• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 춘계학술대회 논문집 유기절연재료 방전 플라즈마연구회
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• pp.89-91
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• 2003

In this paper, using a Langmuir probe Ar gas characteristic of electrodeless fluorescent lamp which used an inductively coupled plasma were investigated. The RF output changed into 5-50W in 13.56MHz. At this time internal plasma voltage of the chamber and probe current were measured while changing in -70V - +70V with a supply voltage by Langmuir probe. If pressure of Ar gas was increased, the electric current tended to decrease. Also, an electric current was increased according to an increase of a RF output.

• Journal of Magnetics
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• 제20권3호
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• pp.312-316
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• 2015

Unlike conventional Eddy Current Test (ECT), Pulsed Eddy Current (PEC) uses a multiple-frequency current pulse through the excitation coil. In the present study, the detection of subsurface cracks using a specially designed probe that allows the detection of a deeper crack with a relatively small current density has been attempted using the PEC technique. The tested sample is a piece of 304 stainless steel (SS304) with a thickness of 30mm. Small electrical discharge machining (EDM) notches were put in the test sample at different depths from the surface to simulate the subsurface cracks in a pipe. The designed PEC probe consists of an excitation coil and a Hall sensor and can detect a subsurface crack as narrow and shallow as 0.2 mm wide and 2 mm deep. The maximum distance between the probe and the defect is 28 mm. The peak amplitude of the detected pulse is used to evaluate the cracks under the sample surface. In time domain analysis, the greater the crack depth the greater the peak amplitude of the detected pulse. The experimental results indicated that the proposed system has the potential to detect the subsurface cracks in stainless steel plates.

• 한국진공학회지
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• 제17권4호
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• pp.331-340
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• 2008

교류 $50{\sim}100\;kHz$의 고주파와 수 kV의 고전압으로 구동되는 냉음극 형광램프의 전류 및 전압을 계측하는 방법을 조사하였다. 고 전압 측에 설치되는 프로브 자체의 임피던스 영향으로 램프의 휘도가 변화하고 누설 전류가 발생하여 정확한 전류 및 전압의 계측이 어렵다. 따라서 프로브의 임피던스와 누설 전류를 고려한 회로 분석을 통하여 올바른 계측 방법을 제시하였다. 프로브 설치로 휘도 변화 시, 인버터에 입력되는 DC 전압을 조정하여 램프의 특정 휘도를 유지하여 계측한다. 램프 전류($I_G$)는 접지 측에서 전류 프로브나 고주파 전류계로 계측하며, 전압은 고 전압 측에 설치한 전압 프로브로 계측한다. 램프 전압($V_C$)은 고전압이 인가되는 냉음극과 안전 캐패시터 사이에서 계측하며, 인버터의 출력 전압(VI)은 안전 캐패시터와 인버터 출력단 사이에서 계측한다. 램프 전압($V_C$)과 램프 전류($I_G$)의 위상차가 없기 때문에, 램프 자체의 순수 소모 전력은 램프 전압($V_C$)와 램프 전류($I_G$)의 곱이다. 인버터의 출력 전압($V_I$)과 램프 전류($I_G$)의 위상차($\theta$)는 전압 프로브의 용량성 임피던스로 인하여 계측값이 부정확하며, 회로의 분석에서 얻어진 $cos{\theta}=V_C/V_I$로부터 위상차를 얻을 수 있다.

• 비파괴검사학회지
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• 제27권2호
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• pp.89-96
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• 2007

원자력발전소 증기발생기 전열관의 건전성을 평가하기 위해서 계획예방정비 기간에 수행되는 와전류검사의 여러 가지 기법중에서 보빈 탐촉자 검사는 가장 기본적인 중요한 검사이다. 와전류 탐촉자는 검사 계통의 핵심적인 부분으로서 특정 절차서에 따라 평가가 이루어질 때 대상 시험체의 합부를 결정하는 자료를 제공하게 된다. 또한, 수집된 와전류신호의 품질은 사용되는 탐촉자의 설계특성, 기하학적 형태, 운전주파수에 따라 결정되고, 검사결과에 미치는 영향이 크기 때문에 와전류검사 탐촉자의 선정은 특히 중요하다. 본 연구에서는 국내 원전 증기발생기 전열관 검사를 위한 최적의 차동형 보빈탐촉자를 설계하였다. 또한 보빈탐촉자 시작품의 전기적 특성과 와전류신호 특성 평가를 수행하여 만족한 결과를 도출하였다.

