DOI QR코드

DOI QR Code

Ultra-thin aluminum thin films deposited by DC magnetron sputtering for the applications in flexible transparent electrodes

DC 마그네트론 스퍼터링법으로 증착된 초박형 Al 박막의 투명전극 적용성 연구

  • Kim, Daekyun (School of Advanced Materials Engineering, Dong-Eui University) ;
  • Choi, Dooho (School of Advanced Materials Engineering, Dong-Eui University)
  • 김대균 (동의대학교 신소재공학부) ;
  • 최두호 (동의대학교 신소재공학부)
  • Received : 2018.05.03
  • Accepted : 2018.06.27
  • Published : 2018.06.30

Abstract

In this study, the feasibility of Al-based transparent electrodes for optoelectronic devices was investigated. Al thin films having thickness in the range of 3-12 nm were deposited on glass substrates, and sheet resistance was measured for films thicker than 7 nm and the values continue to decrease with increasing film thickness. The grain size in the films was found to increase with increasing grain size. 85% visible light transmittance was measured at the thickness of 3 nm, and decreased to 50% and 60% when the film thickness reaches 4 nm and 5 nm, respectively. The results of this study can be used in the applications of oxide/metal/oxide type transparent electrodes.

광전소자용 투명전극으로 적용하기 위한 초박형 Al 박막에 대한 기초연구를 수행하였다. 유리 기판 상에 3-12 nm의 두께를 가지는 Al 박막을 형성하였으며, 박막의 두께가 7 nm 이상일 때부터 면저항이 측정되었으며 두께가 증가할 때 면저항이 점진적으로 감소하였다. 박막 내 그레인 크기(Grain size)는 두께가 증가할수록 비례하여 증가하였다. 광 투과도의 경우 가시광선영역(380~770 nm) 파장 기준으로, 3 nm 박막 두께에서 평균 85%의 투과도가 측정된 데 반하여, 4, 5 nm 두께에서 평균 50, 60%로 급격하게 감소되기 시작하며 그 이후 두께 증가에 따라 투과도가 점진적으로 감소하였다. 본 연구결과는 향후 Oxide/Metal/Oxide(OMO) 구조의 고투과, 저저항 투명전극 적용을 위한 기초 결과로 활용될 것으로 기대된다.

Keywords

References

  1. J. H. Lee, P. Lee, H. M. Lee, D. J. Lee, S. S. Lee, and S. H. Ko, "Very long Ag nanowire synthesis and its application in a highly transparent, conductive and flexible metal electrode touch panel", Nanoscale, 4, 6408 (2012). https://doi.org/10.1039/c2nr31254a
  2. J. Wu, H. A. Becerril, Z. Bao, Z. Liu, Y. Chen, and P. Peumans, "Organic solar cells with solution-processed graphene transparent electrodes", Appl. Phys. Lett., 92(26), 263302 (2008). https://doi.org/10.1063/1.2924771
  3. D. S. Hecht, D. Thomas, L. Hu, C. Ladous, T. Lam, Y. B. Park, G. Irvin, and P. Drzaic, "Carbon-nanotube film on plastic as transparent electrode for resistive touch screens", J. of the SID.,17(11), 941 (2009).
  4. J. H. Yun, "Transparent Ultrathin Oxygen-Doped Silver Electrodes for Flexible Organic Solar Cells", Adv. Funct. Mater., 24, 1551 (2014). https://doi.org/10.1002/adfm.201301359
  5. G. Zhao, W. Wang, T.-S. Bae, S.-G. Lee, C. W. Mun, S. H. Lee, H. Yu, G.-H. Lee, M. K. Song, and J. H. Yun, "Stable ultrathin partially oxidized copper film electrode for highly efficient flexible solar cells", Nat. com., 6, 8830 (2015). https://doi.org/10.1038/ncomms9830
  6. K. Fuchs, "The conductivity of thin metallic films according to the electron theory of metals", Proc. Cambridge Philos. Soc., 34, 100 (1938). https://doi.org/10.1017/S0305004100019952
  7. E. H. Sondheimer, "The mean free path of electrons in metals", Advances in Physics,1(1), 1 (1952). https://doi.org/10.1080/00018735200101151
  8. A. F. Mayadas, and M. Shatzkes, "Electrical-resistivity model for polycrystalline films: the case of arbitrary reflection at external surfaces", Phys. Rev. B., 1, 1382 (1970). https://doi.org/10.1103/PhysRevB.1.1382
  9. D. Gall, "Electron mean free path in elemental metals", J. of Appl. Phys., 119, 085101 (2016). https://doi.org/10.1063/1.4942216
  10. H. Abram, "Grain size measurement by the intercept method", Metallography 4, 59 (1971). https://doi.org/10.1016/0026-0800(71)90005-X
  11. Y. Shigesato, R. Koshi-ishi, T. Kawashima, and J. Ohsako, "Early stages of ITO deposition on glass or polymer substrates", Vacuum, 59, 614 (2000). https://doi.org/10.1016/S0042-207X(00)00324-9
  12. J. A. Floro, S. J. Hearne, J. A. Hunter, P. Kotula, E. Chason, S. C. Seel, and C. V. Thompson, "The dynamic competition between stress generation and relaxation mechanisms during coalescence of Volmer-Weber thin films", J. Appl. Phys., 89, 4886 (2001). https://doi.org/10.1063/1.1352563
  13. D. Choi, and K. Barmak, "On the potential of tungsten as next-generation semiconductor interconnects", Electron. Mater. Lett., 13, 449 (2017). https://doi.org/10.1007/s13391-017-1610-5
  14. W. Zhang, S. H. Brongersma, O. Richard, B. Brijs, R. Palmans, L. Froyen, and K. Maex, "Influence of the electron mean free path on the resistivity of thin metal films", Microelectron. Engineer., 76, 146 (2004). https://doi.org/10.1016/j.mee.2004.07.041
  15. Y. Lantasov, R. Palmans, and K. Maex, "New plating bath for electroless copper deposition on sputtered barrier layers", Microelectron. Engineer., 50, 441 (2000). https://doi.org/10.1016/S0167-9317(99)00313-5
  16. W. Zhang, S. H. Brongersma, T. Clarysse, V. Terzieva, E. Rosseel, W. Vandervorst,and K. Maex, "Surface and grain boundary scattering studied in beveled polycrystalline thin copper films", J. of Vac. Sci. & Technol. B., 22,1830 (2004). https://doi.org/10.1116/1.1771666
  17. C. Zhang, D. Zhao, D. Gu, H. S. Kim, T. Ling, Y. K. R. Wu, and L. J. Guo, "An ultrathin, smooth, and low loss Al doped Ag film and its application as a transparent electrode in organic photovoltaics", Adv. Mater., 26, 5696-5701(2014). https://doi.org/10.1002/adma.201306091