• Title/Summary/Keyword: PDP reliability

Search Result 24, Processing Time 0.027 seconds

The Reliability Test of Sealing Glass Frit in AC PDP

  • Jeon, Young-Hwan;Hwang, Jong-Hee;Lim, Tae-Young;Kim, Hyung-Sun
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2005.07b
    • /
    • pp.1538-1541
    • /
    • 2005
  • For reliability evaluation of AC-PDP, one of the most important factor is sealing property. In this paper, the reliability evaluation test method of the commercialized sealing glass frit in AC-PDP was studied. 6 inch AC-PDP panels were tested for evaluation of sealing glass frit by vibration shock test, thermal shock test, non -destructive X-ray inspection, residual stress inspection and residual gas detection. These test methods are proposed as a standard for testing the reliability of sealing glass frit. The main failure mode of sealing glass frit in AC-PDP seems to be the crack propagation from thermal cycling rather than mechanical factor.

  • PDF

Failure-Time Estimation from Nonlinear Random-Coefficients Model: PDP Degradation Analysis (PDP 열화분석 예제를 통한 랜덤계수모델에서의 고장시간분포 추정)

  • Bae, Suk-Joo;Kim, Seong-Joon
    • Proceedings of the Korean Reliability Society Conference
    • /
    • 2006.05a
    • /
    • pp.181-191
    • /
    • 2006
  • As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article proposes a new model to describe the nonlinear degradation paths caused by nano-contamination for plasma display panels (PDPs) : a bi-exponential model with random coefficients. A sequential likelihood ratio test was executed to select random effects in the nonlinear model. Analysis results indicate that the reliability estimation can be improved substantially by using the nonlinear random-coefficients model to incorporate both inherent degradation characteristics and contamination effects of impurities for PDP degradation paths.

  • PDF

Implementation of Policy Based MANET Management System based on Active PDP Discovery (Active PDP Discovery에 기반한 정책 기반 MANET 관리 시스템 구현)

  • Huh, Jee-Wan;Song, Wang-Cheol
    • Journal of the Korea Academia-Industrial cooperation Society
    • /
    • v.10 no.11
    • /
    • pp.3176-3182
    • /
    • 2009
  • The PBNM on MANET is being researched to ensure the reliability and efficiency between mobile nodes. Therefore, it is essential to determine the cluster effectively which will perceive the movements of nodes and distribute the policies. In PBNM mechanism, to determine the node cluster for PDP and manage PEP nodes, Active PDP Discovery Protocol is proposed as a mechanism which is more efficient than preexistent techniques. While k-hop cluster selects the PEP nodes which PDP node manages, Active PDP Discovery actively selects the PDP node among the moving PEP node. This method prevents orphan nodes that are not connected to PDP and reduces continual broadcasting messages. This paper implements Active PDP Discovery which determines cluster in the real networks and analyzes its capability, expanding COPS-PR to detect the movement of nodes and adding MNL to PDP node.

Dual Path Magnetic-Coupled AC-PDP Sustain Driver with Low Switching Loss

  • Lee Jun-Young
    • Journal of Power Electronics
    • /
    • v.6 no.3
    • /
    • pp.205-213
    • /
    • 2006
  • A cost-effective magnetic-coupled AC-PDP sustain driver with low switching loss is proposed. The transformer reduces current stress in the energy recovery switches which affects circuit cost and reliability. The turns-ratio can be used to adjust the sustain pulse slopes which affect gas discharge uniformity. Dividing the recovery paths prevents abrupt changes in the output capacitance and thereby switching losses of the recovery switches is reduced. In addition, the proposed circuit has a more simple structure because it does not use the recovery path diodes which also afford a large recovery current. By reducing the current stress and device count in the energy recovery circuit, the proposed driver may have decreased circuit cost and improved circuit reliability.

The TROPHY (Talented Role-playing Technology with a Dual Polarity Sustainer in Hybrid Mono Board) Driving Method

  • Park, Chang-Joon;Kwak, Jong-Woon;Kim, Tae-Hyung;Park, Hyun-Il;Moon, Seong-Hak
    • Journal of Information Display
    • /
    • v.7 no.4
    • /
    • pp.24-26
    • /
    • 2006
  • We have developed a new driving method named TROPHY(Talented Role-playing Technology with Dual Polarity sustainer in Hybrid Mono board). In this method, the sustain voltage is partially compared to the conventional method and the number of power sources is reduced by voltage level unification during the reset, address and sustain period. The hybrid mono board was especially developed to implement those technologies. Through this, we can lower the cost with the TROPHY compared to the conventional one. It is a suitable technology to improve the reliability of circuit and image sticking problem. We can also reduce the number of driving boards and the EMI problem compared with those of the conventional method.

