• Journal of Korean Society for Quality Management
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• v.30 no.3
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• pp.66-78
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• 2002

Process capability indices are being used as indicators for measurements of process capability for SPC of quality assurance system in industries. In view of the enhancement of customer satisfaction, process capability indices in which loss functions are used to deal with the economic loss In the processes deviated from the target, are in an adequate representation of the customer's perception of quality In this connection, the loss function has become increasingly important in quality assurance. Taguchi uses a modified form of the quadratic loss function to demonstrate the need to consider the proximity to the target while assessing its quality. But this traditional quadratic loss function is inadequate to assessing the quality and quality improvement since different processes have different sets of economic consequences on the manufacturing, Thereby, a flexible approach to the development of the loss function needs to be desired. In this paper, we introduce an easily understood loss function, based on reflection of probability density function of the normal distribution. That is, the Reflected Normal Loss function can be adapted to an asymmetric loss as well as to a symmetric loss around the target. We propose that, instead of the process variation, a new capability index, CpI using the Reflected Normal Loss Function that can accurately reflect the losses associated with the process and a new capability index CpI Is compared with the classical indices as $C_{p}$ , $C_{pk}$, $C_{pm}$ and $C_{pm}$ $^{+}$.>.+/./.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.21 no.48
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• pp.233-240
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• 1998

Recently, Hong-Jun Kim et al. introduced an improved process incapability index $C^*_{psk}$ by the transformation of the $C_{psk}{\;}C^*_{psk}$. A simple transformation of $C_{psk}$, can be regard as a process incapability index, provides an uncontaminated separation between information concerning the process accuracy and precision while this kind of information separation is not available with the $C_{psk}$. By an identical conception, in this article a new process incapability index $C^*_{psk}$ for Non-Normal process can be proposed by the transformation of the process capability index $C^*_{psk}$. The motivation behind introduction of $C^*_{psk}$ is that process capability index $C^*_{psk}$ cannot give information of the process accuracy and precision. A significant result of this research that $C^*_{psk}$ for the case where the target value T is equal to the midpoint of the specification limits or not Is evaluated without respect to T. Accordingly, $C^*_({psk})$ will be propose a reasonable process incapability measure for Non-Normal process

• Journal of the Korea Safety Management & Science
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• v.2 no.2
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• pp.41-55
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• 2000

The main objective of this paper is to propose a measure of evaluation for non-normal process capability. If a process is not normally distributed, but normal-based techniques are used, serious errors can result. Our approach to solve this problem is that the Pearson system, the Johnson system, and the Burr system are selected for estimating a measure of process capability using the percentage nonconforming. In this paper, we found that the Pearson system and the Johnson system were a conparatively reasonable methods to calculate out of specification by example.

• Proceedings of the Korean Reliability Society Conference
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• 2001.06a
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• pp.311-319
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• 2001

All indices that are now in use assume normally distributed data, and any use of the indices on non-normal data results in inaccurate capability measurements. Therefore, $C_{s}$ is proposed which extends the most useful index to date, the Pearn-Kotz-Johnson $C_{pmk}$, by not only taking into account that the process mean may not lie midway between the specification limits and incorporating a penalty when the mean deviates from its target, but also incorporating a penalty for skewness. Therefore we propose, a new process capability index $C_{psk}$( WV) applying the weighted variance control charting method for non-normally distributed. The main idea of the weighted variance method(WVM) is to divide a skewed or asymmetric distribution into two normal distribution from its mean to create two new distributions which have the same mean but different standard distributions. In this paper we propose an example, a distribution generated from the Johnson family of distributions, to demonstrate how the weighted variance-based process capability indices perform in comparison with another two non-normal methods, namely the Clements and the Wright methods. This example shows that the weighted valiance-based indices are more consistent than the other two methods In terms of sensitivity to departure to the process mean/median from the target value for non-normal process.s.s.s.

• Journal of Korean Society for Quality Management
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• v.31 no.1
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• pp.109-122
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• 2003

This paper presents a robust process capability index(PCI) based on the expected loss derived from the empirical distribution function(EDF). We propose the EDF expected loss in order to develop a PCI that does not depends on the underlying process distribution. The EDF expected loss depends only on the sample data, so the PCI based on it is robust and it does nor require complex calculations. The inverted normal loss function(INLF) is employed in order to overcome the drawback of the quadratic loss which may Increase unboundedly outside the specification limits. A comprehensive simulation study was performed under various process distributions, in order to compare the accuracy and the precision of the proposed PCI with those of the PCI based on the expected loss derived from the normal distribution. The proposed PCI turned out to be more accurate than the normal PCI in most cases, especially when the process distribution has high kurtosis or skewness. It is expected that the proposed PCI can be utilized In real processes where the true distribution family may not be known.

• Journal of the Korea Safety Management & Science
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• v.3 no.3
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• pp.175-190
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• 2001

We propose, a new process capability index $C_{psk}$(WV) applying the weighted variance control charting method for non-normally distributed. The main idea of the weighted variance method(WVM) is to divide a skewed or asymmetric distribution into two normal distributions from its mean to create two new distributions which have the same mean but different standard deviations. In this paper we propose an example, a distributions generated from the Johnson family of distributions, to demonstrate how the weighted variance-based process capability indices perform in comparison with another two non-normal methods, namely the Clements and the Wright methods. This example shows that the weighted valiance-based indices are more consistent than the other two methods in terms of sensitivity to departure to the process mean/median from the target value for non-normal processes. Second method show using the percentage nonconforming by the Pearson, Johnson and Burr systems. This example shows a little difference between the Pearson system and Burr system, but Johnson system underestimated than the two systems for process capability.

• Proceedings of the Safety Management and Science Conference
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• 2000.05a
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• pp.249-263
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• 2000

This paper considers an algorithm using Johnson transformation to calculate process capability index for non-normal distribution. Johnson transformation is well known as one of methods transforming the data with non-normal distribution to normal data.

• 한국정보디스플레이학회:학술대회논문집
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• 2006.08a
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• pp.274-277
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• 2006

Nanostructured carbon (nm-C), including carbon nanotubes and nanofibers (CNTs/CNFs) is promising for low-cost field emission display (FED) application. By modification of CNTs/CNFs, uniform CNTs/CNFs can be obtained and used for field emission cathode (FEC) on glass substrate. By screen-printing (SP) and electrophoretic deposition (EPD) process, large area FEC can be obtained. The FED properties are studied and compared. Both SP and EPD FEC show excellent field emission properties, such as low emission field and uniform emission, after optimization the fabrication process. While EPD FEC exhibits better luminescence image. By vacuum sealing, the low cost nm-C-FED prototypes based on EPD cathode have been demonstrated.

• Journal of Korean Society for Quality Management
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• v.26 no.4
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• pp.65-78
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• 1998

Process capability indices, used to determine whether a production process is capable of producing items within a specified tolerance, have been widely used in process assessments. In this paper, we consider some process capability indices using loss function when process is contaminated normal. Also, we examine some small sample properties related to these estimaters by some simulations.

• Proceedings of the Korean Society for Quality Management Conference
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• 1998.11a
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• pp.159-173
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• 1998

Quality characteristics on the properties of process capability indices (PCIs) are often required to be normally distributed. But, if a characteristic is not normally distributed, serious errors can result from normal-based techniques. In this case, we may well consider the use of new PCIs specially designed to be robust for non-normality. In this paper, a newly proposed measure of process capability is introduced and compared with existing PCIs using the simulated non-normal data.