum tube inspection. When bare receive coils located away from the exciter were used, the peak time of the signal did not change although the distance from the exciter increased. This is because the magnetic flux from the exciter coil directly affects the receive coil signal. Therefore, in this work, both the exciter and the sensor coils were shielded in order to reduce the influence of direct flux from the exciter coil. Numerical simulation with the designed shielded encircling PEC probe showed the corresponding increase of the peak time as the sensor distance increased. Ferrite and carbon steel shields were compared and results of the ferrite shielding showed a slightly stronger peak value and a quicker peak time than those of the carbon steel shielding. Simulation results showed that the peak value increased as the defect size (such as depth and length) increased regardless of the sensor location. To decide a proper sensor location, the sensitivity of the peak value to defect size variation was investigated and found that the normalized peak value was more sensitive to defect size variation when the sensor was located closer to the exciter.