The TROPHY (Talented Role-playing Technology with a Dual Polarity Sustainer in Hybrid Mono Board) Driving Method

  • Park, Chang-Joon;Kwak, Jong-Woon;Kim, Tae-Hyung;Park, Hyun-Il;Moon, Seong-Hak
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2006.08a
    • /
    • pp.246-249
    • /
    • 2006
  • We have developed a new driving method named TROPHY(Talented Role-playing Technology with Dual Polarity sustainer in Hybrid Mono board). In this method, the sustain voltage is halved compared to the conventional method and the number of power sources is reduced by voltage level unification during the reset, address and sustain period. The hybrid mono board was especially developed to implement those technologies. Therefore, we can lower the cost with the TROPHY compared to the conventional one. It is suitable technology to improve the reliability of circuit and image sticking problem. We can also reduce the number of driving boards and the EMI problem comparing to those of the conventional method.

  • PDF

A Study on The Development of IPM for PDP Drive (PDP 구동용 IPM 개발에 관한 연구)

  • Kim, Jin-Il;Jeong, Jin-Beom;Kim, Hee-Jun;Kim, Sun-Hwan;Oh, Pil-Kyoung
    • Proceedings of the KIEE Conference
    • /
    • 2002.11d
    • /
    • pp.187-190
    • /
    • 2002
  • Plasma Display Panel(PDP) has been recognized as one of the most competitive display panel. Hence, the importance of PDP driving circuit is getting higher and higher. At the same time, it is strongly required for the driving circuit to be high efficiency, high stability, and cost effective one. In this work, a stable PDP driving circuit is developed by improving the circuit configuration. And the reliability and the productivity of the driving circuit are improved by using the Intelligent Power Module(IPM) technology. Finally operating characteristics of the developed IPM driving circuit are verified by using signal source board developed.

  • PDF

Development of Defect Inspection System for PDP ITO Patterned Glass (PDP ITO 패턴유리의 결함 검사시스템 개발)

  • Song Jun Yeob;Park Hwa Young;Kim Hyun Jong;Jung Yeon Wook
    • Journal of the Korean Society for Precision Engineering
    • /
    • v.21 no.12
    • /
    • pp.92-99
    • /
    • 2004
  • The formation degree of sustain (ITO pattern) decides quality of PDP (Plasma Display Panel). For this reason, it makes efforts in searching defects more than 30 un as 100%. Now, the existing inspection is dependent upon naked eye or microscope in off-line PDP manufacturing process. In this study developed prototype inspection system of PDP 170 glass is based on line-scan mechanism. Developed system creates information that detects and sorts kinds of defect automatically. Designed inspection technology adopts multi-vision method by slip-beam formation for the minimum of inspection time and detection algorithm is embodied in detection ability of developed system. Designed algorithm had to make good use of kernel matrix that draws up an approach to geometry. A characteristic of defects, as pin hole, substance, protrusion, are extracted from blob analysis method. Defects, as open, short, spots and et al, are distinguished by line type inspection algorithm. In experiment, we could have ensured ability of inspection that can be detected with reliability of up to 95% in about 60 seconds.

Development of Defect Inspection System for PDP ITO Patterned Glass

  • Song Jun-Yeob;Park Hwa-Young;Kim Hyun-Jong;Jung Yeon-Wook
    • International Journal of Precision Engineering and Manufacturing
    • /
    • v.7 no.3
    • /
    • pp.18-23
    • /
    • 2006
  • The formation degree of sustain (ITO pattern) determines the quality of a PDP (Plasma Display Panel). Thus, in the present study, we attempt to detect 100% of the defects that are larger than $30{\mu}m$. Currently, the inspection method in the PDP manufacturing process is dependent upon the naked eye or a microscope in off-line mode. In this study, a prototype inspection system for PDP ITO patterned glass is developed. The developed system, which is based on a line-scan mechanism, obtains information on the defects and sorts the defects by type automatically. The developed inspection system adopts a multi-vision method using slit-beam formation for minimum inspection time and the detection algorithm is embodied in the detection ability. Characteristic defects such as pin holes, substances, and protrusions are extracted using the blob analysis method. Defects such as open, short, spots and others are distinguished by the line type inspection algorithm. It was experimentally verified that the developed inspection system can detect defects with reliability of up to 95% in about 60 seconds for the 42-inch PDP panel.

A Study on Inspection Technology of PDP ITO Defect (PDP ITO 결함 검출기술에 관한 연구)

  • 송준엽;박화영;정연욱;김현종
    • Proceedings of the Korean Society of Precision Engineering Conference
    • /
    • 2003.06a
    • /
    • pp.191-195
    • /
    • 2003
  • The formation degree of sustain (ITO pattern) decides quality of PDP (plasma display panel). For this reason. it makes efforts in search defects more than 30 ${\mu}{\textrm}{m}$. Now, the existing inspection process is dependent upon naked eye or SEM equipment in off-line PDP manufacturing process. In this study developed prototype inspection system of PDP ITO glass. This system creates information that detects and sorts kind of defect automatically. Design ed inspection technology adopts line-scan method by slip-beam formation for the minimum of inspection time and image processing algorithm is embodied in detection ability of developed system. Designed algorithm had to make good use of kernel matrix which draws up an approach to geometry. A characteristic of area-shaped defects, as pin hole, substance, protrusion et al, are extracted from blob analysis method. Defects, as open, short, spots, et al, are distinguished by line type inspection algorithm. In experiment results, we could have ensured ability of inspection that can be detected with reliability of up to 95% in about 60 seconds

  • PDF