• Title/Summary/Keyword: Power Shift

Search Result 1,057, Processing Time 0.032 seconds

A Method for Calculating Reactive Power Service Charges using Reactive Power Markets (무효전력 시장을 이용한 무효전력요금 산정 방법의 고찰)

  • Sohn, Hyoung-Suk;Ro, Kyoung-Soo
    • Proceedings of the KIEE Conference
    • /
    • 2003.11a
    • /
    • pp.484-487
    • /
    • 2003
  • With the restructuring of the electric power industry during the past decade, operation and control strategies have undergone a shift in paradigm. Certain activities that were earlier considered as part of the integrated electricity supply(such as voltage and frequency control) are now treated as separate services and often independently managed and accounted for. This paper examines the management of reactive power services in deregulated electricity markets around the world. From the review several diverse methods for handling reactive power within the deregulated market framework emerges. While in many of the markets, proper financial compensation mechanisms exist to compensate the providers for their service, some others continue to handle reactive power through regulatory frameworks and technical operation guidelines.

  • PDF

Development of the Assembly Line Tester of Power Transmission for Lift Truck (지게차용 동력전달장치의 조립라인 전용시험기 개발)

  • Jang, Kyoung-Yeol;Yoo, Woo-Sik
    • IE interfaces
    • /
    • v.23 no.1
    • /
    • pp.58-67
    • /
    • 2010
  • The purpose of this paper is to present the development processes of the assembly line tester of power transmission for lift truck. Because power transmission is most important part of lift truck, all assembled powertrain parts must be inspected for operational defects, pressures and RPM. Developed assembly line tester is designed to take about 25 minutes for inspecting each assembled power transmission and located it at the end of assembled line. The assembly line no-load tester consists of three parts: (1) the driving hardware part; for installing and operating the transmission. (2) control PCB part; send data from sensors to a computer and control driving part, (3) operation software of no-load tester; for an automatic inspection or manual inspection, for database management and printing transcripts.

Parallel Driven Power Supply with Low Cost Hot Swap Controller for Server (저가형 Hot Swap Controller를 가지는 병렬 구동 서버용 전원 장치)

  • Yi, KangHyun
    • The Transactions of The Korean Institute of Electrical Engineers
    • /
    • v.67 no.6
    • /
    • pp.738-744
    • /
    • 2018
  • This paper proposes a low cost hot swap operation circuit of a parallel operation power supply for servers. Hot swap function for server power system is essential in 24 hour operation system such as internet data center, server, factory and etc. Server power supplies used in internet data centers have two or more parallel operations with the hot swap operation. However, the cost of the power supply is high because the controller IC for hot swap operation is very expensive. Therefore, this paper proposes a parallel-operated power supply with a low-cost hot swap controller for servers. The proposed system can operate hot swap function by using discrete devices and reduce the cost by more than 50%. A 1.2kW prototype system is implemented to verify the proposed low cost hot swap controller.

Die Shift Measurement of 300mm Large Diameter Wafer (300mm 대구경 웨이퍼의 다이 시프트 측정)

  • Lee, Jae-Hyang;Lee, Hye-Jin;Park, Sung-Jun
    • Journal of the Korea Academia-Industrial cooperation Society
    • /
    • v.17 no.6
    • /
    • pp.708-714
    • /
    • 2016
  • In today's semiconductor industry, manufacturing technology is being developed for the purpose of processing large amounts of data and improving the speed of data processing. The packaging process in semiconductor manufacturing is utilized for the purpose of protecting the chips from the external environment and supplying electric power between the terminals. Nowadays, the WLP (Wafer-Level Packaging) process is mainly used in semiconductor manufacturing because of its high productivity. All of the silicon dies on the wafer are subjected to a high pressure and temperature during the molding process, so that die shift and warpage inevitably occur. This phenomenon deteriorates the positioning accuracy in the subsequent re-distribution layer (RDL) process. In this study, in order to minimize the die shift, a vision inspection system is developed to collect the die shift measurement data.

Exploring Policy Reform Options for the Welfare Regime Shift in Korea (한국 복지의 새판 짜기를 위한 문제 인식과 방안 모색)

  • Hong, Kyung Zoon
    • Korean Journal of Social Welfare
    • /
    • v.69 no.2
    • /
    • pp.9-30
    • /
    • 2017
  • Generally, regime shift occurs less frequently than policy change and/or government change. Regime shift needs alterations and changes along the three critical components which constitute a domestic regime: (1) the character of the socioeconomic coalition that rules the country; (2) the political and economic institutions through which power is acquired and exercised; and (3) the public policy profile that give political direction to the nation. This paper tries to examine characteristics of the welfare regime of Korea, and explore policy reform options for the welfare regime shift in Korea. From the viewpoint of livelihood security perspective, I firstly tries to examine development process of Korean welfare regime and specify the main characteristics of that regime. Secondly, I present three policy reform options: (1) reform of the formal political institutions such as electoral system and government type; (2) restructuring of the composition of government expenditure structure; and (3) reduction of the informal employment. These three policy reform options are related to the alteration of socioeconomic coalitions and the changes of the political and economic institutions. Instead of concluding remarks, I finally suggest two debate topics to the round table discussion.

