Browse > Article
http://dx.doi.org/10.14775/ksmpe.2021.20.10.112

Development of Real-Time COF Film Complex Inspection System using Color Image  

Kim, Yong-Kwan (GanghanInnosys)
Lee, In Hwan (School of Mechanical Engineering, Chungbuk Nat'l UNIV.)
Publication Information
Journal of the Korean Society of Manufacturing Process Engineers / v.20, no.10, 2021 , pp. 112-118 More about this Journal
Abstract
In this study, an inspection method using a color image is proposed to conduct a real-time inspection of covalent organic framework (COF) films to detect defects, if any. The COF film consists of an upper pattern SR and a lower PI. The proposed system detects the defects of more than 20 ㎛ on the SR surface owing to the characteristics of the pattern, whereas on the PI surface, it detects defects of more than 4 ㎛ by utilizing a micro-optical system. In the existing system, it is difficult for the operator to conduct a full inspection through a high-performance microscope. The proposed inspection algorithm performs the inspection by separating each color component using the color contrast of the pattern on the SR side, and on the PI surface it inspects the bonding state of the mounted chip. As a result, it is possible to confirm the exact location of the defects through the SR and PI surface inspections in the implemented inspection.
Keywords
COF; Flatness; Field of View; PI; SR;
Citations & Related Records
연도 인용수 순위
  • Reference
1 Lee, S. W., Choi, H. Y., Lee, D. J., Chun, M. G., "Development of Real-Time TCP/COF Inspection System using Differential Image," Journal of The Korean Institute of Intelligent Systems. Vol. 22, No. 1, pp. 87-93, 2012.   DOI
2 Kim, Y. S., Moon H. J., Song C. K., Chun M. K., "Defects detection of TCP/COF using real-time line-scanner," CICS 2007 Oct 26, pp. 153-154, 2007.
3 Kim, H. J., Park, Y. B., "RGB Channel Selection Technique for Efficient Image Segmentation," Journal of Korean Institute of Information Scientists and Engineers, Vol. 31, No.1, pp. 1332-1336, 2004.
4 Yang, S. C., Won J. H., "Development of the Ultra Precision Thermal Image Optical System," Journal of the Korean Society for Precision Engineering Vol. 27, No. 12, pp. 15-21, 2010.
5 Lee, J. H., Rhim, S. H., "Study of optical vision measurement algorithm for micro hole array," Proceeding of the KSMPE Autumn Conference, p. 155, 2013.