• Title/Summary/Keyword: Network Test

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EEG Signal Prediction by using State Feedback Real-Time Recurrent Neural Network (상태피드백 실시간 회귀 신경회망을 이용한 EEG 신호 예측)

  • Kim, Taek-Soo
    • The Transactions of the Korean Institute of Electrical Engineers D
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    • v.51 no.1
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    • pp.39-42
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    • 2002
  • For the purpose of modeling EEG signal which has nonstationary and nonlinear dynamic characteristics, this paper propose a state feedback real time recurrent neural network model. The state feedback real time recurrent neural network is structured to have memory structure in the state of hidden layers so that it has arbitrary dynamics and ability to deal with time-varying input through its own temporal operation. For the model test, Mackey-Glass time series is used as a nonlinear dynamic system and the model is applied to the prediction of three types of EEG, alpha wave, beta wave and epileptic EEG. Experimental results show that the performance of the proposed model is better than that of other neural network models which are compared in this paper in some view points of the converging speed in learning stage and normalized mean square error for the test data set.

Vehicle Dynamic Simulation Using the Neural Network Bushing Model (인공신경망 부싱모델을 사용한 전차량 동역학 시뮬레이션)

  • 손정현;강태호;백운경
    • Transactions of the Korean Society of Automotive Engineers
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    • v.12 no.4
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    • pp.110-118
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    • 2004
  • In this paper, a blackbox approach is carried out to model the nonlinear dynamic bushing model. One-axis durability test is performed to describe the mechanical behavior of typical vehicle elastomeric components. The results of the tests are used to develop an empirical bushing model with an artificial neural network. The back propagation algorithm is used to obtain the weighting factor of the neural network. Since the output for a dynamic system depends on the histories of inputs and outputs, Narendra's algorithm of ‘NARMAX’ form is employed in the neural network bushing module. A numerical example is carried out to verify the developed bushing model.

The Performance Advancement of Test Algorithm for Inner Defects in Semiconductor Packages (반도체 패키지의 내부 결함 검사용 알고리즘 성능 향상)

  • 김재열;윤성운;한재호;김창현;양동조;송경석
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.10a
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    • pp.345-350
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    • 2002
  • In this study, researchers classifying the artificial flaws in semiconductor packages are performed by pattern recognition technology. For this purposes, image pattern recognition package including the user made software was developed and total procedure including ultrasonic image acquisition, equalization filtration, binary process, edge detection and classifier design is treated by Backpropagation Neural Network. Specially, it is compared with various weights of Backpropagation Neural Network and it is compared with threshold level of edge detection in preprocessing method fur entrance into Multi-Layer Perceptron(Backpropagation Neural network). Also, the pattern recognition techniques is applied to the classification problem of defects in semiconductor packages as normal, crack, delamination. According to this results, it is possible to acquire the recognition rate of 100% for Backpropagation Neural Network.

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LVQ Network Design using SOM (SOM을 이용한 LVQ 네트워크 설계)

  • 김영렬;이용구;손동설;강성호;엄기환
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2002.11a
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    • pp.382-385
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    • 2002
  • We design LVQ network using SOM network for the LVQ's performance improvement. Reference vectors and the number of output neurons, they are the proposed LVQ network's initial parameters, are determined in SOM which is used for preprocessing LVQ. We simulate it to the grouping test of Fisher's Iris data. In this result, we confirm proposed LVQ network is better than existing LVQ in grouping test.

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The Performance Advancement of Test Algorithm for Inner Defects In Semiconductor Packages (반도체 패키지의 내부 결함 검사용 알고리즘 성능 향상)

  • Kim J.Y.;Kim C.H.;Yoon S.U.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.10a
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    • pp.721-726
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    • 2005
  • In this study, researchers classifying the artificial flaws in semiconductor. packages are performed by pattern recognition technology. For this purposes, image pattern recognition package including the user made software was developed and total procedure including ultrasonic image acquisition, equalization filtration, binary process, edge detection and classifier design is treated by Backpropagation Neural Network. Specially, it is compared with various weights of Backpropagation Neural Network and it is compared with threshold level of edge detection in preprocessing method for entrance into Multi-Layer Perceptron(Backpropagation Neural network). Also, the pattern recognition techniques is applied to the classification problem of defects in semiconductor packages as normal, crack, delamination. According to this results, it is possible to acquire the recognition rate of 100% for Backpropagation Neural Network.

