• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.33 no.1
• /
• pp.25-30
• /
• 2020

Oxide (SiO₂)/Metal(Ag)/Oxide(SiO₂, ITO, ZnO) multilayer films were fabricated using a magnetron sputtering technique at room temperature on Si (p-type, 100) and a glass substrate. The electrical and optical properties of the asymmetric multilayer films depended on the thickness of the mid-layer film and the type of oxide in the bottom layer. As the metal layer becomes thicker, the sheet resistance decreases. However, the transmittance decreases when the metal layer exceeds a threshold thickness of approximately 10~12 nm. In addition, the sheet resistance and transmittance change according to the type of oxide in the bottom layer. If the oxide has a large resistivity, the overall sheet resistance increases. In addition, the anti-reflection effect changes according to the refractive index of the oxide material. The optical and electrical properties of multilayer films were investigated using an ultraviolet visible (UV-Vis) spectrophotometer and a 4-point probe, respectively. The optimum structure is SiO₂ (30 nm)/Ag (10 nm)/ZnO (30 nm) multilayer, with the highest FOM value of 7.7×10^-3 Ω^-1.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.32 no.2
• /
• pp.134-140
• /
• 2019

Oxide ($SnO_2$)/metal alloy (Cu(Ni))/oxide ($SnO_2$) multilayer films were fabricated using the magnetron sputtering technique. The oxide and metal alloy were $SnO_2$ and Ni-doped Cu, respectively. The structural, optical, and electrical properties of the multilayer films were investigated using X-ray diffraction (XRD), ultraviolet-visible (UV-vis) spectrophotometry, and 4-point probe measurements, respectively. The properties of the $SnO_2/Cu(Ni)/SnO_2$ multilayer films were dependent on the thickness and Ni doping of the mid-layer film. Since Ni atoms inhibit the diffusion and aggregation of Cu atoms, the grain growth of Cu is delayed upon Ni addition. For $250^{\circ}C$, the Haccke's figure of merit (FOM) of the $SnO_2$ (30 nm)/Cu(Ni) (8 nm)/$SnO_2$ (30 nm) multilayer film was evaluated to be $0.17{\times}10^{-3}{\Omega}^{-1}$.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.37 no.5
• /
• pp.500-506
• /
• 2024

The transparent electrode characteristics of the SnO₂/AgNi/SnO₂ (OMO) multilayer structures prepared by sputtering were investigated according to the annealing temperature. Ni-doped Ag of various compositions was selected as the metal layer and heat treatment was performed at 100~300℃ to evaluate the thermal stability of the metals. The manufactured OMO multilayer structures were heat treated for 6 hours at 400~600℃ in an N₂ atmosphere. The structural, electrical, and optical properties of the OMO structures before and after annealing were evaluated and analyzed using a UV-VIS spectrophotometer, 4-point probe, XPS, FE-SEM, etc. OMO with Ni-doped Ag shows improved performance due to the reduction of structural defects of Ag during annealing, but OMO structure with pure Ag shows degradation characteristics due to Ag diffusion into the oxide layer during high-temperature annealing. The figure of merit (FOM) of SnO₂/Ag/SnO₂ was highest at room temperature and gradually decreased as the heat treatment temperature increased. On the other hand, the FOM value of SnO₂/AgNi/SnO₂ mostly showed its maximum value at high temperature(~550℃). In particular, the FOM value of SnO₂/Ag-Ni (3.2 at%)/SnO₂ was estimated to be approximately 2.38×10^-2 Ω^-1. Compared to transparent electrodes made of other similar materials, the FOM value of the SnO₂/Ag-Ni (3.2 at%)/SnO₂ multilayer structure is competitive and is expected to be used as an alternative transparent conductive electrode in various devices.

• Journal of the Microelectronics and Packaging Society
• /
• v.25 no.2
• /
• pp.19-23
• /
• 2018

In this study, the feasibility of Al-based transparent electrodes for optoelectronic devices was investigated. Al thin films having thickness in the range of 3-12 nm were deposited on glass substrates, and sheet resistance was measured for films thicker than 7 nm and the values continue to decrease with increasing film thickness. The grain size in the films was found to increase with increasing grain size. 85% visible light transmittance was measured at the thickness of 3 nm, and decreased to 50% and 60% when the film thickness reaches 4 nm and 5 nm, respectively. The results of this study can be used in the applications of oxide/metal/oxide type transparent electrodes.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.31 no.6
• /
• pp.408-411
• /
• 2018

We fabricated highly flexible Mn-doped $SnO_2$ (MTO)/Ag/MTO/polydimethylsiloxane (PDMS)/MTO multilayer transparent conducting films. To reduce refractive-index mismatching of the MTO/Ag/MTO/polyethylene terephthalate (PET), index-matching layers were inserted between the oxide-metal-oxide-structured films and the PET substrate. The PDMS layer was deposited by spin-coating after adjusting the mixing ratio of PDMS and hexane. We investigated the effects of the index-matching layer on the color and reflectance differences with different PDMS dilution ratios. As the dilution ratio increased from 1:100 to 1:130, the color difference increased slightly, while the reflectance difference decreased from 0.62 to 0.32. The MTO/Ag/MTO/PDMS/MTO film showed a transmittance of 87.18~87.68% at 550 nm. The highest value of the Haacke figure of merit was $47.54{\times}10^{-3}{\Omega}^{-1}$ for the dilution ratio of 1:130.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.26 no.7
• /
• pp.510-514
• /
• 2013

