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http://dx.doi.org/10.5302/J.ICROS.2009.15.5.548

Automatic Optical Inspection System for Holograms with Multiple Patterns  

Kwon, Hyuk-Joong (삼성전자(주))
Park, Tae-Hyoung (충북대학교)
Publication Information
Journal of Institute of Control, Robotics and Systems / v.15, no.5, 2009 , pp. 548-554 More about this Journal
Abstract
We propose an automatic inspection system for hologram with multiple patterns. The system hardware consists of illuminations, camera, and vision processor. Multiple illuminations using LEDs are arranged in different directions to acquire each image of patterns. The system software consists of pre-processing, pattern generation, and pattern matching. The acquired images of input hologram are compared with their reference patterns by developed matching algorithm. To compensate for the positioning error of input hologram, reference patterns of hologram for different position should be generated in on-line. We apply a frequency transformation based CGH(computer-generated hologram) method to generate reference images. For the fast pattern matching, we also apply the matching method in the frequency domain. Experimental results for hologram of Korean currency are then presented to verify the usefulness of proposed system.
Keywords
automatic optical inspection; hologram; pattern matching; CGH (computer generated hologram); fourier transform;
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Times Cited By KSCI : 1  (Citation Analysis)
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