• Title/Summary/Keyword: Pattern inspection

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An Automatic Inspection System Using Computer Vision (자동검사 시스템을 위한 컴퓨터 비젼의 연구)

  • Jang, Dong-Sik
    • IE interfaces
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    • v.4 no.2
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    • pp.43-51
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    • 1991
  • A line search method is developed to locate all the conerpoints of 2-dimensional polygon images for inspection purposes. This optimization-based method is used to approximate a 2-D curved object by a polygon. This scheme is also developed for inspection of objects in industrial environment. The inspection includes dimensional verification and pattern matching which compares a 2-D image of an object to a pattern image. The method proves to be computationally efficient and accurate for real time application.

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A New Inspection Method of PDP Electrode Pattern Defects

  • Kim, Taehong;Sunkyu Yang;Tak Eun;Park, Sehwa;Ilhong Suh
    • 제어로봇시스템학회:학술대회논문집
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    • 2000.10a
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    • pp.457-457
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    • 2000
  • The display module of PDP consists of a pair of fine electrode patterned panels. For example, in case of 42" PDP, thousands of electrode patterns should be placed on panel, where length, width, and height of each pattern m one meter, 50${\mu}{\textrm}{m}$, and 30${\mu}{\textrm}{m}$ respectively. And pitch between patterns is around 200${\mu}{\textrm}{m}$. Electrode patterns are frequently damaged during the production process, and thus might be broken. These breakage will result in open-circuited electrical characteristic of a pattern and/or open-circuited electrical characteristic between patterns. Therefore, inspection of pattern defects is the inevitable process to improve production yield rate of the panel. In this paper, we first review several types of PDP pattern defects which affects yield-rate of PDP. And, problems of inspecting such pattern defects by a typical inspection method is addressed. Then, a novel inspection method is proposed to overcome the difficulties, where some new components and the algorithm to detect the electrode defects are explored.ored.

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Intelligent Pattern Matching Based on Geometric Features for Machine Vision Inspection (머신비전검사를 위한 기하학적 특징 기반 지능 패턴 정합)

  • Moon Soon-Hwan;Kim Gyung-Bum;Kim Tae-Hoon
    • The Journal of the Korea Contents Association
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    • v.6 no.6
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    • pp.1-8
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    • 2006
  • This paper presents an intelligent pattern matching method that can be used to acquire the reliable calibration data for automatic PCB pattern inspection. The inaccurate calibration data is often acquired by geometric pattern variations and selecting an inappropriate model manual. It makes low the confidence of inspection and also the inspection processing time has been delayed. In this paper, the geometric features of PCB patterns are utilized to calculate the accurate calibration data. An appropriate model is selected automatically based on the geometric features, and then the calibration data to be invariant to the geometric variations(translation, rotation, scaling) is calculated. The method can save the inspection time unnecessary by eliminating the need for manual model selection. As the result, it makes a fast, accurate and reliable inspection of PCB patterns.

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Development of Real-Time COF Film Complex Inspection System using Color Image (컬러영상을 이용한 실시간 COF 필름 복합 검사시스템 개발)

  • Kim, Yong-Kwan;Lee, In Hwan
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.20 no.10
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    • pp.112-118
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    • 2021
  • In this study, an inspection method using a color image is proposed to conduct a real-time inspection of covalent organic framework (COF) films to detect defects, if any. The COF film consists of an upper pattern SR and a lower PI. The proposed system detects the defects of more than 20 ㎛ on the SR surface owing to the characteristics of the pattern, whereas on the PI surface, it detects defects of more than 4 ㎛ by utilizing a micro-optical system. In the existing system, it is difficult for the operator to conduct a full inspection through a high-performance microscope. The proposed inspection algorithm performs the inspection by separating each color component using the color contrast of the pattern on the SR side, and on the PI surface it inspects the bonding state of the mounted chip. As a result, it is possible to confirm the exact location of the defects through the SR and PI surface inspections in the implemented inspection.

Development of the Sorting Inspection System for Screw/Bolt Using a Slant Method (슬랜트방식을 이용한 스크류/볼트 선별검사시스템 개발)

  • Kim, Yong-Seok;Yang, Soon-Yong
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.19 no.5
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    • pp.698-704
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    • 2010
  • The machine vision system has been widely applied at automatic inspection field of the industries. Especially, the machine vision system shows good performance at difficult inspection field by contact method. In this paper, the automatic system of a slant method to inspect screw/bolt shape using machine vision is developed. The inspection system uses pattern matching method that search similar degree of the lucidity, the average lucidity, length and angle of inspection set up area using a circular scan and a line scan method. Also the feeding method for inspection product is the slant method, and feed rate is controlled by the ramp angle adjustment. This inspection system is composed of a feeding device, a transfer device, vision systems, a lighting device and computer, and is composed the sorting discharge system of the inferior product. The performance test carried out the feeding speed, the shape correct degree and the sorting discharge speed according to the type of screw/bolt. This sorting inspection system showed a satisfied test results in whole inspection items. Presently, this sorting inspection system is being used in the manufacturing process of screw/bolt usefully.

