• Proceedings of the Korean Nuclear Society Conference
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• 1997.10a
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• pp.244-250
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• 1997

The mean time to failure (MTTF) expressing the mean value of the system life is a measure of system effectiveness. To estimate the remaining life of component and/or system, the dynamic mean time to failure concept is suggested. It is the time-dependent Property depending on the status of components. The Kalman filter is used to estimate the reliability of components using the on-line information (directly measured sensor output or device-specific diagnostics in the intelligent sensor) in form of the numerical value (state factor). This factor considers the persistency of the fault condition and confidence level in measurement. If there is a complex system with many components, each calculated reliability's or components are combined, which results in the dynamic MTTF or system. The illustrative examples are discussed. The results show that the dynamic MTTF can well express the component and system failure behaviour whether any kinds of failure are occurred or not.

• Communications for Statistical Applications and Methods
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• v.19 no.2
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• pp.219-224
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• 2012

This article considers the mean time to failure(MTTF) of a dependent parallel system. We study how the degree of dependency components influences the increase in the mean lifetime for this system. The results are illustrated by tables and figures.

• International Journal of Reliability and Applications
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• v.11 no.2
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• pp.89-106
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• 2010

This paper deals with the reliability and availability characteristics of three different series system configurations with warm standby components and a repairable service station. The failure time of the primary and warm standby are assumed to be exponentially distributed with parameters ${\lambda}$ and ${\alpha}$ respectively. The repair time distribution of each server is also exponentially distributed with parameter ${\mu}$. The breakdown time and the repair time of the service station are also assumed exponentially distributed with parameters ${\gamma}$ and ${\beta}$ respectively. We derive the reliability dependent on time, availability dependent on time, the mean time to failure, $MTTF_i$, and the steady-state availability $A_i$(${\infty}$) for three configurations and perform comparisons. Comparisons are made for specific values of distribution parameters and of the cost of the components. The three configurations are ranked based on: $MTTF_i$, $A_i$(${\infty}$), and $C_i/B_i$ where $B_i$ is either $MTTF_i$ or $A_i$(${\infty}$).

• Transactions of the Korean Society of Machine Tool Engineers
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• v.15 no.4
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• pp.63-68
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• 2006

This research presents the reliability analysis of the pneumatic actuator within the tape feeder that is used to transfer the correct force to linked parts during l.0E+7 cycles. First, the degradation analysis for thrust and air leakage is executed to obtain the failure data of a product based on its performance over time. Second, once the parameters has been calculated using the weibull 2-parameter distribution and MLE(Maximum Likelihood Estimation), information related to life such as reliability, failure rate, probability density function is estimated. Finally, MTTF(Mean Time To Failure) and $B_{10}$ life of actuators are calculated. MTTF means the mean life at the confidence level and $B_{10}$ life refers to the time by which 10% of the product would fail. In this study, failure causes and solutions are examined using the reliability analysis.

• International Journal of Reliability and Applications
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• v.16 no.2
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• pp.99-111
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• 2015

In this paper, we study the reliability analysis of a repairable system with two types of failure in which switching failures and reboot delay are considered. Let units in this system be cold standby, and failure rate and repair rate of [type1, type2] components be exponentially distributed. The expressions of reliability characteristics - such as the system reliability and the mean time to system failure MTTF - are derived. We use several cases to graphically analyze the effect of various system parameters on the system reliability and MTTF. We also perform a sensitivity analysis of the reliability characteristics with changes in specific values of the system's parameters.

• Proceedings of the Korea Institute of Applied Superconductivity and Cryogenics Conference
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• 2003.10a
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• pp.324-327
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• 2003

The needs for the cryocooler which has high reliability and long MTTF are increased in the military and commercial thermal imaging system The gas contamination wear, leakage of the working fluid, fatigue and etc. have the significant effects on the reliability and MTTF(Mean Time To Failure) or MTBF(Mean Time Between Failure) of the Stirling cryocooler. In the KIMM, the Stilting cryocooler with the linear compressor was released after the several performance tests were performed. This paper describe the experimental facility for the MTTF evaluation and some typical results of the Stilling cryocooler.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.19 no.7
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• pp.252-257
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• 2018

In this paper, we propose a mean time to failure (MTTF) to improve the solution for a cryogenic cooler, which is an important part of a cooled thermal device. Common electronic devices have a high possibility of failure due to various environmental factors, such as temperature and humidity. But some special devices (such as thermal devices) are designed to overcome environmental factors. The most affected part of a cooled thermal device's MTTF is the cryogenic cooler. The MTTF of a cryogenic cooler is affected by the device's internal heat. Therefore, if the device's internal heat is reduced, the cryogenic cooler's MTTF increases. From the present device's internal heat simulation, we analyze the improvement method of the device. The proposed improvement method's effectiveness is verified by simulation and MTTF calculation.

• Proceedings of the Korean Reliability Society Conference
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• 2000.11a
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• pp.387-395
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• 2000

Circular consecutive-k-out-of-n:F system when the failure of component is dependent is studied. We assume that the failure of a component in the system increase the failure rate of the survivor which is working just before the failed component. In this case, a mean time to failure (MTTF), a average failure number of the system, and the expected cost per unit time are obtained. Then the minimum number of consecutive failed components to cause system failure to minimize the expected cost per unit time is determined as searching paths to system failure. And various numerical examples are studied.

• Journal of Power Electronics
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• v.16 no.4
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• pp.1426-1437
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• 2016

In different industrial and mission oriented applications, redundant or standby semiconductor systems can be implemented to improve the reliability of power electronics equipment. The proper structure for implementation can be one of the redundant or standby structures for series or parallel switches. This selection is determined according to the type and failure rate of the fault. In this paper, the reliability and the mean time to failure (MTTF) for each of the series and parallel configurations in two redundant and standby structures of semiconductor switches have been studied based on different failure rates. The Markov model is used for reliability and MTTF equation acquisitions. According to the different values for the reliability of the series and parallel structures during SC and OC faults, a comprehensive comparison between each of the series and parallel structures for different failure rates will be made. According to the type of fault and the structure of the switches, the reliability of the switches in the redundant structure is higher than that in the other structures. Furthermore, the performance of the proposed series and parallel structures of switches during SC and OC faults, results in an improvement in the reliability of the boost dc/dc converter. These studies aid in choosing a configuration to improve the reliability of power electronics equipment depending on the specifications of the implemented devices.

• Corrosion Science and Technology
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• v.4 no.5
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• pp.201-206
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• 2005

Starting with the meaning of the word quality, diverse concepts connoted by the term are examined. Instead of a bathtub curve, the desirable shape of a failure rate covering the entire life of a good product, which might be called hockey-stick line, is introduced. From the hockey-stick line and the definition of reliability, two measurements are extracted. The terms r-reliability (failure rate) and durability (product life) are explained. The conceptual analysis of failure mechanics explains that reliability technology pertains to design area. The desirable shape of hazard rate curve of electronic items, hockey-stick line, clarifies that Mean-Time-to-failure (MTTF) as the inverse of failure rate can be regarded a nominal life. And Bx life, different from MTTF, is explained. Reliability relationships between components and set products are explained. Reshaped definitions of r-reliability and durability are recommended. The procedure to improve reliability and the reasons for failing to identify failure mode are clarified in order to search right solutions. And generalized Life-Stress failure model is recommended for the calculation of acceleration factor.