• Journal of Computing Science and Engineering
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• v.4 no.2
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• pp.128-152
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• 2010

With the advance of computer and communication technologies, wireless sensor networks (WSNs) are increasingly used in many aspects of our daily life. However, since the battery lifetime of WSN nodes is restricted, the WSN lifetime is also limited. Therefore, it is crucial to determine this limited lifetime in advance for preventing service interruptions in critical applications. This paper proposes a feasible static analysis approach to estimating the worstcase lifetime of a WSN. Assuming known routes with a given sensor network topology and SMAC as the underlying MAC protocol, we statically estimate the lifetime of each sensor node with a fixed initial energy budget. These estimations are then compared with the results obtained through simulation which run with the same energy budget on each node. Experimental results of our research on TinyOS applications indicate that our approach can safely and accurately estimate worst-case lifetime of the WSN. To the best of our knowledge, our work is the first one to estimate the worst-case lifetime of WSNs through a static analysis method.

• Journal of Electrical Engineering and Technology
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• v.13 no.3
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• pp.1173-1184
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• 2018

The lifetime of a lithium-ion battery is one of the most important issues of the energy storage system (ESS) because of its stable and reliable operation. In this paper, the lifetime management method of the lithium-ion battery for energy storage system is proposed. The lifetime of the lithium-ion battery varies, depending on the power usage, operation condition, and, especially the selected depth of discharge (DOD). The proposed method estimates the total lifetime of the lithium-ion battery by calculating the total transferable energy corresponding to the selected DOD and achievable cycle (ACC) data. It is also demonstrated that the battery model can obtain state of charge (SOC) corresponding to the ESS operation simultaneously. The simulation results are presented performing the proposed lifetime management method. Also, the total revenue and entire lifetime prediction of a lithium-ion battery of ESS are presented considering the DOD, operation and various condition for the nations of USA and Korea using the proposed method.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.161-164
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• 2008

We proposed 2-phase regression of power function inside exponential for PDP lifetime data analysis. In introducing our method we discussed the reason why PDP degradation behavior is described by exponential function basically. By applying our method to 50HD and 50FHD PDP lifetime experiment data, we obtained more than 100,000Hr lifetime. From these results, we claim that PDP lifetime is more than 100,000Hr.

• The Korean Journal of Applied Statistics
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• v.21 no.4
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• pp.631-638
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• 2008

Accelerated Lifetime Test is a method of estimation of lifetime quality characteristics under operation condition with the accelerated lifetime data obtained under accelerated stress. In this paper we propose estimation method with accelerated lifetime data using quantile regression. We apply the method to real data with Arrhenius and Inverse power model.

• Journal of Korean Society of Steel Construction
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• v.14 no.2
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• pp.365-373
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• 2002

In this paper, the system reliability concept was presented to predict the lifespan of bridges. Lifetime distribution functions (survivor functions) were used to model real bridges to predict their remaining life. Using the system reliability concept and lifetime distribution functions (survivor functions), a program called LIFETIME was developed. The survivor functions give the reliability of component at time t. The program was applied to an existing Colorado state highway bridge to predict the failure probability of the time-dependent system. The bridge was modeled as a system, with failure probability computed using time-dependent deteriorating models.

• The Transactions of the Korean Institute of Power Electronics
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• v.27 no.4
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• pp.291-296
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• 2022

Capacitor is one of the reliability-critical components in power converters. The lifetime of the capacitor decreases as the operating temperature increases, and power losses caused by capacitor current are the main cause of the capacitor temperature increase. Therefore, various studies are being conducted to improve the lifetime of the capacitor by reducing the current of DC-link capacitors. In this study, pulse width modulation methods proposed for improving the lifetime of DC-link capacitors of the three-level NPC inverter are comparatively analyzed. The lifetime evaluation of the DC-link capacitor under different modulation methods is performed at component level first and then system level by considering all capacitors by applying Monte Carlo simulation. Furthermore, their effects on the efficiency and THD of the output current are also considered.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2009.10a
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• pp.767-768
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• 2009

• Asian-Australasian Journal of Animal Sciences
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• v.20 no.5
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• pp.661-668
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• 2007

Data on 1,037 Nili-Ravi buffaloes from four institutional herds were used to study lifetime milk yield, herd life, productive life and breeding efficiency. A general linear model was used to study the environmental effects while an animal model having herd, year of birth and age at first calving (as covariate) along with random animal effect was used to estimate breeding values. The lifetime milk yield, herd life, productive life and breeding efficiency averaged $7,723{\pm}164$ kg, $3,990{\pm}41$ days, $1,061{\pm}19$ days and 64 percent, respectively. All the traits were significantly (p<0.01) affected by the year of birth and herd of calving, while the herd life was also affected (p<0.01) by the age at first calving. The heritabilities for lifetime milk yield, herd life, productive life and breeding efficiency were $0.093{\pm}0.056$, $0.001{\pm}0.055$, $0.144{\pm}0.079$ and 0.001, respectively. The definition for productive life, where each lactation gets credit upto 10 months had slightly better heritability and may be preferred over the definition where no limit is placed on lactation length. The genetic correlation between productive life and lifetime milk yield was low but high between productive life and herd life. The selection for productive life will increase herd life while lifetime milk yield will also improve. The overall phenotypic trend during the period under the study was negative for lifetime milk yield (-280 kg/year), herd life (-93 days), productive life (-42 days/year) and breeding efficiency (-0.36 percent/year), whereas the genetic trend was positive for lifetime milk yield (+15 kg/year) and productive life (+4 days/year).

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.7
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• pp.21-29
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• 2004

Hot carrier degradation characteristics of Nano-scale CMOSFETs with dual gate oxide have been analyzed in depth. It is shown that, PMOSFET lifetime dominate the device lifetime than NMOSFET In Nano-scale CMOSFETs, that is, PMOSFET lifetime under CHC (Channel Hot Carrier) stress is much lower than NMOSFET lifetime under DAHC (Dram Avalanche Hot Carrier) stress. (In case of thin MOSFET, CHC stress showed severe degradation than DAHC for PMOSFET and DAHC than CHC for NMOSFET as well known.) Therefore, the interface trap generation due to enhanced hot hole injection will become a dominant degradation factor in upcoming Nano-scale CMOSFET technology. In case of PMOSFETs, CHC shows enhanced degradation than DAHC regardless of thin and thick PMOSFETs. However, what is important is that hot hole injection rather than hot electron injection play a important role in PMOSFET degradation i.e. threshold voltage increases and saturation drain current decreases due to the hot carrier stresses for both thin and thick PMOSFET. In case of thick MOSFET, the degradation by hot carrier is confirmed using charge pumping current method. Therefore, suppression of PMOSFET hot carrier degradation or hot hole injection is highly necessary to enhance overall device lifetime or circuit lifetime in Nano-scale CMOSFET technology

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2008.05a
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• pp.465-468
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• 2008

Clustering techniques in wireless sensor networks is developed to minimize the energy consumption of node, show the effect that increases the network lifetime. Existing clustering techniques proposed the method that increases the network lifetime equalizing each node's the energy consumption by rotating the role of CH(Cluster Head), but these algorithm did not present the resolution that minimizes the energy consumption of neighboring nodes with sink. In this paper, we propose the clustering algorithm that prolongs the network lifetime by not including a part of nodes in POS(Personal Operating Space) of the sink in a cluster and communicating with sink directly to reduce the energy consumption of CH closed to sink.