• Title/Summary/Keyword: LTPS

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A p-channel LTPS active matrix process for OLED displays using a compensation circuit with three TFTs

  • Persidis, Efstathios;Baur, Holger;Pieralisi, Fabio;Fruehauf, Norbert;Marx, Thilo;Weitbruch, Sebastien;Schemmann, Heinrich;Roy, Philippe Le;Birnstock, Jan;Stubinger, Thomas;Vehse, Martin;Hofmann, Michael
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.403-408
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    • 2006
  • We have developed a four mask LTPS TFT p-channel process and fabricated active matrix backplanes based on a pixel circuit with three TFTs and one storage capacitor. Top emitting AMOLED displays have been produced to prove the working principle of the active matrix.

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A Low-Power and High-Accuracy Driving Method for LTPS TFT-LCD in Mobile Applications

  • Kim, Han-Jun;Jung, Jae-Yoon;Choi, Jung-Hwan;Lee, In-Hwan;Kwon, Oh-Kyong
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.409-412
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    • 2006
  • A high data accuracy and low power consumption driving method and output stage of the source driver are proposed for the LTPS TFT-LCD in mobile applications. The proposed driving method is insensitive to the variations of the electrical characteristics of TFTs, which enables the output errors of the source driver are under 1/2 LSB in all gray levels. In addition, the power consumption of the driver with the method is decreased to 9.9mW which is 55.9% of that of the conventional source driver by reducing unnecessary charge waste.

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Enhanced LTPS Manufacturing Equipment employing Excimer Laser Crystallization

  • Herbst, Ludolf;Simon, Frank;Rebhan, Ulrich;Geuking, Thorsten;Klaft, Ingo;Fechner, Burkhard
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.1123-1126
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    • 2005
  • For creation of low temperature polycrystallinesilicon (LTPS) the line beam excimer laser annealing (ELA) is a well known and established technique in mass production. With introduction of Sequential Lateral Solidification (SLS) some aspects such as crystalline quality, throughput and flexibility regarding the substrate size could be improved, but for OLED manufacturing still further process development is necessary. This paper discusses line beam ELA and SLS techniques that might enable process engineers to make polycrystalline-silicon (poly-Si) films with a high degree of uniformity and quality as required for system on glass (SOG) and active matrix organic light emitting displays (AMOLED). Equipment requirements are discussed and compared to previous standards. SEM images of process examples are shown in order to demonstrate the viability.

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Dependence of Stress-Induced Leakage Current on Low Temperature Polycrystalline Silicon TFTs

  • Chen, Chih-Chiang;Chang, Jiun-Jye;Chuang, Ching-Sang;Wu, Yung-Fu;Sheu, Chai-Yuan
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.622-625
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    • 2003
  • The dependence of stress-induced leakage current on LTPS TFTs was characterized in this study. The impacts of poly-Si crystallization, gate insulator, impurity activation, hydrogenation process and electrostatic discharge damage were investigated. It was observed more TFTs instable characteristic under those process-assisted processes. According to the LTPS roadmap, smaller geometric and low temperature process were the future trend and the stress-induced leakage current should be worthy of remark.

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multi-stack gate dielectric 구조를 통한 LTPS TFT 특성

  • Baek, Gyeong-Hyeon;Jeong, Seong-Uk;Jang, Gyeong-Su;Park, Hyeong-Sik;Lee, Won-Baek;Yu, Gyeong-Yeol;Lee, Jun-Sin
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.200-200
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    • 2010
  • 이 논문에서는 field-effect mobility를 향상시키기 위해 triple-layer (SiNx/SiO2/SiOxNy stack 구조)를 gate dielectric material 로 LTPS TFTs에 적용하였다. 이는 플라즈마 처리 기법과 적층구조의 효과적인 in-situ 공정을 이용하여 interface trap과 mobile charge를 낮추어 높은 이동도의 결과를 생각하고 실험하였다. 실험은 SiO2 gatedielectric과 triple-gate dielectric의 C-V curve를 1 MHz의 주파수에서 측정하였다. 또한 Transfer characteristics를 single SiO2 gatedielectric과 triple-gate dielectric of SiNx/SiO2/SiOxNy를 STA 장비를 이용해 측정하였다. 위의 측정을 통해 threshold voltage, mobility, subtheshold swing, driving current, ON/OFF current ratio를 비교 분석하였다.