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Bridge Monitoring System based on LoRa Sensor Network (LoRa 센서네트워크 기반의 무선교량유지관리 시스템 구축)

  • Park, Jin-Oh;Park, Sang-Heon;Kim, Kyung-Soo;Park, Won-Joo;Kim, Jong-Hoon
    • Journal of the Computational Structural Engineering Institute of Korea
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    • v.33 no.2
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    • pp.113-119
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    • 2020
  • The IoT-based sensor network is one of the methods that can be efficiently applied to maintain the facilities, such as bridges, at a low cost. In this study, based on LoRa LPWAN, one of the IoT communications, sensor board for cable tension monitoring, data acquisition board for constructing sensor network along with existing measurement sensors, are developed to create bridge structural health monitoring system. In addition, we designed and manufactured a smart sensor node for LoRa communication and established a sensor network for monitoring. Further, we constructed a test bed at the Yeonggwang Bridge to verify the performance of the system. The test bed verification results suggested that the LoRa LPWAN-based sensor network can be applied as one of the technologies for monitoring the bridge structure soundness; this is excellent in terms of data rate, accuracy, and economy.

KOREN based Domestic and International Verification Test of Mass Abyss Storage (대용량 Abyss Storage의 KOREN 네트워크 기반 국내 및 해외 실증 테스트)

  • Cha, ByungRae;Cha, YoonSeok;Choi, MyeongSoo;Park, Sun;Kim, JongWon
    • Smart Media Journal
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    • v.6 no.1
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    • pp.9-15
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    • 2017
  • The trends in ICT are concentrated in IoT, Bigdata, and Cloud Computing. These mega-trends do not operate independently, and mass storage technology is essential as large computing technology is needed in the background to support them. In order to evaluate the performance of high-capacity storage based on open source Ceph, we carry out the demonstration test of Abyss Storage with domestic and overseas sites using educational network KOREN. In addition, storage media and network bonding are tested to evaluate the performance of the storage itself. Although there is a substantial difference in aspect of the physical speed among storage medias, there is no significant performance difference in the storage media test performed. As a solution to this problem, we could get performance improvement through network acceleration. In addition, we conducted actual performance test of Abyss Storage internal and external network by connecting domestic and overseas sites using KOREN network.

A Study on Loose Part Monitoring System in Nuclear Power Plant Based on Neural Network (원전 금속파편시스템에 신경회로망 적용연구)

  • Kim, Jung-Soo;Hwang, In-Koo;Kim, Jung-Tak;Moon, Byung-Soo;Lyou, Joon
    • Proceedings of the Korean Institute of Intelligent Systems Conference
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    • 2002.05a
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    • pp.227-230
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    • 2002
  • The Loose Part Monitoring System(LPMS) has been designed to detect, locate and evaluate detached or loosened parts and foreign objects in the reactor coolant system. In this paper, at first, we presents an application of the back propagation neural network. At the preprocessing step, the moving window average filter is adopted to reject the low frequency background noise components. And then, extracting the acoustic signature such as Starting point of impact signal, Rising time, Half period, and Global time, they are used as the inputs to neural network. Secondly, we applied the neural network algorithm to LPMS in order to estimate the mass of loose parts. We trained the impact test data of YGN3 using the backpropagation method. The input parameter for training is Rising Time, Half Period, Maximum amplitude. The result showed that the neural network would be applied to LPMS. Also, applying the neural network to the Practical false alarm data during startup and impact test signal at nuclear power Plant, the false alarms are reduced effectively. 1.

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Selection of Important Variables in the Classification Model for Successful Flight Training (조종사 비행훈련 성패예측모형 구축을 위한 중요변수 선정)

  • Lee, Sang-Heon;Lee, Sun-Doo
    • IE interfaces
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    • v.20 no.1
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    • pp.41-48
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    • 2007
  • The main purpose of this paper is cost reduction in absurd pilot positive expense and human accident prevention which is caused by in the pilot selection process. We use classification models such as logistic regression, decision tree, and neural network based on aptitude test results of 505 ROK Air Force applicants in 2001~2004. First, we determine the reliability and propriety against the aptitude test system which has been improved. Based on this conference flight simulator test item was compared to the new aptitude test item in order to make additional yes or no decision from different models in terms of classification accuracy, ROC and Response Threshold side. Decision tree was selected as the most efficient for each sequential flight training result and the last flight training results predict excellent. Therefore, we propose that the standard of pilot selection be adopted by the decision tree and it presents in the aptitude test item which is new a conference flight simulator test.

Test-Generation-Based Fault Detection in Analog VLSI Circuits Using Neural Networks

  • Kalpana, Palanisamy;Gunavathi, Kandasamy
    • ETRI Journal
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    • v.31 no.2
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    • pp.209-214
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    • 2009
  • In this paper, we propose a novel test methodology for the detection of catastrophic and parametric faults present in analog very large scale integration circuits. An automatic test pattern generation algorithm is proposed to generate piece-wise linear (PWL) stimulus using wavelets and a genetic algorithm. The PWL stimulus generated by the test algorithm is used as a test stimulus to the circuit under test. Faults are injected to the circuit under test and the wavelet coefficients obtained from the output response of the circuit. These coefficients are used to train the neural network for fault detection. The proposed method is validated with two IEEE benchmark circuits, namely, an operational amplifier and a state variable filter. This method gives 100% fault coverage for both catastrophic and parametric faults in these circuits.

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