Dependence of Hot Electron Effects on Temperature in The Deep Submicron SOI n-Channel MOSFETs (Deep Submicron SOI n-채널 MOSFET에서 열전자 효과들의 온도 의존성)
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- The Journal of Korea Institute of Information, Electronics, and Communication Technology
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- v.11 no.2
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- pp.189-194
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- 2018