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Dopant activation by using CW laser for LTPS processing

  • Kim, Ki-Hyung;Kim, Eun-Hyun;Ku, Yu-Mi;Park, Seong-Jin;Uchiike, Heiju;Kim, Chae-Ok;Jang, Jin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07a
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    • pp.310-313
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    • 2005
  • CW laser dopant activation (CLDA) is suggested as an alternative to conventional thermal annealing. The sheet resistance of the ion doped poly-Si after CLDA is sufficiently low compared to the value measured after thermal annealing. The surface damage due to ion doping on the poly-Si can be recovered while CW laser scan for dopant activation. Therefore, the CLDA can be applied to LTPS processing.

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2.8 inch QVGA System On Panel LCD Employing Advanced CMOS LTPS Technology

  • Yoon, Ji-Mo;Yoo, Juhn-S.;Yu, J.S.;Kim, E.;Son, C.Y.;Park, J.K.;Yoo, Y.S.;Lim, K.M.;Kim, C.D.;Chung, I.J.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07a
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    • pp.285-288
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    • 2005
  • A 2.8 inch fully integrated SOP employing a high performance LTPS CMOS TFT technology has been developed for mobile display applications. The LCD module is directly interfaced with 3V 6-bit RGB source via timing control circuitry. The integrated data driver comprises a 6-bit hybrid type DAC with low power analog buffer.

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PI 기판 위에서의 dLTA 공정을 이용한 Grain Boundary와 Grain Size 특성 분석

  • Kim, Sang-Seop;Lee, Jun-Gi;Kim, Gwang-Ryeol;Choe, Byeong-Deok
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.08a
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    • pp.338-338
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    • 2011
  • 최근 FPD (Flat Pannel Display) 시장이 커짐에 따라 고효율, 저비용 제작 공정이 화두로 떠오르고 있다. ELA (Excimer Laser Annenling)을 이용한 LTPS (Low Temperature Poly Silicon) 공정은 mobility와 전류 점멸비 등에서 장점을 가지지만, 고비용, 대면적과 short-range에서 uniformity가 어렵다는 단점이 있다. 이를 극복하기 위한 방법으로 dLTA (diode Laser Thermal Annealing) 공정에 대한 연구가 진행되고 있다. 본 연구에서는 Flexible Display을 만들기 위한 방법으로 dLTA 공정을 진행하였다. 이 방법은 PI (Poly imide) 기판 위에 a-Si을 ICP CVD로 증착시킨 후, Diode Laser (980 nm)를 이용한 annealing을 통하여 a-Si이 poly-Si으로 결정화가 되는 것을 확인하였고, 에너지 조사량에 따른 grain boundary와 grain size을 통하여 비교 분석하였다. 실험 결과 ELA 공정을 이용한 것과 버금가는 실험 결과를 얻을 수 있었다.

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Illumination Assisted Negative Bias Temperature Instability Degradation in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

  • Lin, Chia-Sheng;Chen, Ying-Chung;Chang, Ting-Chang;Hsu, Wei-Che;Chen, Shih-Ching;Li, Hung-Wei
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.550-552
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    • 2009
  • The negative bias temperature instability on LTPS TFTs in a darkened and an illuminated environment was investigated. Experimental results reveal that the generation of interface state density showed no change between the different NBTI stresses. The degradation of the grain boundary trap under illumination was more significant than for the darkened environment.

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Excimer Laser-induced Crystallization of Si Films for Manufacturing LTPS TFT-based Displays

  • Chung, U.J.;Limanov, A.B.;Wilt, P.C. Van Der;Chitu, A.M.;Im, James S.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.7-7
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    • 2007
  • Laser-irradiation-induced crystallization of as-deposited amorphous precursor films constitutes an integral step in fabricating LTPS TFTs. Consideration of various factors leads one to conclude that, for display manufacturers, choosing how to crystallize the films can be identified as being tactically and strategically significant. This paper will begin by reviewing the fundamental aspects of laser crystallization, and then present noteworthy advances and progress, which have recently been accomplished in the field. In particular, we will focus on communicating the evolving status associated with the sequential lateral solidification (SLS) method, which can be presently identified as the most strategically enabling crystallization method.

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