• 한국세라믹학회지
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• 제36권9호
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• pp.923-929
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• 1999

The cause of optical nonlinearity induced in thermally poled silica glass is believed to be the space charge polarization. Since the second order optical nonlinearity (electro-optic effect) can be used in optical switches the optical nonlinearity in silica glass has drawn a large attention. Space charge polarization occurs when an ionic conducting material is subjected to dc electric field by the blocking electrode. Thermal poling performed to induce the optical nonlinearity in silica glass is basically identical to the process generating space charge polarization. As a first step to understand the mechanism of space charge polarization in silica glass hence the induced optical nonlinearity the absorption currents as functions of time were measured for various types of silica glasses and analyzed by the theory of space charge polarization. It was found that the electrical relaxation exhibited a step by the space charge polarization in the relatively long time range and dielectric loss peak showed a maximum at a specific temperature which is depending on type of silica glass. It was turned out that this relaxation might be a cause of nonlinearity in electrical conductivity of silica glass.

• 한국세라믹학회지
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• 제36권12호
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• pp.1374-1380
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• 1999

The cause of Scond Harmonic Generation (SHG) in thermally poled silica glass is suggested basedon the electrical and dielectric relaxation measurements. The absorption currents as functions of time were measured for various types of silica glasses and analyzed by the theory of Space Charge Polarization. Space charge polarization occurs when an ionic conducting material is subjected to dc electric field with blocking electrode. Thermal poling performed to induce SHG in silica glass is basically identical to the process generating space charge polarization. Hence it was found that gene-ration removal reproduction and temperature dependence of SHG in poled silica is directly related to those of space charge polarization. It turned out that the fundamental parameters governing the SHG in poled silica are charge carrier concentration and mobility. Based on the theory of space charge polarization and experimental results of electrical rela-xation the method to increase the intensity of SHG is proposed.

• 전기전자학회논문지
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• 제26권2호
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• pp.329-332
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• 2022

본 논문에서는 ferroelectric(HfO₂)구조가 적용된 3D NAND flash memory의 parameter에 따른 lateral charge migration의 retention과 V_th를 분석하였다. P_s가 클수록 Program 시 ferroelectric에서 가능한 최대 polarization이 크기 때문에 초기 V_th는 P_s 25µC/cm² 보다 P_s 70µC/cm²에서 약 1.04V차이로 커진다. 또한 Program 이후 trap된 전자는 시간이 지남에 따라서 lateral charge migration이 발생한다. Program 이후 gate에 전압을 가하지 않고 ferroelectric은 polarization을 유지하기 때문에 P_s와 크게 관계없이 P_r이 클수록 polarization이 커지고 lateral charge migration에 의한 ∆V_th는 P_r 5µC/cm² 보다 P_r 50µC/cm²에서 약 1.54V차이로 작아진다.

• 전기전자학회논문지
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• 제25권4호
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• pp.770-773
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• 2021

본 논문에서는 tapering과 ferroelectric(HfO₂)구조가 적용된 3D NAND flash memory의 프로그램 이후 시간경과에 따른 retention특징을 분석했다. Nitride에 trap된 전자는 시간이 지남에 따라 lateral charge migration이 발생한다. 프로그램 이후 시간이 지남에 따라 trap된 전자가 tapering에 의해 두꺼워진 채널 쪽으로 lateral charge migration이 더 많이 발생하는 것을 확인했다. 또한 Oxide-Nitride-Ferroelectric (ONF) 구조는 polarization에 의해 lateral charge migration이 완화되기 때문에 기존 Oxide-Nitride-Oxide (ONO) 구조 보다 문턱전압(V_th)의 변화량이 줄어든다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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• pp.99-99
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• 2013

In this talk, I will present two research works in progress, which are: i) mapping of piezoelectric polarization and associated charge density distribution in the heteroepitaxial InGaN/GaN multi-quantum well (MQW) structure of a light emitting diode (LED) by using inline electron holography and ii) in-situ observation of the polarization switching process of an ferroelectric Pb(Zr1-x,Tix)O3 (PZT) thin film capacitor under an applied electric field in transmission electron microscope (TEM). In the first part, I will show that strain as well as total charge density distributions can be mapped quantitatively across all the functional layers constituting a LED, including n-type GaN, InGaN/GaN MQWs, and p-type GaN with sub-nm spatial resolution (~0.8 nm) by using inline electron holography. The experimentally obtained strain maps were verified by comparison with finite element method simulations and confirmed that not only InGaN QWs (2.5 nm in thickness) but also GaN QBs (10 nm in thickness) in the MQW structure are strained complementary to accommodate the lattice misfit strain. Because of this complementary strain of GaN QBs, the strain gradient and also (piezoelectric) polarization gradient across the MQW changes more steeply than expected, resulting in more polarization charge density at the MQW interfaces than the typically expected value from the spontaneous polarization mismatch alone. By quantitative and comparative analysis of the total charge density map with the polarization charge map, we can clarify what extent of the polarization charges are compensated by the electrons supplied from the n-doped GaN QBs. Comparison with the simulated energy band diagrams with various screening parameters show that only 60% of the net polarization charges are compensated by the electrons from the GaN QBs, which results in the internal field of ~2.0 MV cm-1 across each pair of GaN/InGaN of the MQW structure. In the second part of my talk, I will present in-situ observations of the polarization switching process of a planar Ni/PZT/SrRuO3 capacitor using TEM. We observed the preferential, but asymmetric, nucleation and forward growth of switched c-domains at the PZT/electrode interfaces arising from the built-in electric field beneath each interface. The subsequent sideways growth was inhibited by the depolarization field due to the imperfect charge compensation at the counter electrode and preexisting a-domain walls, leading to asymmetric switching. It was found that the preexisting a-domains split into fine a- and c-domains constituting a $90^{\circ}$ stripe domain pattern during the $180^{\circ}$ polarization switching process, revealing that these domains also actively participated in the out-of-plane polarization switching. The real-time observations uncovered the origin of the switching asymmetry and further clarified the importance of charged domain walls and the interfaces with electrodes in the ferroelectric switching processes.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.86-89
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• 2000

