• Title/Summary/Keyword: Polarization device

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A study on liquid crystal-based electrical polarization control technology for polarized image monitoring device (편광 영상감시 장치를 위한 액정 기반 전기적 편광 조절 기술 연구)

  • Ahn, Hyeon-Sik;Lim, Seong-Min;Jang, Eun-Jeong;Choi, Yoonseuk
    • Journal of IKEEE
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    • v.26 no.3
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    • pp.416-421
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    • 2022
  • In this study, we present a fully automated system that combines camera technology with liquid crystal technology to create a polarization camera capable of detecting the partial linear polarization of light reflected from an object. The use of twisted nematic (TN) liquid crystals that electro-optically modulate the polarization plane of light eliminates the need to mechanically rotate the polarizing filter in front of the camera lens. Images obtained using these techniques are imaged by computer software. In addition, liquid crystal panels have been produced in a square shape, but many camera lenses are usually round, and lighting or other driving units are installed around the lens, so space is optimized through the application of a circular liquid crystal display. Through the development of this technology, an electrically switchable and space-optimized liquid crystal polarizer is developed.

Multi-Level FeRAM Utilizing Stacked Ferroelectric Structure (강유전성 물질을 이용한 Multi-level FeRAM 구조 및 동작 분석)

  • Seok Heon Kong;June Hyeong Kim;Seul Ki Hong
    • Journal of the Microelectronics and Packaging Society
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    • v.30 no.3
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    • pp.73-77
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    • 2023
  • In this study, we developed a Multi-level FeRAM (Ferroelectrics random access memory) device utilizing different ferroelectric materials and analyzed its operation through C-V analysis using simulations. To achieve Multi-level operation, we proposed an MFM (Multi-Ferroelectric Material) structure by depositing two different ferroelectric materials with distinct properties horizontally on the same bottom electrode and subsequently adding a gate electrode on top. By analyzing C-V peaks based on the polarization phenomenon occurring under different voltage conditions for the two materials, we confirmed the feasibility of achieving Multi-level operation, where either one or both of the materials can be polarized. Furthermore, we validated the process for implementing the proposed structure using semiconductor fabrication through process simulations. These results signify the significance of the new structure as it allows storing multiple states in a single memory cell, thereby greatly enhancing memory integration.

Design of Neodymium Permanent Magnetic Core using FEM (유한요소법을 이용한 네오디움 영구자석의 코어 설계)

  • Hur, Kwan-Do;Ye, Sang-Don
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.13 no.5
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    • pp.70-75
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    • 2014
  • Permanent magnets have recently been considered as device that can be used to control the behavior of mechanical systems. Neodymium magnets, a type of permanent magnet, have been used in numerous mechanical devices. These are permanent magnets made from an alloy of neodymium, iron, and boron to form the Nd2Fe14B tetragonal crystalline structure. The magnetic selection, magnet core design and mechanical errors of the magnetic component can affect the performance of the magnetic force. In this study, the coercive force, residual induction, and the dimensions of the design parameters of the magnet core are optimized. The design parameters of magnet core are defined as the gap between the magnet and the core, the upper contact radius, and the lower thickness of the core. The force exercised on a permanent magnet in a non-uniform field is dependent on the magnetization orientation of the magnet. Non-uniformity of the polarization direction of the magnetic has been assumed to be caused by the angular error in the polarization direction. The variation in the magnetic performance is considered according to the center distance, the tilt of the magnetic components, and the polarization direction. The finite element method is used to analyze the magnetic force of an optimized cylindrical magnet.

Recent Progress of Nonpolar and Semipolar GaN on Sapphire Substrates for the Next Generation High Power Light Emitting Diodes

  • Lee, Seong-Nam
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2011.05a
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    • pp.20.2-20.2
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    • 2011
  • III-nitrides have attracted much attention for optoelectronic device applications whose emission wavelengths ranging from green to ultraviolet due to their wide band gap. However, due to the strong polarization properties of conventional c-plane III-nitrides, the built-in polarization-induced electric field limits the performance of optical devices. Therefore, there has been a renewed interest in the growth of nonpolar III-nitride semiconductors for polarization free heterostructure optoelectronic and electronic devices. However, the crystal and the optical quality of nonpolar/semipolar GaN have been poorer than those of conventional c-plane GaN, resulting in the relative poor optical and electrical properties of light emitting diodes (LEDs). In this presentation, I will discuss the growth and characterization of high quality nonpolar a-plane and semipolar (11-22) GaN and InGaN multiple quantum wells (MQWs) grown on r- and m-plane sapphire substrates, respectively, by using metalorganic chemical vapor deposition (MOCVD) without a low temperature GaN buffer layer. Especially, the epitaxial lateral overgrowth (ELO) technique will be also discussed to reduce the dislocation density and enhance the performance of nonpolar and semipolar GaN-based LEDs.

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Bending and Pressing Tolerance of Flexible Polyoxetane based Liquid Crystalline Polymer/Low Molecular Weight Liquid Crystal Device

  • Jang, Chi-Woong;Lim, Tong-Kun;Kim, Moo-Jong;Kim, Ku-Nam;Kwon, Young-Wan;Jin, Jung-Il;Bae, Jung-Hun;Kim, Han-Sik
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07a
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    • pp.433-435
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    • 2005
  • We have studied the realigning behavior of liquid crystal molecules in liquid crystalline polymer/liquid crystal(LCP/LC) system when they are exposed to external stimulation such as bending and pressing. The birefringence of the LCP/LC in a flexible display device was measured as a function of bending or pressing deformation. The microscopic dynamic behavior of main chain, side chain, and the LC were characterized by FTIR and polarization optical microscopy. When the device is deformed in scattering memory state, liquid crystal(LC) director is found to align from randomly oriented domain state(scattering state) to homeotropic state.

