• Title/Summary/Keyword: Life Time Distribution Function

Search Result 102, Processing Time 0.023 seconds

Testing unknown age classes of life distributions based on TTT-transform

  • El-Din, M.M. Mohie;Abu-Youssef, S.E.;Ali, Nahed S.A.
    • International Journal of Reliability and Applications
    • /
    • v.14 no.1
    • /
    • pp.1-9
    • /
    • 2013
  • A nonparametric procedure for testing exponentially against used better than aged in expectation (UBAE) class of life distributions is presented. We construct a test statistics based on scaled total time on test (TTT)-transformation, to test exponentiality against UBAE class of life distributions. The distribution of the statistic is investigated via simulation. Practical applications of the proposed test are presented.

  • PDF

Estimation for the Rayleigh distribution based on Type I hybrid censored sample

  • Kwon, Byongwon;Lee, Kyeongjun;Cho, Youngseuk
    • Journal of the Korean Data and Information Science Society
    • /
    • v.25 no.2
    • /
    • pp.431-438
    • /
    • 2014
  • Type I hybrid censoring scheme is the combination of the Type I and Type II censoring scheme introduced by Epstein (1954). Epstein considered a hybrid censoring sampling scheme in which the life testing experiment is terminated at a random time $T^*$ which is the time that happens rst among the following two; time of the kth unit is observed or time of the experiment length set in advance. The likelihood function of this scheme from the Rayleigh distribution cannot be solved in a explicit solution and thus we approximate the function by the Taylor series expansion. In this process, we propose four dierent methods of expansion skill.

A Study on the Service life of the Building Components in the Apartment Housing (공동주택 구성재의 내용년수 산정방법에 관한 연구)

  • Lee Kang-Hee;Chang Jung-Hee;Chae Chang-U
    • Journal of the Korean housing association
    • /
    • v.16 no.5
    • /
    • pp.67-74
    • /
    • 2005
  • The performance of building should be deteriorated with time while the building would maintain and manage the function and performance to get a living condition. For the efficient maintenance of the building, the repair cycle would be provided and applied during the service-life time. The service-life time of the building components would be needed to determine the repair time and the repair scope. The service-life time of the building components would be calculated with the 1st repair time and the recovery rate of the performance, considering the recovery rate after repaired. In this paper, the 1st repair time would be estimated with the normal probability distribution, choice probability and 3rd quadratic function. The recovery rate of the building components assumes various level according to the research target and utility area. The results of this study are as follows ; first, most of the components of the building work would range about 30 years in the service-life time and the components of the mechanical works range from 28 years to 37 years, those of the electrical works would be about 31 years.

Analysis the Reliability of Multilayer Ceramic Capacitor with inner Ni Electrode under highly Accelerated Life Test Conditions

  • Yoon, Jung-Rag;Lee, Kyung-Min;Lee, Serk-Won
    • Transactions on Electrical and Electronic Materials
    • /
    • v.10 no.1
    • /
    • pp.5-8
    • /
    • 2009
  • The reliability of multilayer ceramic capacitor with active thin dielectric layer was investigated by highly accelerated life test at various stress condition. The distribution of multilayer ceramic capacitor failure times is plotted as a function of time from Weibull distribution function. According to the test result, voltage acceleration factor is obtained from 2.24 to 2.96. The acceleration by temperature is much higher than other values of active thick dielectric layer. It is clear that median time to failure is affected by the stress voltage for high volumetric efficiency ceramic capacitors with active thin dielectric layer. The degradation under stress of voltage involves electromigration and accumulation of oxygen vacancy at Ni electrode interface of cathode.

The Step Stress Life Testing for the Parallel System with Censored Data (절단된 자료가 있는 병렬형 시스템의 단계적 충격수명검사)

  • Park, Hee-Chang;Lee, Suk-Hoon
    • Journal of Korean Society for Quality Management
    • /
    • v.23 no.1
    • /
    • pp.15-28
    • /
    • 1995
  • We consider a step-stress life testing which is devised for a two-component parallel system with considerably long life time. To describe such a system, we use an exponential distribution as the survival function. The lift distribution is assumed between the log mean life time and the stress with the cumulative exposure model. The criterion for optimality is to minimize the sum of the variances of the maximum likelihood estimators of the mean life times of each part under the normal stress.

  • PDF

Stochastic Properties of Life Distribution with Increasing Tail Failure Rate and Nonparametric Testing Procedure

  • Lim, Jae-Hak;Park, Dong Ho
    • Journal of Applied Reliability
    • /
    • v.18 no.3
    • /
    • pp.220-228
    • /
    • 2018
  • Purpose: The purpose of this study is to investigate the tail behavior of the life distribution which exhibits an increasing failure rate or other positive aging effects after a certain time point. Methods: We characterize the tail behavior of the life distribution with regard to certain reliability measures such as failure rate, mean residual life and reliability function and derive several stochastic properties regarding such life distributions. Also, utilizing an L-statistic and its asymptotic normality, we propose new nonparametric testing procedures which verify if the life distribution has an increasing tail failure rate. Results: We propose the IFR-Tail (Increasing Failure Rate in Tail), DMRL-Tail (Decreasing Mean Residual Life in Tail) and NBU-Tail (New Better than Used in Tail) classes, all of which represent the tail behavior of the life distribution. And we discuss some stochastic properties of these proposed classes. Also, we develop a new nonparametric test procedure for detecting the IFR-Tail class and discuss its relative efficiency to explore the power of the test. Conclusion: The results of our research could be utilized in the study of wide range of applications including the maintenance and warranty policy of the second-hand system.

