• Proceedings of the KIEE Conference
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• 2002.04a
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• pp.183-185
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• 2002

This paper proposes the test method for the testing of a RLC parallel circuit on the electronic circuit board. This method utilizes a guarding circuit and a phase detection circuit. The guarding circuit separates electrically the tested device or circuit from printed circuit board. Phase detector estimates the phase difference from two signals, voltage and current. This method computes R. L and C value from phase difference($\theta$) and impedance value(Z) obtained by enforcing two other frequence stimulus under the guarding state.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.19 no.6
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• pp.1038-1045
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• 1994

In this paper, algorithm and built-in test circuit for testing all PSF(Pattern Sensitive Fault) occuring in CAM(Content Addressable Memory) are proposed. That is, built-in test circuit that uses minimum additional circuit without external equipment is designed. Additional circuit consist`s of parallel comparator, error detector, and modified decoder for parallel testing. Besides, the study on eulerian path for effectiv test pattern is carried out simultaneously. Consequently, using proposed algorithm, we can test all contents of CAM with 325+2b(b:number of bits) operations regardless of number of words. The area occupied by test circuit is about 7.5% of total circuit area.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.53 no.11
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• pp.577-582
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• 2004

In this paper, lumped equivalent circuits for a conventional parallel directional coupler are proposed. This equivalent circuits only have self inductance and self capacitance, so we can design exact lumped equivalent circuit. The equivalent circuit and design formula for the presented lumped element coupler is derived based on the even- and odd-mode properties of parallel-coupled line. By using the derived design formula, we have designed the 3dB and 4.7dB MMIC couplers at the center frequency of 3.4GHz and 5.6GHz respectively. Measurements for the designed MMIC directional couplers show at 4dB and 5.2dB-coupling value at the center frequency of 3.4GHz and 5.6GHz. Excellent agreements between simulation results and measurement results on the designed directional couplers show the validity of this paper

• The Transactions of the Korean Institute of Power Electronics
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• v.4 no.2
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• pp.122-127
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• 1999

In this paper, the power factor correction circuit using a parallel drive method is proposed so that the high power inverter air-conditioner with 3[hp] compressor motor may obtain the cost down and the improved performance. The adequate design porcedures are presented to reduce the material costs by eliminating the power factor imprving LC filter and derating output capacitor and inverter switches. Using the determined components. the proto-type circuit with 6[kW] power consumption is built and tested to verify the operation of the proposed circuit.

• Proceedings of the KIEE Conference
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• 2005.11b
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• pp.277-279
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• 2005

Generally, It was used to use a unit of a Large regularity in developing Large Capacity Converter System of the electric power. Lager a capacity of a unit of regularity, more expensive cost of it. So, normally, We overcome the limit of a proper form of an electricity semiconductor which be used in application field of Large capacity electricity conversion system through the Composition of Multi-level Circuit or Dual-Mode or parallel switch. but some problem is discussed. Using parallel RC-diode circuit instead of Large Capacity diode, We implemented a circuit that it overcome the limit of a regularity with dealing current distributed by parallel RC-diode circuit.

• Journal of Electrical Engineering and Technology
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• v.9 no.2
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• pp.726-732
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• 2014

A current flowing through a distribution conductor produces induced voltage, which is harmful to a telecommunication line. Previous research on induced voltage has been focused on single-circuit lines in the distribution system. However, the double-circuit lines, referred to as parallel distribution lines, are widely used in distribution systems because they have significant economic and environmental advantages over single-circuit lines. Therefore, a study on the induced voltage in double-circuit lines is needed. This paper presents a method of calculating the induced voltage in a parallel distribution system using four-terminal parameters and vector analysis. The calculation method is verified by the Electromagnetic Transient Program (EMTP) simulation.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.54 no.9
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• pp.531-538
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• 2005

This paper proposes an expert system which is able to enhance the accuracy and productivity by determining the test strategy based on heuristic rules for test of the hybrid electronic circuit board producted massively in production line. The test heuristic rules are obtained from test system designer, test experts and experimental results. The guarding method separating the tested device with circumference circuit of the device is adopted to enhance the accuracy of measurements in the test of analog devices. This guarding method can reduce the error occurring due to the voltage drop in both the signal input line and the measuring line by utilizing heuristic rules considering the device impedance and the parallel impedance. Also, PSA(Parallel Signature Analysis) technique Is applied for test of the digital devices and circuits. In the PSA technique, the real-time test of the high integrated device is possible by minimizing the test time forcing n bit output stream from the tested device to LFSR continuously. It is implemented in Visual C++ computer language for the purpose of the implementation of the inference engine using the dynamic memory allocation technique, the interface with the electronic circuit database and the hardware direct control. Finally, the effectiveness of the builded expert system is proved by simulating the several faults occurring in the mounting process the electronic devices to the surface of PCB for a typical hybrid electronic board and by identifying the results.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.17 no.7
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• pp.666-676
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• 1992

In this paper, algorithm and testable circuit to find all PSF(Pattern Sensitive Fault ) occured in RAM were proposed. Conventional test circuit and algorithm took much time in testing because consecutive test for RAM cells or f-dimensional memory struciure was not employed. In this paper, methodology for parallel RAM-testing was proposed by compensating additional circuit for test to conventional RAM circuit. Additional circuits are parallel comparator, error detector, group selector circuit and a modified decoder used for parallel testing. And also, the constructive method of Eulerian path to obtain efficient test pattern was performed. Consequently, If algorithm proposed in this paper Is used, the same operations as 32sxwor4 lines will be needed to test b x w=n matrix RAM. Circuit simulation was performerd, and 10 bits x :If words testable RAM was designed.

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.4
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• pp.477-483
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• 2015

The k-Winners-Take-All (kWTA) is an operation to find the largest k (>1) inputs among N inputs. Parallel search algorithm of kWTA for digital inputs is not invented yet, so most of digital kWTA architectures have O(N) time complexity. A parallel search algorithm for digital kWTA operation and the circuits for its VLSI implementation are presented in this paper. The proposed kWTA architecture can compare all inputs simultaneously in parallel. The time complexity of the new architecture is O(logN), so that it is scalable to a large number of digital data. The high-speed kWTA operation and its O(logN) dependency of the new architecture are verified by simulations. It takes 290 ns in searching for 5 winners among 1024 of 32 bit data, which is more than thousands of times faster than existing digital kWTA circuits, as well as existing analog kWTA circuits.

• Journal of the Institute of Electronics and Information Engineers
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• v.54 no.6
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• pp.55-64
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• 2017

High-capacity, high-definition image applications need to process considerable amounts of data at high speed. Accordingly, users of these applications demand a high-speed parallel execution system. To increase the speed of a parallel execution system, Park (2004) proposed a technique, called MAMS (Multi-Access Memory System), to access data in several execution units without the conflict of parallel processing memories. Since then, many studies on MAMS have been conducted, furthering the technique to MAMS-PP16 and MAMS-PP64, among others. As a memory architecture for parallel processing, MAMS must be constructed in one chip; therefore, a method to achieve the identical functionality as the existing MAMS while minimizing the architecture needs to be studied. This study proposes a method of miniaturizing the MAMS architecture in which the architectures of the ACR (Address Calculation and Routing) circuit and MMS (Memory Module Selection) circuit, which deliver data in memories to parallel execution units (PEs), do not use the MMS circuit, but are constructed as one shift and conditional statements whose number is the same as that of memory modules inside the ACR circuit. To verify the performance of the realized architecture, the study conducted the processing time of the proposed MAMS-PP64 through an image correlation test, the results of which demonstrated that the ratio of the image correlation from the proposed architecture was improved by 1.05 on average.