• The Transactions of the Korean Institute of Electrical Engineers C
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• v.48 no.2
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• pp.69-75
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• 1999

The characteristics of $H_2$ gas detection have been investigated using the Pt-MIS capacitor composed of the LPCVD nitride on the oxide. The flat band voltage shift is measured as 0.1 V in 1,000 ppm $H_2$ gas ambient and to be independent of Pt catalyst thickness. It is found that the flatband voltage shift is proportional to the hydrogen concentrations. The response and recovery time of Pt-MIS capacitor are 5 mins and 25 mins respectively. The samples of 30nm thick Pt revealed much higher sensitivity than that of 150nm samples. The samples of 150nm Pt showed that the flatband voltage shift of the device is due to the formation of the dipole layer of the adsorbed hydrogen atoms at the Pt-insulator interface.

• Proceedings of the KIEE Conference
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• 1997.11a
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• pp.333-335
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• 1997

This paper was performed to investigate the characteristic of the Pt-MIS(Metal Insulator Semiconductor) capacitor composed of the LPCVD nitride on the oxide for the hydrogen gas detection. Pt was used as catalytic metal for detecting the hydrogen gas and the flat band voltage shift was measured at various hydrogen concentration and catalytic metal thickness. We found the flat band voltage shift was proportional to the hydrogen concentration and catalytic metal thickness was little effect to the response time.

• Proceedings of the KIEE Conference
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• 1997.07d
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• pp.1264-1266
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• 1997

This paper reports the characteristic of tile MIS structure composed of the LPCVD nitride on the oxide for the hydrogen gas detection. Pt was used as catalytic metal for detecting the hydrogen gas and the flat band voltage shift was measured at various hydrogen concentration. We found the flat band voltage shift was proportional to the hydrogen concentration.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.26 no.11
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• pp.1747-1750
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• 2022

As shrinking the semiconductor process into the deep sub-micron to achieve high-density, low power and high performance integrated circuits, MBU (multiple bit upset) by soft errors is one of the major challenge of on-chip memory systems. To address the MBU, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not resolve mis-correction. We propose the SEC-DED-DAEC-TAED(triple adjacent error detection) code without mis-corrections. The generated H-matrix by the proposed heuristic algorithm to accomplish the proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the 2-stage pipelined decoder can be employed on-chip memory system.

• Journal of the Korea Convergence Society
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• v.13 no.3
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• pp.23-31
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• 2022

This study analyzed the actual frozen container operation data of Starcool provided by H Shipping. Through interviews with H's field experts, only Critical and Fatal Alarms among the four failure alarms were defined as failures, and it was confirmed that using all variables due to the nature of frozen containers resulted in cost inefficiency. Therefore, this study proposes a method for detecting failure of frozen containers through characteristic importance and PCA techniques. To improve the performance of the model, we select variables based on feature importance through tree series models such as XGBoost and LGBoost, and use PCA to reduce the dimension of the entire variables for each model. The boosting-based XGBoost and LGBoost techniques showed that the results of the model proposed in this study improved the reproduction rate by 0.36 and 0.39 respectively compared to the results of supervised learning using all 62 variables.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.26 no.10
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• pp.1559-1562
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• 2022

As electronic devices technology scales down into the deep-submicron to achieve high-density, low power and high performance integrated circuits, multiple bit upsets by soft errors have become a major threat to on-chip memory systems. To address the soft error problem, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not troubleshoot mis-correction problem. We propose the SEC-DED_DAEC code with without mis-correction. The decoder for proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the decoder can be employed on-chip memory system.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.544-547
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• 2008

As the mobile electronic product is getting slimmer and smaller, the necessity of keypad is being increased. But the possibility of mis-typing keypad is increased rapidly due to the integrated keypad in the small mobile product. The business division has not considered the methodology of keypad design essentially. In this paper, analysis method and design evaluation standard to reduce the mis-typing of UMPC(Ultra Mobile Personal Computer) is suggested. First, the finite element analysis model and the biomechanical human body model are implemented in order to simulate the exact contact characteristic between finger and keypad. The reliability of analysis model is guaranteed by the comparison of the contact pressure between analysis result and experiment result of the pressure sensor. The design optimization of key shape and layout is derived through the response surface method. The prototype model is produced with the optimized design of keypad, and then it verified the advanced function with user mis-typing detection test. The optimized keypad design reduced the mis-typing ratio from 35% of existing model to 75 of proposed model. If this paper is widely applied to not only UMPC but also the other electronic products, the emotional quality of all products could be improved considerably.

• Proceedings of the Materials Research Society of Korea Conference
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• 1998.08a
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• pp.117.4-117
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• 1998

• Proceedings of the KSR Conference
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• 2004.10a
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• pp.1303-1308
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• 2004

This paper proposes a reduction method for the mis-operation analysis of the DC High Speed Circuit Breaker(HSCB) in electric railway substation system. The analysis method is based on present condition of operation which is a method for accuracy level up. There is reason to operation of HSCB that it is mis-operation of fault detection relay(50F), operation of ground fault relay(64P), and trouble of electric car. A countermeasure is relay resetting through field test, induction of GTOCB(Gate Turn Off Thyristor Circuit Breaker), HSVCB(High Speed Vacuum Circuit Breaker), coordination with electric car. The results presented in the paper can be used as a reference for maintenance free in electric railway substation system.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.29 no.12
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• pp.809-813
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• 2016

We investigated a SiC-based hydrogen gas sensor with MIS (metal-insulator-semiconductor) structure for high temperature applications. The sensor was fabricated by $Pd/TiO_2/SiC$ structure, and a thin titanium dioxide ($TiO_2$) layer was exploited for sensitivity improvement. In the experiment, dependences of I-V characteristics and capacitance response properties on hydrogen gas concentrations from 0 to 2,000 ppm were analyzed at room temperature to $400^{\circ}C$. As the result, our sensor using $TiO_2$ dielectric layer showed possibilities with regard to use in hydrogen gas sensors for high-temperature applications.