PWF-GPH method for the statistical analysis of failure time data (고장시간 자료의 통계적 분석을 위한 PWF-GPH 방법)

  • 김선영;윤복식
    • Journal of the military operations research society of Korea
    • /
    • v.22 no.1
    • /
    • pp.114-128
    • /
    • 1996
  • In this paper, a life distribution fitting method based on generalized phase-type distributions(GPH) is presented. By fitting the life distribution to a GPH, we can utilize various useful properties of the GPH. Two different approaches are used according to the properties of the given failure time data. One is an approximation to a GPH through the piecewise Weibull failure rate(PWF) model and the other is a direct approximation to a GPH using the empirical distribution function. Two numerical examples are also presented. In the first example, both of the two approaches are utilized and compared for an incomplete data set. And in the second example, the direct approximation method from an empirical distribution is utilized for the analysis of a complete data set. In both cases, we could confirm the validity of the proposed method.

  • PDF

Optimal step stress accelerated life tests for the exponential distribution under periodic inspection and type I censoring

  • Moon, Gyoung-Ae;Park, Yong-Kil
    • Journal of the Korean Data and Information Science Society
    • /
    • v.20 no.6
    • /
    • pp.1169-1175
    • /
    • 2009
  • In this paper, the inferences of data obtained from periodic inspection and type I censoring for the step-stress accelerated life test are studied. The exponential distribution with a failure rate function that a log-linear function of stress and the tampered failure rate model are considered. The maximum likelihood estimators of the model parameters are estimated and also the optimal stress change time which minimize the asymptotic variance of maximum likelihood estimators of parameters is determined. A numerical example will be given to illustrate the proposed inferential procedures and the sensitivity of the asymptotic variance of the estimated mean by the guessed parameters is investigated.

  • PDF

A Study on the Software Reliability Model Analysis Following Exponential Type Life Distribution (지수 형 수명분포를 따르는 소프트웨어 신뢰모형 분석에 관한 연구)

  • Kim, Hee Cheul;Moon, Song Chul
    • Journal of Information Technology Applications and Management
    • /
    • v.28 no.4
    • /
    • pp.13-20
    • /
    • 2021
  • In this paper, I was applied the life distribution following linear failure rate distribution, Lindley distribution and Burr-Hatke exponential distribution extensively used in the arena of software reliability and were associated the reliability possessions of the software using the nonhomogeneous Poisson process with finite failure. Furthermore, the average value functions of the life distribution are non-increasing form. Case of the linear failure rate distribution (exponential distribution) than other models, the smaller the estimated value estimation error in comparison with the true value. In terms of accuracy, since Burr-Hatke exponential distribution and exponential distribution model in the linear failure rate distribution have small mean square error values, Burr-Hatke exponential distribution and exponential distribution models were stared as the well-organized model. Also, the linear failure rate distribution (exponential distribution) and Burr-Hatke exponential distribution model, which can be viewed as an effectual model in terms of goodness-of-fit because the larger assessed value of the coefficient of determination than other models. Through this study, software workers can use the design of mean square error, mean value function as a elementary recommendation for discovering software failures.

A Vtub-Shaped Hazard Rate Function with Applications to System Safety

  • Pham, Hoang
    • International Journal of Reliability and Applications
    • /
    • v.3 no.1
    • /
    • pp.1-16
    • /
    • 2002
  • In reliability engineering, the bathtub-shaped hazard rates play an important role in survival analysis and many other applications as well. For the bathtub-shaped, initially the hazard rate decreases from a relatively high value due to manufacturing defects or infant mortality to a relatively stable middle useful life value and then slowly increases with the onset of old age or wear out. In this paper, we present a new two-parameter lifetime distribution function, called the Loglog distribution, with Vtub-shaped hazard rate function. We illustrate the usefulness of the new Vtub-shaped hazard rate function by evaluating the reliability of several helicopter parts based on the data obtained in the maintenance malfunction information reporting system database collected from October 1995 to September 1999. We develop the S-Plus add-in software tool, called Reliability and Safety Assessment (RSA), to calculate reliability measures include mean time to failure, mean residual function, and confidence Intervals of the two helicopter critical parts. We use the mean squared error to compare relative goodness of fit test of the distribution models include normal, lognormal, and Weibull within the two data sets. This research indicates that the result of the new Vtub-shaped hazard rate function is worth the extra function-complexity for a better relative fit. More application in broader validation of this conclusion is needed using other data sets for reliability modeling in a general industrial setting.

  • PDF