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Principle, current status and developing trend of FRAM

  • Chung, Il-Sub;Yi, In-Sook;Lee, Jung-Ho
    • Proceedings of the Korean Vacuum Society Conference
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    • 1999.07a
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    • pp.82-82
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    • 1999
  • Ferroelectric materials are characterized by the existence of a spontaneous remnant polarization that can be switched between two stable states by an applied field. This phenomenon is known as ferroelectricity. The ferroelectricity can be utilized for nonvolatile memory application. Up to now 256K FRAM was successfully fabricated and sold in the memory market. This paper will briefly review the current statue of ferroelectric random access memory (FRAM) focusing on recent developments. In addition, the future prospects of FRAM will be addressed.

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Electric & Dielectric Properties of MIM Device Using Copolymer LB Films (공중합체 LB막 MIM소자의 전기 및 유전 특성)

  • Yoo, Seung-Yeop;Jung, Sang-Bum;Park, Jae-Chul;Kwon, Young-Soo
    • Proceedings of the KIEE Conference
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    • 1996.11a
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    • pp.258-260
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    • 1996
  • We fabricated MIM device using copolymer LB films of $C_{18}MA-VE_2$. Electric and dielectric properties of MIM device were investigated. In our experimental results, the thickness of maleate copolymer LB film by elipsometry measurements was about $27{\sim}30[\AA]$. Conductivity was found to be $10^{+15}{\sim}10^{-14}[S/cm]$. The maleate copolymer LB film have the property of insulator like organic ultra-thin film. Frequency-dependent dielectric properties was orientational polarization by the dipole.

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Design of the Adaptive Learning Circuit by Enploying the MFSFET (MFSFET 소자를 이용한 Adaptive Learning Curcuit 의 설계)

  • Lee, Kook-Pyo;Kang, Seong-Jun;Chang, Dong-Hoon;Yoon, Yung-Sup
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.8
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    • pp.1-12
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    • 2001
  • The adaptive learning circuit is designed on the basis of modeling of MFSFET (Metal-Ferroelectric-Semiconductor FET) and the numerical results are analyzed. The output frequency of the adaptive learning circuit is inversely proportional to the source-drain resistance of MFSFET and the capacitance of the circuit. The saturated drain current with input pulse number is analogous to the ferroelectric polarization reversal. It indicates that the ferroelectric polarization plays an important role in the drain current control of MFSFET. The output frequency modulation of the adaptive learning circuit is investigated by analyzing the source-drain resistance of MFSFET as functions of input pulse numbers in the adaptive learning circuit and the dimensionality factor of the ferroelectric thin film. From the results, the frequency modulation characteristic of the adaptive learning circuit are confirmed. In other words, adaptive learning characteristics which means a gradual frequency change of output pulse with the progress of input pulse are confirmed. Consequently it is shown that our circuit can be used effectively in the neuron synapses of nueral networks.

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Characteristics of Ferroelectric-Gate MFISFET Device Behaving to NDRO Configuration (NDRD 방식의 강유전체-게이트 MFSFET소자의 특성)

  • 이국표;강성준;윤영섭
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.1
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    • pp.1-10
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    • 2003
  • Device characteristics of the Metal-Ferroclecric-Semiconductor FET(MFSFET) are simulated in this study. The field-dependent polarization model and the square-law FET model are employed in our simulation. C-V$_{G}$ curves generated from our MFSFET simulation exhibit the accumulation, the depletion and the inversion regions clearly. The capacitance, the subthreshold and the drain current characteristics as a function of gate bias exhibit the memory windows are 1 and 2 V, when the coercive voltages of ferroelectric are 0.5 and 1 V respectively. I$_{D}$-V$_{D}$ curves are composed of the triode and the saturation regions. The difference of saturation drain currents of the MFSFET device at the dual threshold voltages in I$_{D}$-V$_{D}$ curve is 1.5, 2.7, 4.0, and 5.7 ㎃, when the gate biases are 0, 0.1, 0.2 and 0.3V respectively. As the drain current is demonstrated after time delay, PLZT(10/30/70) thin film shows excellent reliability as well as the decrease of saturation current is about 18 % after 10 years. Our simulation model is expected to be very useful in the estimation of the behaviour of MFSFET devices.T devices.

Electrical and Retention Properties of MFSFET Device (MFSFET 소자의 전기적 및 리텐션 특성)

  • Chung, Yeun-Gun;Kang, Seong-Jun;Joung, Yang-Hee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.11 no.3
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    • pp.570-576
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    • 2007
  • In this study, the characteristics of metal-ferroelectric-semiconductor FET (MFSFET) device is investigated using field-dependent polarization and square-law FET models. From drain current with the gate voltage variation, when coercive voltages of ferroelectric thin film are 0.5 and 1V, the memory windows are 1 and 2V, respectively. When the gate voltages are 0, 0.1, 0.2 and 0.3V, the difference of saturation drain currents of the MFSFET device at two threshold voltages in ID-VD curve are 1.5, 2.7, 4.0, and 5.7mA, respectively. As a result of the analysis for drain currents after tine lapse, which is based on the simulation for hysteresis loop and the fitting of retention properties of ferroelectric thin films such as PLZT(10/30/70), PLT(10) and PZT(30/70) thin film shows excellent reliability that the decrease of saturation current is about 18% after 10 years.