  • PDF

Performence Characteristics and Analysis Effect of Maximum Power Saving Device in Metal Parts Heat Treatment Company (금속 부품 열처리업체의 최대전력절감장치 동작 특성 및 효과 분석)

  • Chang, Hong-Soon;Han, Young-Sub;Hwang, Ik-Hwan;Seo, Sang-Hyun
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
    • /
    • v.28 no.6
    • /
    • pp.40-44
    • /
    • 2014
  • In this paper, maximum power is the lowering device using the facility's energy use and peak load electricity through analyzing attitude should like to make it reduce its power base rate. Simulator to manage the demand for power, a maximum electric power base power from electronic watt-hour meters by a device's signal, predictive power, the current power by computing the goal of power for less than Maximum peak power and peak shift, so that you can manage, and peak York, which role you want a cut Metal heat treatment result which analyzes the data, demand for electricity company over the years of analyzing the characteristics of each load, and effects and Reducing power consumption device every month identified seven Sequence control to the load system and successful power control is about showing that the defined goals.

Acculturation and Educational Paradigm Shift of China for Western Educational System (중·서 교육 패러다임의 접변과 변화)

  • Kim, dug sam;Lee, kyung ja
    • Cross-Cultural Studies
    • /
    • v.33
    • /
    • pp.385-406
    • /
    • 2013
  • This research starts based on the assumption that the changes of educational system in China which had been caused by accepting western educational system in the late Qing Dynasty and the early Republic of China are indeed considered as a paradigm shift of educational system in China, This research aims first to investigate what kinds of problems and changes Chinese educational system confronted at that time and second to examine what kinds of implications such changes and problems of paradigm shift may have today in China. In order to achieve the goals of this research, I first researched changes and characteristics of educational paradigm shift occurred in the history of China. On the basis of those findings, I tried to analyze acculturation problems of Chinese educational system for that of western countries at that time, their implications in present time Chinese educational system, and the possibility of further paradigmatic shift in present Chinese education. In this paper, I assumed three historical paradigmatic shifts in educational system in China which had big influences on the foundation of Chinese education, such as the introduction of Confucian Thoughts, the introduction of Civil Examination System in Sui Dynasty, and lastly the introduction of western educational system in the late Qing Dynasty. The last paradigmatic shift occurred by the introduction of western education system into China was very different from the previous two paradigmatic shifts in China in that it was literally initiated by the world with cultures different from those of China, and that's why it is called Spatial Collision. It was also one of the many changes China had been forced to confront unvoluntarily. It was done for many other complicated factors such as the greed of western imperialistic countries, spreading of Christianity and missionary education, domestic resistance against long feudal reigning of Qing Dynasty, and lastly the intellect's eagerness for new knowledge and new ways of thinking. What is surely regretful for the paradigmatic shift of Chinese educational system was that it had been triggered by those many heterogeneous factors, thereby leading to such a sudden, entire and complete shift of Chinese education system. In addition, it was done without a deeper and further consideration of Chinese education system with thousand years of tradition. This situation could be understood to be an impetus strong enough to encourage the advent of a new paradigm propelled by rapid economic growth of China, many problems of western education system, reconsideration of Chinese tradition, and strengthening of women power in China, etc.

The Scan-Based BIST Architecture for Considering 2-Pattern Test (2-패턴 테스트를 고려한 스캔 기반 BIST 구조)

  • 손윤식;정정화
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.40 no.10
    • /
    • pp.45-51
    • /
    • 2003
  • In this paper, a scan-based low power BIST (Built-In Self-Test) architecture is proposed. The proposed architecture is based on STUMPS, which uses a LFSR (Linear Feedback Shift Register) as the test generator, a MISR(Multiple Input Shift Register) as the reponse compactor, and SRL(Shift Register Latch) channels as multiple scan paths. In the proposed BIST a degenerate MISR structure is used for every SRL channel; this offers reduced area overheads and has less impact on performance than the STUMPS techniques. The proposed BIST is designed to support both test-per-clock and test-per-scan techniques, and in test-per-scan the total power consumption of the circuit can be reduced dramatically by suppressing the effects of scan data on the circuits. Results of the experiments on ISCAS 89 benchmark circuits show that this architecture is also suitable for detecting path delay faults, when the hamming distance of the data in the SRL channel is considered.