In order to prevent heat loss that occurs through the glass, low-emissivity (Low-E) coating methods with good insulating properties and high transmittance were used. InGaZnO/Ag/InGaZnO (IGZO/Ag/IGZO) multilayer thin films have been deposited on XG glass substrate by RF magnetron sputtering. Depending on the different thickness of Ag in multilayer films, the structural and optical properties of Low-E multilayer films were analyzed. By XRD analysis results, the multilayer thin films were observed to be amorphous structure regardless of Ag thickness. According to the AFM results, surface morphology of the multilayer films was observed and compared. Using UV-VIS spectroscopy, low emissivity property has been observed clearly with the transmittance of higher than 85% at visible range and lower than 30% at IR range.

• Proceedings of the Korean Institute of Surface Engineering Conference
• /
• 2016.11a
• /
• pp.158-158
• /
• 2016

최근 화석연료의 고갈과 환경 보전 및 에너지 절약에 대한 관심이 높아짐에 따라 화석연료의 소비를 최소화하고 실내조건을 쾌적하게 유지하려는 연구가 진행되고 있다. 국내의 경우 전체 에너지 소비의 30%이상을 차지하고 있는 건물부문에서의 에너지 소비를 줄이기 위한 활발한 연구가 진행되고 있으며 이에 따른 에너지절약 소재개발이 활발하게 진행되고 있다. 1975년 이후 여러 차례에 걸친 단열강화 조치를 통해 건물에서의 에너지 소모를 줄이고 있었으나 건물의 외벽에 대한 사항으로 한정되어있었고, 또한 건물의 창 면적이 증가함에 따라 창을 통한 열손실량과 열획득량이 더욱 증가하게 되었다. 이러한 문제를 해결하기 위해 열반사유리에 대한 많은 연구가 진행되고 있다. 열반사유리는 근적외선(열선)영역의 빛을 반사시켜 실내의 열손실량 및 외부에서의 열획득량을 감소시켜 에너지의 소비를 줄일 수 있는 유리을 말한다. 이러한 열반사유리은 fresnel 방정식을 통해 빛의 파장대에 따른 반사율 및 투과도를 예측할 수 있는데, 다층박막구조인 Oxide-Metal-Oxide(OMO)구조는 Oxide의 높은 굴절률과 Metal의 낮은 굴절률을 통해 가시광영역대의 높은 투과도와 근적외선 영역의 높은 반사율을 얻을 수 있다. 또한 Metal층을 삽입함으로서 flexible한 코팅이 가능하고, 높은 carrier density와 mobility로 표면 플라즈몬 공명을 통해 특정 파장대의 반사율을 높일 수 있으므로 많은 연구가 진행되고 있다. $TiO_2$는 고굴절률 및 낮은 광흡수성의 특성을 가지는 산화물반도체로 기존의 $In_2O_3$계 산화물에 비해 값이 싸고 높은 안정성과 광촉매특성을 보이므로 외부에 노출된 환경에 적합한 재료이다. Ag는 저굴절률과 낮은 광흡수성을 가지는 재료로 금속층에 적합하다. 본 연구에서는 fresnel 방정식을 통해 반사도 및 투과도를 예측하고 마그네트론 스퍼터링법으로 다층박막을 열선인 적외선 영역에서의 반사율 및 반사 효율을 평가하였다. Index-matching 시뮬레이션을 통해 $TiO_2/Ag/TiO_2$ 다층박막의 투과도와 반사도를 이론적으로 검토하였다. 시뮬레이션 프로그램은 Macleod프로그램을 이용하였고 재료 각각의 굴절률은 Ellipsometry를 이용하여 측정하였다. 두께 40 nm 와 8 ~ 16 nm를 가지는 $TiO_2$층과 Ag층을 각각 RF/DC 마그네트론 스퍼터링법을 이용하여 Glass기판 위에 증착하였다. 직경 3 in 의 $TiO_2$, Ag 소결체 타깃을 이용하였고 스퍼터링 파워는 각각 200 W, 50 W로 설정하였고, 스퍼터링 가스는 Ar가스의 유량을 20 sccm으로 설정하였다. 작업압력은 모두 1 Pa로 설정하였고 타깃 표면의 불순물 및 이물질 제거를 위해 Pre-sputtering을 10분 진행하였다. 박막의 두께는 reflectometer와 Alphastep을 이용하여 측정하였고 Hall effect measurement를 이용하여 비저항, carrier density, mobility등 전기적 특성을 측정하였다. 또한 UV-VIS spectrometer와 USPM-RU-W NIR Micro-Spectrophotometer를 통해 광학적 특성을 측정하였고 계산 값과 비교분석하였다. 또한 열반사 특성을 평가하기 위해 직접 set-up한 장비를 이용하였다. 단열 박스에 샘플을 장착해 적외선 램프를 조사하였을 때의 열 반사효율을 평가하였고, IR Camera를 이용하여 단열 박스 내부의 온도 변화를 관찰하였다.