• 제목/요약/키워드: Probe current

검색결과 568건 처리시간 0.026초

Comparison of Simulated PEC Probe Performance for Detecting Wall Thickness Reduction

  • Shin, Young-Kil;Choi, Dong-Myung;Jung, Hee-Sung
    • 비파괴검사학회지
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    • 제29권6호
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    • pp.563-569
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    • 2009
  • In this paper, four different types of pulsed eddy current(PEC) probe are designed and their performance of detecting wall thickness reduction is compared. By using the backward difference method in time and the finite element method in space, PEC signals from various thickness and materials are numerically calculated and three features of the signal are selected. Since PEC signals and features are obtained by various types and sizes of probe, the comparison is made through the normalized features which reflect the sensitivity of the feature to thickness reduction. The normalized features indicate that the shielded reflection probe provides the best sensitivity to wall thickness reduction for all three signal features. Results show that the best sensitivity to thickness reduction can be achieved by the peak value, but also suggest that the time to peak can be a good candidate because of its linear relationship with the thickness variation.

피부전류량의 화상중첩에 의한 경혈의 시각화 (Visualization of Acupoint by Image Overlapping of Skin Current)

  • 이용흠;김용진;고수복;정동명
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1999년도 하계종합학술대회 논문집
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    • pp.563-566
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    • 1999
  • The functional diagnosis instrument should be preceded first to both the accurate selection of exact acupoint and discrimination. so the measuring and stimulating method are improved to SPAC pattern to evaluate impedance existed in the body. As a result, the resistance factor between skin and probe, the dipolization of cell was reduced so that the judgement of acupoint is advanced. After extraction of optimization parameter of SPAC pattern which the high discrimination efficiency and the lowest affection on the human body is controlled by using microprocessor to enhance conviction. The discrimination efficiency was confirmed by meridian visualization system. Also mechanism of probe was improved to increase efficiency of image recognition processing. The image of discriminated acupoint with probe is obtained by using a camera, the location on the tip of probe is recognized and processed. And then these are converted to virtual color by proportional to measuring current level of scan point on skin.

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Understanding of RF Impedance Matching System Using VI-Probe

  • Lee, Ji Ha;Park, Hyun Keun;Lee, Jungsoo;Hong, Snag Jeen
    • 반도체디스플레이기술학회지
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    • 제19권3호
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    • pp.43-48
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    • 2020
  • The demand for stable plasma has been on the rise because of the increased delivery power amount in the chamber for improving productivity, and fast and accurate plasma impedance matching become a crucial performance measure for radio frequency (RF) power system in semiconductor manufacturing equipment. In this paper, the overall impedance matching was understood, and voltage and current values were extracted with voltage - current (VI) probe to measure plasma impedance in real-time. Actual matching data were analyzed to derive calibration coefficient for V and I measurements to understand the characteristics of VI probe, and we demonstrated the tendency of RF impedance matching according to changes in load impedance. This preliminary empirical research can contribute to fast RF matching as well as advanced equipment control for the next level of detailed investigation on embedded system based-RF matching controller.

ECR Reactor 내의 Langmuir Probe 시뮬레이션 (Simulation of a Langmuir Probe in an ECR Reactor)

  • 김훈
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1994년도 하계학술대회 논문집 C
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    • pp.1609-1611
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    • 1994
  • In ECR and helicon reactors for plasma processing, a high density plasma is generated in a source region which is connected to a diffusion region where the processing takes place. Large density and potential gradients can develop at the orifice of the source which drive ion currents into the diffusion region. The average ion velocity may become the order of the sound velocity. Measurements of the ion saturation current to a Langmuir probe are used as a standard method of determining the plasma density in laboratory discharges. However, the analysis becomes difficult in a steaming plasma. We have used the HAMLET plasma simulator to simulate the ion flow to a large langmuir probe in an ECR plasma. The collection surface was aligned with the Held upstream, normal to the field, and downstream. ion trajectories through the electric and magnetic fields were calculated including ion-neutral collisions. We examines the ratio of ion current density to plasma density as a function of magnetic field and pressure.

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Detectability evaluation of the loose parts in steam generator by eddy current testing techniques

  • Kim, Kyungcho;Min, Kyongmahn;Kim, Changkuen;Kim, Jin-Gyum;Jhung, Myungjo
    • Nuclear Engineering and Technology
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    • 제50권7호
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    • pp.1160-1167
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    • 2018
  • Detectability of the loose parts (LPs) in steam generator (SG) was studied with eddy current testing technique such as X-probe, bobbin and rotating coils ($MRPC^{(R)}$) as a function of LP size and spacing between LP and tube or between LP and support structures. SG mockup simulating SG tube and support structures with LP was fabricated. The X-probe showed slightly better detectability than $MRPC^{(R)}$ for LP of ferrous (F-LP) material and vice versa for LP of nonferrous (NF-LP) material. In terms of feasibility, inspection rate and other predictable features of the SG tubing inspections, X-probe can be used reliably for monitoring the LPs and the flaws formed by LPs on SG tubes.

