1 |
Jon Turino, 'Functional Testing's Place In Electronics Manufacturing', Evaluation Engineering, pp 58-61, September 1984
|
2 |
B. W. Johnson, Design and Analysis of Fault-Tolerant Digital Systems, Addison-Wesley Publishing Company, 1989
|
3 |
John J. Shedletsky, 'Random Testing: Practicality vs. Verified Effectiveness', IBM T. J. Watson Research Center
|
4 |
James E. Smith,'Measures of Effectiveness of Fault Signature Analysis', pp. 510-514, IEEE Trans. On Computer, Vol. C-29, No.6, June 1980
DOI
|
5 |
Bernd Konemann, Joachim Mucha and Gunther Zwiehoff, 'Built- In Logic Block Observation Techniques.pp, 37-41, IEEE Test Conference, 1979
|
6 |
윤덕용, 어셈블리와 C언어로 익히는 8051 마스터, 오음사, 2001
|
7 |
R. A. Frohwerk, 'Signature Analysis:A New Digital Field Service Method', Hewlett-Packard J., pp. 2-8, May 1977
|
8 |
Ed O. Schiotzhauer, 'User-Oriented Software for an Automatic Circuit-Board Tester', Hewlett-Packard Journal, pp 22-27, March 1979
|
9 |
N. Benowitz, D. F. Calhoun and et. al.,'Fault Detection/Isolation Results From AAFIS Hardware Built-In Test', NAECON' 76 RECORD, pp. 215-222, 1976
|
10 |
John J. Arena, 'Calculating the Effective Pattern Rate for High-Speed Board Test Applications', IEEE Trans. Industrial Electronics, Vol. 36, No.2, pp 164-174, May 1989
DOI
ScienceOn
|
11 |
Edward S. Hirgelt, 'Knowledge Representation In an In-Circuit Test Program Generator', International Test Conference, pp 773-777, 1984
|
12 |
Kenneth Jessen and Mike Bullock, 'Safeguarding Devices under Test', Electronics Manufacture & Test, pp 35-38, July/August 1985
|
13 |
Peter Hansen, 'Ensuring ASIC Testability at the Board Level Tools and Strategies', ATE & Instrumentation Conference, pp 33-43 1987
|
14 |
Reynold, 'In-Circuit McTesters? or the Future of In-Circuit Test', Evaluation Engineering, pp 8-15, February 1987
|
15 |
David T. Crook, 'Analog In-Circuit Component Measurements: Problems and Solutions', Hewlett-Packard Journal, pp 34-42 march 1979
|
16 |
Steve J Baker, 'Analog-Component Faults Yield to In-Circuit Testing', GenRad journal pp 15-20, 1984
|