The detection technique both the polarization and the mobile charge density at the same time in ferroelectric films on Si using TVS method have been proposed. This method yields a polarizable and an ionic displacement current peaks whose areas are proportional to the total polarization reversal charge and the total moble ionic space charge, respectively. The calculated polarization and the mobile charge density were 0.42 [$\mu$C/$\textrm{cm}^2$] and 5.5$\times$10$^{11}$ (ions/$\textrm{cm}^2$) in the SBT film of MFIS structure measured at 25$0^{\circ}C$, and 1.4 [$\mu$C/$\textrm{cm}^2$] in the LiNbO$_3$ film of MFS structure measured at 30$0^{\circ}C$, respectively.

• E2M - 전기 전자와 첨단 소재
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• 제10권3호
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• pp.239-246
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• 1997

The ZnO is stabilize dielectric constant over a broad temperature range because its addition makes the relaxation time short. In this study, the composite oxide material (B $a_{0.85}$ $Ca_{0.15}$)Ti $O_{3}$ was mixed by ZnO additive material and the dielectric polarization characteristics was studied. The relative density was over 90[%] at all specimen in the structural characteristics. Among of the specimen, the relative density of (B $a_{0.85}$ $Ca_{0.15}$)Ti $O_{3}$ with ZnO (0.4mol) has a 95[%]. The grain size of composite oxide material with an increasing ZnO increased and it was 1.0[.mu.m]-1.22[.mu.m]. In the electrical characteristics, the charge and discharge current was increased by ZnO addition. The dielectric relaxation time was increased by space charge polarization at above 110[.deg. C] and the dielectric relaxation time was fixed by space charge polarization of para-dielectric layer at below 110[.deg. C]. The dielectric relaxation time was maximum when the grain size was small. The dielectric relaxation time is decreased with an additive material ZnO and interface polarization, existing void at the grain and grain boundary. The remnant polarization is increased and the coercive electric field is decreased by ZnO.

• 한국세라믹학회지
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• 제37권1호
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• pp.6-11
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• 2000

Electron emission from the Pb(ZrxTi1-x)O3 ferroelectrics by pulsed electric field has been investigated as a function of Zr/Ti ratios such as 35/65, 50/50 and 65/35 below 250kV/cm. Electrons were emitted regardless of the applied field polarity to the rear electrode. When the negative field was applied to the rear electrode, the electron emission charge was more stable. It was proved that the electrons were emitted at the edge of the upper electrode. The emission charge increased in order of 65/35>50/50>35/65. The electron emission characteristics were dependent on the ferroelectric properties such as polarization and coercive field. The emission charge and emission threshold field were affected by the polarization change and the coercive field, respectively. This result explains that the electron emission is a field emission with polarization induced surface potential by a modified Fowler-Nordheim plot of emission charge.

• 대한기계학회논문집A
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• 제22권2호
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• pp.311-320
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• 1998

The cryogenic fracture behaviors of austenitic stainless steel HN2 developed for nuclear fusion reactor were evaluated quantitatively by using the small punch(SP) test. The electrochemical polarization test was applied to study thermal aging degradation of HN2 steel. The X-ray diffraction(XRD) analysis was conducted to detect carbides and nitrides precipitated on the grain boundary of the heat treated HN2 steel. The mechanical properties of the HN2 steel significantly decreased with increasing time and temperature of heat treatment or with decreasing testing temperature. The integrated charge(Q) obtained from electrochemical polarization test showed a good correlation with the SP energy(ESP) obtained by means of SP tests. From the results observed in the x-ray diffraction and anodic polarization curve, it was known that the material the grain boundary. Combining SP test and electrochemical polarization test, it could be useful tools to non-destructively evaluate the cryogenic fracture behaviors and the aging degradation for cryogenic structural material.

• 한국조명전기설비학회지:조명전기설비
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• 제6권6호
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• pp.23-31
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• 1992

Charged particle in the polymers is supposed to affect the electrical conduction and to lead them th dielectrical breakdown finally. So we measured the space charge distribution made by application of high electric field and evaluated the polarity of the charged particle affected on electrical conduction and space charge formed in the insulating materials by using temperature gradient thermally stimulated current measurement method(TG-TSC measurement). As a result, in the cross-linked polyethylene, A-peak was caused from dipole polarization, C-peak was caused from ionic space charge polarization and D-peak was injected trap hole. Also we found it crossible the evaluated the polarity of injected trap carrier and electron(or hole) of carrier trap in the cross-lined polyethylene. We found that ${\gamma}$-ray irradiated low density polyethylene had a relation to the electronic trap and we also could get the value of electric field distribution in the samples of which evaluation was available.