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http://dx.doi.org/10.7779/JKSNT.2013.33.6.505

Design of Shielded Encircling Send-Receive Type Pulsed Eddy Current Probe Using Numerical Analysis Method  

Shin, Young-Kil (Department of Electircal Engineeirng, Kunsan National University)
Publication Information
Abstract
An encircling send-receive type pulsed eddy current (PEC) probe is designed for use in aluminum tube inspection. When bare receive coils located away from the exciter were used, the peak time of the signal did not change although the distance from the exciter increased. This is because the magnetic flux from the exciter coil directly affects the receive coil signal. Therefore, in this work, both the exciter and the sensor coils were shielded in order to reduce the influence of direct flux from the exciter coil. Numerical simulation with the designed shielded encircling PEC probe showed the corresponding increase of the peak time as the sensor distance increased. Ferrite and carbon steel shields were compared and results of the ferrite shielding showed a slightly stronger peak value and a quicker peak time than those of the carbon steel shielding. Simulation results showed that the peak value increased as the defect size (such as depth and length) increased regardless of the sensor location. To decide a proper sensor location, the sensitivity of the peak value to defect size variation was investigated and found that the normalized peak value was more sensitive to defect size variation when the sensor was located closer to the exciter.
Keywords
Encircling Probe; Send-Receive Type; Pulsed Eddy Current (PEC); Numerical Analysis Method;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
1 J. Blitz, "Electrical and Magnetic Methods of Nondestructive Testing," Bristol: Adam Hilger (1991)
2 C. J. Renken, "The use of a personal computer to extract information from pulsed eddy current," Materials Evaluation, Vol. 59, No. 3, pp. 356-360 (2001)
3 Y. K. Shin and D. M. Choi, "Design of a shielded reflection type pulsed eddy current probe for the evaluation of thickness," Journal of the Korean Society for Nondestructive Testing, Vol. 27, No. 5, pp. 398-408 (2007)   과학기술학회마을
4 Y. K. Shin, D. M. Choi and H. S. Jung, "Comparison of simulated PEC probe performance for detecting wall thickness reduction," Journal of the Korean Society for Nondestructive Testing, Vol. 29, No. 6, pp. 563-569 (2009)   과학기술학회마을
5 Y. K. Shin, D. M. Choi, Y. J. Kim and S. S. Lee, "Signal characteristics of differential pulsed eddy current sensors in the evaluation of plate thickness," NDT&E International, Vol. 42, No. 3, pp. 215-221 (2009)   DOI   ScienceOn