• 비파괴검사학회지
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• 제21권5호
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• pp.532-541
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• 2001

재료의 노화에 의한 강도 및 인성 감소치를 정량적으로 평가하는 비파괴적 기법의 개발이 시도되고 있으며 전기비저항법도 그 중의 하나이다. 본 연구에서는 전기비저항법의 열화도 평가에의 적용성을 살펴보기 위해 먼저 6종 10 가지의 비자성 금속을 측정시료로 선택하여 직류 two-point probe법(혹은 2탐침법)으로 전기비저항을 계산한 결과와 비접촉식 와전류 방법으로 전기비저항을 측정한 결과를 서로 비교하였다. 또한, 1Cr-1Mo-0.25V강에 대하여 비파괴적 측정 방법인 four-point probe 방법(혹은 4탐침법)을 사용하여 얻은 결과와 기존의 2탐침법을 사용하여 얻은 결과를 서로 비교하여 현장에서의 4탐침 기술의 적용 가능성을 살펴보았다. 1Cr-1Mo-0.25V강에 대하여 2탐침법으로 구한 비저항 값과 4탐침법으로 구한 비저항 측정값의 차이는 0.6%였다. 따라서 4탐침법을 사용하여 현장에서 금속소재의 열화도의 비파괴적 평가가 가능하다고 사료된다.

• 한국전기전자재료학회논문지
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• 제19권9호
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• pp.825-831
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• 2006

As an increase of chip complexity and level of chip integration, chip input/output (I/O) pad pitches are also drastically reduced. With arrival of high complexity SoC (System on Chip) and SiP (System in Package) products, conventional horizontal type probe card showed its limitation on probing density for wafer level test. To enhance probing density, we proposed new vertical type probe card that has the $70{\mu}m$ probe needle with tungsten wire in $80{\mu}m$ micro-drilled hole in ceramic board. To minimize alignment error, micro-drilling conditions are optimized and epoxy-hardening conditions are also optimized to minimize planarity changes. To apply wafer level test for target devices (T5365 256M SDRAM), designed probe card was characterized by probe needle tension for test, contact resistance measurement, leakage current measurement and the planarity test. Compare to conventional probe card with minimum pitch of $50{\sim}125{\mu}m\;and\;2\;{\Omega}$ of average contact resistance, designed probe card showed only $22{\mu}$ of minimum pitch and $1.5{\Omega}$ of average contact resistance. And also, with the nature of vertical probing style, it showed comparably small contact scratch and it can be applied to bumping type chip test.

• 비파괴검사학회지
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• 제26권6호
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• pp.403-410
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• 2006

Eddy current testing (ECT) signals produced by a differential bobbin coil probe vary according to probe design parameters such as the number of turns, geometry and coil gap size. In the present study, the characteristics of a differential bobbin coil probe signals are investigated by numerical simulation in order to determine the optimum coil gap. For verification of numerical simulation accuracy, a specially designed bobbin probe of which the coil gap can be adjusted is fabricated and a series of experiments to acquire signals from two kinds of standard tubes with the variation in coil gap is performed. Then, the experimental signals are compared to the simulation results. Based on this investigation, a decision on the optimum range of coil gap is made. The theoretically predicted signals agree very well to the experimental signals. In fact, this excellent agreement demonstrates a high potential of the simulation as a design optimization tool for ECT bobbin probes.

• Tribology and Lubricants
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• 제11권5호
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• pp.40-46
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• 1995

This study concerns the design and development of the non-vibrating capacitance probe which could be used as a non-contact sensor for tribological wear. This device detects surface charge through temporal variation in the work function of a material. Experiments are performed to demonstrate the operation of the probe on a roating aluminum shaft. The reference electrode of the probe, made of lead, is placed adjacent (< 1.25-mm distance) to the shaft. Both surfaces which are electrically connected, form a capacitor. An artificial spatial variation in the work function is imposed on the shaft surface by coating a segment along the shaft circumference with a colloidal silver paint. As the shaft rotates, the reference electode senses changing contact potential difference with the shaft surface, owing to compositional variation. Temporal variation in the contact potential difference induces a current through the electrical connection. This current is amplified and converted to a voltage signal by an electoronic circuit with an operational amplifier. The magnitude of the signal decreases asymptotically with the electrode-shaft distance and increases linearly with the rotational frequency. These results are consistent with the theoretical model. Potential applications of the probe on wear monitoring are proposed.

• 한국조명전기설비학회:학술대회논문집
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• 한국조명전기설비학회 2008년도 추계학술대회 논문집
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• pp.367-370
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• 2008

In this paper, the effects of the position and the angle of the auxiliary probes on the measurements of the low frequency ground impedance with the fall-of-potential method are described iud the testing techniques to minimize the measuring errors are proposed. The fall-of-pot ential method is theoretically based on the potential and current measuring principle and the measuring error is primarily caused by the position and angle of auxiliary probes. In order to analyze the characteristics of ground impedance due to the location of the potential probe, ground impedances were measured in case that the distance of current probe was fixed at 50[m] and the distance of potential probe was located from 10[m] to 50[m]. Also, the potential robe was located at 30[$^{\circ}$], 40[$^{\circ}$], 60[$^{\circ}$], 90[$^{\circ}$], and 180[$^{\circ}$]. The results could be help to determine the location of potential probe when the ground impedance was measured at grounding system.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.152-152
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• 2008

Micro probe with Ni-Co tip was designed. Unit processes for fabricating the micro probe were developed. We are investigated the micro probe tip using by Ni-Co alloy. One-step and three-step needle was fabricated by plating process, CMP, and photolithography process. The plating thickness was varied by current density and time. Futher data will be extract by different process conditions.