Browse > Article

Development of Defect Inspection System for PDP ITO Patterned Glass  

Song Jun Yeob (한국기계연구원 지능형정밀기계연구)
Park Hwa Young (한국기계연구원 지능형정밀기계연구)
Kim Hyun Jong (한국기계연구원 지능형정밀기계연구)
Jung Yeon Wook ((주)엔알티 부설연구소)
Publication Information
Journal of the Korean Society for Precision Engineering / v.21, no.12, 2004 , pp. 92-99 More about this Journal
Abstract
The formation degree of sustain (ITO pattern) decides quality of PDP (Plasma Display Panel). For this reason, it makes efforts in searching defects more than 30 un as 100%. Now, the existing inspection is dependent upon naked eye or microscope in off-line PDP manufacturing process. In this study developed prototype inspection system of PDP 170 glass is based on line-scan mechanism. Developed system creates information that detects and sorts kinds of defect automatically. Designed inspection technology adopts multi-vision method by slip-beam formation for the minimum of inspection time and detection algorithm is embodied in detection ability of developed system. Designed algorithm had to make good use of kernel matrix that draws up an approach to geometry. A characteristic of defects, as pin hole, substance, protrusion, are extracted from blob analysis method. Defects, as open, short, spots and et al, are distinguished by line type inspection algorithm. In experiment, we could have ensured ability of inspection that can be detected with reliability of up to 95% in about 60 seconds.
Keywords
PDP; ITO; Sustain; Defect; Defect map; Detection algorithm; Line-scan;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
1 Kim, M. H., Lee, S. Y., 'Development of Scratch Detecting Algorithm for ITO Coated Glass using Adaptive Logical Thresholding Method,' Journal of KSPE, Vol.20, No. 8, pp. 108-114, 2003. 8   과학기술학회마을
2 Kim, H. J., Song, J. Y., Park, H. Y., Bae, S. S., Park, C. Y., 'A Study on Analysis and Evaluation of Defects on PDP Process,' Conference of KSPE 2004, pp.724-728, 2004. 5
3 Song, J. Y., Park, H. Y., Jung, Y. U., Kim, H. J., 'A study on inspection technology of PDP ITO defect,' Conference of KSPE 2003, pp.191-195, 2003. 6   과학기술학회마을
4 Lee, H. Y., 'Fundamental principle of Sputtering for tin film formation,' Georgia Institute of Technology
5 Park, H. Y., Song, J. Y., 'Development of PDP element technology,' A report of research, KOCI/KIMM, 2002. 5
6 安藤 久仁夫, 外, 最新プラズマディスプレイ製造技術, プレスヅャナル, 1997
7 Lee, S. Y., Kim, G. H., Choi, Y. B., Lee, H. S., Lim, S. G., 'Trends in PDP inspection technology,' Journal of KSPE, Vo1. 18, No. 11, pp. 28-33, 2001
8 岩井 善弘, 越石 健司, 'ディスプレイ部品.材料 最前線, 工業調査會, 2002. 10