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http://dx.doi.org/10.7779/JKSNT.2012.32.2.115

Non-Destructive Evaluation of Material Properties of Nanoscale Thin-Films Using Ultrafast Optical Pump-Probe Methods  

Kim, Yun-Young (Department of Mechanical Engineering, Northwestern University)
Krishnaswamy, Sridhar (Department of Mechanical Engineering, Northwestern University)
Publication Information
Abstract
Exploration in microelectromechanical systems(MEMS) and nanotechnology requires evaluation techniques suitable for sub-micron length scale so that thermal and mechanical properties of novel materials can be investigated for optimal design of miro/nanostructures. The ultrafast optical pump-probe technique provides a contact-free and non-destructive way to characterize nanoscale thin-films, and its ultrahigh temporal resolution enables the study of heat-transport phenomena down to a sub-picosecond regime. This paper reviews the principle of optical pump-probe technique and introduces its application to the area of micro/nano-NDE.
Keywords
Picosecond Ultrasonics; Laser-Based Non-Destructive Evaluation; Thin-Film; Materials Characterization;
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