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http://dx.doi.org/10.5762/KAIS.2018.19.7.252

A Study of MTTF improvement of Thermal Device cryogenic-cooler  

Jung, Yunsik (ISR & PGM team, Defense Agency for Technology and Quality)
Publication Information
Journal of the Korea Academia-Industrial cooperation Society / v.19, no.7, 2018 , pp. 252-257 More about this Journal
Abstract
In this paper, we propose a mean time to failure (MTTF) to improve the solution for a cryogenic cooler, which is an important part of a cooled thermal device. Common electronic devices have a high possibility of failure due to various environmental factors, such as temperature and humidity. But some special devices (such as thermal devices) are designed to overcome environmental factors. The most affected part of a cooled thermal device's MTTF is the cryogenic cooler. The MTTF of a cryogenic cooler is affected by the device's internal heat. Therefore, if the device's internal heat is reduced, the cryogenic cooler's MTTF increases. From the present device's internal heat simulation, we analyze the improvement method of the device. The proposed improvement method's effectiveness is verified by simulation and MTTF calculation.
Keywords
cryogenic-cooler; cooled thermal device; MTTF; thermal device; temperature;
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