A Study on the Spot Inspection for LCD Modules (LCD모듈의 얼룩검사에 관한 연구)

  • Lee, Jae-Hyeok
    • Proceedings of the KIEE Conference
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    • 2006.10c
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    • pp.422-424
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    • 2006
  • This paper suggests an automatic spot-inspection algorithm for LCD modules. Usually, LCD module testing is classified by two categories. One is for uniform pattern testing and the other is Non-uniform testing. The uniform pattern testing is well defined and also fully automated in the factory. However non-uniform pattern testing is not defined well yet, so non-uniform testing is conducted by human operators. In this paper a spot-pattern, which is one of non-uniform pattern, inspection algorithms are proposed. The performance of the proposed algorithm is tested by extensive simulations using artificial slot-patterns and real ones in the LCD modules.

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A 3D Vision Inspection Method using One Camera (1대의 카메라를 이용한 3차원 비전 검사 방법)

  • Jung Cheol-Jin;Huh Kyung Moo
    • Journal of the Institute of Electronics Engineers of Korea CI
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    • v.41 no.1
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    • pp.19-26
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    • 2004
  • In this paper, we suggest a 3D vision inspection method which use only one camera. If we have the database of pattern and can recognize the object, and also estimate the rotated shape of the parts, we can inspect the parts using only one image. We used the 3D database and the 2D geometrical pattern matching, and the rotation transition theory about the algorithm. As the results, we could have the capability of the recognition and inspection of the rotated object through the estimation of rotation an81e. We applied our suggested algorithm to the inspection of typical IC and capacitor, and compared our suggested algorithm with the conventional 2D inspection method and the feature space trajectory method.

A Study on Pattern Inspection of LCD Using Color Compensation and Pattern Matching (색상보정 및 패턴 정합기법을 이용한 LCD 패턴검사에 관한 연구)

  • Ye, Soo-Young;Yoo, Choong-Woong;Nam, Ki-Gon
    • Journal of the Institute of Convergence Signal Processing
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    • v.7 no.4
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    • pp.161-168
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    • 2006
  • In this paper, we propose a method for the pattern inspection of LCD module using the color compensation and pattern matching. The pattern matching is generally used for the inspection method of LCD module at the industry. LCD module has many defections such as the brightness difference of the back light, the optic feature of liquid crystal, the difference of the light penetrated by driving LCD and the color difference by the lighting. The conventional method without the color compensation can not solve these defections and decreases the efficiency of inspecting LCD module. The method proposed to inspect defective badness through the pattern matching after it compensated color difference of the LCD occurred by the various causes. At first, it revises with setting by standard tone of color with the LCD pattern of the reference image. And It perform the preprocessing and pattern matching algorithm on the compensated image. In experiment, we confirmed that this algorithm is useful to detect some defections of LCD module. The proposed methods was easy to detect the faulty product.

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Emulated Vision Tester for Automatic Functional Inspection of LCD Drive Module PCB (LCD 구동 모듈 PCB의 자동 기능 검사를 위한 Emulated Vision Tester)

  • Joo, Young-Bok;Han, Chan-Ho;Park, Kil-Houm;Huh, Kyung-Moo
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.46 no.2
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    • pp.22-27
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    • 2009
  • In this paper, an automatic functional inspection system EVT (Emulated Vision Tester) for LCD drive module PCB has been proposed and implemented. Typical automatic inspection system such as probing methods and vision-based systems are widely known and used, however, there exist undetectable defects due to critical timing factors which they may miss to catch from LCD equipments. Especially typical vision-based systems have inconsistency on acquisition of images so that distinction between gray scales can be difficult which results in low level of performance and reliability on the inspection results. The proposed EVT system is pure hardware solution. It directly compares pattern signals from a pattern generator to output signals from LCD drive module. It also inspects variety of analog signals such as voltage, resistance, wave forms and so forth. The EVT system not only shows high performance in terms of reliability and processing speed but reduces costs on inspection and maintenance. Also, full automation of entire production line can be realized when EVT is applied in in-line inspection processes.

Automatic Optical Inspection System for Holograms with Multiple Patterns (다중패턴 홀로그램을 위한 자동광학검사 시스템)

  • Kwon, Hyuk-Joong;Park, Tae-Hyoung
    • Journal of Institute of Control, Robotics and Systems
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    • v.15 no.5
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    • pp.548-554
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    • 2009
  • We propose an automatic inspection system for hologram with multiple patterns. The system hardware consists of illuminations, camera, and vision processor. Multiple illuminations using LEDs are arranged in different directions to acquire each image of patterns. The system software consists of pre-processing, pattern generation, and pattern matching. The acquired images of input hologram are compared with their reference patterns by developed matching algorithm. To compensate for the positioning error of input hologram, reference patterns of hologram for different position should be generated in on-line. We apply a frequency transformation based CGH(computer-generated hologram) method to generate reference images. For the fast pattern matching, we also apply the matching method in the frequency domain. Experimental results for hologram of Korean currency are then presented to verify the usefulness of proposed system.