외부 전류가 흐를 때 초전도 선재에서의 전류 분포 (current profiles in a coated conductor with transport current)

  • 유재은;이상무;정예현;이재영;염도준
    • 한국초전도ㆍ저온공학회논문지
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    • 제9권3호
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    • pp.1-4
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    • 2007
  • The current profiles in a coated conductor with transport current were calculated using an iterative inversion method from the data of the magnetic flux density profiles measured. The applied current was increased from 0 to 60 A by 10A step and decreased down to -60A by 20A step. The magnetic flux profiles were measured at a distance of 400 mm above the surface of the coated conductor using a scanning hall probe method. The current profiles calculated were very different from the Bean model: current density profile is not a constant in the critical region. However the aspect of the change of the current and magnetic flux density profiles in the case of decreasing applied current are similar to the theoretical calculations in Brandt's paper.

레이어가 있는 하프스페이스에서 페라이트코아가 있는 와류탐침에 대한 연구 (A Study on Eddy-current Probe with Ferrite Cores over a Layered Half-Space)

  • 김태원;변기량;최재훈;강유석;황호정
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 추계종합학술대회 논문집
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    • pp.613-616
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    • 1998
  • In this paper, a model of a Eddy-current probe coil with a ferrite core in the presence of a half-space with a layer is developed. The half-space with a layer is accounted for by computing the appropriate Green's function by using Bessel transforms. Upon introducing equivalent Amperian currents within a core to explain effect to a impedance change in the coil due to a (ferrite) core, we derive a volume integral equation, The integral equation is transformed via the method of moments into a vector-matrix equation, which is then solved using a linear equation solver. Through the above processing, we computed impedance value in a Eddy-current probe coil due to a conductivity change of layer.

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외삽 차동형 탐촉자를 사용한 연구로용 핵연료봉의 와전류탐상 (Eddy Current Testing using Encircling Differential Probe for Research Reactor Fuel Rods)

  • 이윤상;김창규
    • 비파괴검사학회지
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    • 제21권5호
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    • pp.561-564
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    • 2001
  • 연구로인 하나로의 핵연료봉은 제조 시 피복층에 품질 관리 절차에서 규정한 크기 이상의 결함이 없도록 와전류탐상 검사를 하도록 되어 있다. 와전류탐상검사 절차를 수립하기 위하여 외삽 차동형 와전류탐촉자 및 표준시험편을 제작하였다. 임피던스 분석기를 사용하여 제작된 탐촉자에 대한 임피던스값을 측정하여 검사주파수 영역에서 최대감도를 얻도록 제작되었는지를 조사하였고, 이 탐촉자 및 MIZ-40A 와전류탐상기를 사용하여, 요구되는 결함 크기를 검출할 수 있는가를 조사하였다. 그 결과 이 탐촉자를 사용하여 길이 2mm 피복 두께 대비 깊이 10%인 인공 노치를 검출할 수 있었으며, 연구로용 핵연료봉의 제조 시 피복층에 존재하는 결함을 성공적으로 검사할 수 있었다.

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절연절단법을 이용한 프로브 빔의 제작 (Fabrication of Probe Beam by Using Joule Heating and Fusing)

  • 홍표환;공대영;이동인;김봉환;조찬섭;이종현
    • 센서학회지
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    • 제22권1호
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    • pp.89-94
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    • 2013
  • In this paper, we developed a beam of MEMS probe card using a BeCu sheet. Silicon wafer thickness of $400{\mu}m$ was fabricated by using deep reactive ion etching (RIE) process. After forming through silicon via (TSV), the silicon wafer was bonded with BeCu sheet by soldering process. We made BeCu beam stress-free owing to removing internal stress by using joule heating. BeCu beam was fused by using joule heating caused by high current. The fabricated BeCu beam measured length of 1.75 mm and width of 0.44 mm, and thickness of $15{\mu}m$. We measured fusing current as a function of the cutting planes. Maximum current was 5.98 A at cutting plane of $150{\mu}m^2$. The proposed low-cost and simple fabrication process is applicable for producing MEMS probe beam.

Design of Shielded Encircling Send-Receive Type Pulsed Eddy Current Probe Using Numerical Analysis Method

  • Shin, Young-Kil
    • 비파괴검사학회지
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    • 제33권6호
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    • pp.505-510
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    • 2013
  • An encircling send-receive type pulsed eddy current (PEC) probe is designed for use in aluminum tube inspection. When bare receive coils located away from the exciter were used, the peak time of the signal did not change although the distance from the exciter increased. This is because the magnetic flux from the exciter coil directly affects the receive coil signal. Therefore, in this work, both the exciter and the sensor coils were shielded in order to reduce the influence of direct flux from the exciter coil. Numerical simulation with the designed shielded encircling PEC probe showed the corresponding increase of the peak time as the sensor distance increased. Ferrite and carbon steel shields were compared and results of the ferrite shielding showed a slightly stronger peak value and a quicker peak time than those of the carbon steel shielding. Simulation results showed that the peak value increased as the defect size (such as depth and length) increased regardless of the sensor location. To decide a proper sensor location, the sensitivity of the peak value to defect size variation was investigated and found that the normalized peak value was more sensitive to defect size variation when the sensor was located closer to the exciter.