• Journal of the Korean Data and Information Science Society
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• v.8 no.2
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• pp.261-270
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• 1997

This paper is proposed the parametric empirical Bayes(EB) confidence intervals which corrects the deficiencies in the naive EB confidence intervals of the scale parameter in the Weibull distribution under item-censoring scheme. In this case, the bootstrap EB confidence intervals are obtained by the parametric bootstrap introduced by Laird and Louis(1987). The comparisons among the bootstrap and the naive EB confidence intervals through Monte Carlo study are also presented.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.36 no.3
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• pp.1-7
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• 2013

This paper is a case study of reliability assessment with field warranty data of Clutch Master Cylinder (CMC) in hydraulic clutch system. We estimate lifetime distribution using field warranty data which contain much useful information for understanding reliability of the system in the real-world environments. However, the estimated parameters are far from existing reference values, which seems to be caused right censored field warranty data. To modify the parameters, we use the information of the durability test which is performed to verify that the lifetime of the item meets the required level. After that, we can observe that the modified parameters are closer to the existing reference values. This case study shows a possible idea to supplement lack of right censored field warranty data and its applicability.

• Journal of Korean Institute of Industrial Engineers
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• v.28 no.4
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• pp.368-378
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• 2002

As more companies are equipped with data aquisition systems for their products, huge amount of field warranty data has been accumulated. We focus on the case when the field data for a given product comprise with the number of sales and the number of the first failures for each period. The number of censored items and their ages are assumed to be given. This type of data are incomplete in the sense that the age of a failed item is unknown. We construct a model for this type of data and propose an algorithm for nonparametric maximum likelihood estimation of the product reliability. Unlike the nonhomogeneous Poisson process(NHPP) model, our method can handle the data with censored items as well as those with small population. A few examples are investigated to characterize our model, and a real field warranty data set is analyzed by the method.

• Journal of the Korean Data and Information Science Society
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• v.4
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• pp.65-74
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• 1993

Suppose that we have two populations(or systems), say ${\Pi}_{1}\;and\;{\Pi}_{2}$, to be tested. A random sample of size n from each population is taken and the test for each system will be terminated when the first r failures among n random samples are observed. This kind of test is caned the type-II censored (or item-censored) testing without replacement. Under this scheme we consider the problem of estimating the unknown parameters of interests and the reliability for a given time t for each population.

• Journal of Advanced Marine Engineering and Technology
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• v.40 no.2
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• pp.131-137
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• 2016

In reliability analysis, it is quite common for the failure of any individual or item to be attributable to more than one cause. Moreover, observed data are often censored. Recently, progressive hybrid censoring schemes have become quite popular in life-testing problems and reliability analysis. However, a limitation of the progressive hybrid censoring scheme is that it cannot be applied when few failures occur before time T. Therefore, generalized progressive hybrid censoring schemes have been introduced. In this article, we derive the likelihood inference of the unknown parameters under the assumptions that the lifetime distributions of different causes are independent and exponentially distributed. We obtain the maximum likelihood estimators of the unknown parameters in exact forms. Asymptotic confidence intervals are also proposed. Bayes estimates and credible intervals of the unknown parameters are obtained under the assumption of gamma priors on the unknown parameters. Different methods are compared using Monte Carlo simulations. One real data set is analyzed for illustrative purposes.

• Journal of Korean Society for Quality Management
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• v.25 no.3
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• pp.11-21
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• 1997

The mean residual life(MRL) function gives the expected remaining life of a item at age t. In particular F is said to be an increasing intially then decreasing MRL(IDMRL) distribution if there exists a turing point $t^*\ge0$ such that m(s)$\le$ m(t) for 0$$\le s$\le$ t $t^*$, m(s)$\ge$ m(t) for $t^*\le$ s$\le$ t. If the preceding inequality is reversed, F is said to be a decreasing initially then increasing MRL(DIMRL) distribution. Hawkins, et al.(1992) proposed test of H0 : F is exponential versus$H_1$: F is IDMRL, and $H_0$ versus $H_1$' : F is DIMRL when turning point is unknown. Their test is based on a complete random sample $X_1$, …, $X_n$ from F. In this paper, we generalized Hawkins-Kochar-Loader test to random censored data.

• Journal of Korean Society for Quality Management
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• v.22 no.3
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• pp.99-110
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• 1994

The strength-stress model has been widely used in a variety of areas including testing the reliability of the item or design procedures. This model was first introduced in 1950's and can be found on various applications in civil, aerospace engineering etc. This paper considers the strength-stress model in detail and proposes an estimator which deals with the reliability estimation problem based on censored observations in the strength variables.

• Journal of the Korean Data and Information Science Society
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• v.8 no.2
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• pp.183-194
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• 1997

In accelerated life tests, the failure time of an item is observed under a high stress level and based on the time, the failure rates of items we estimated at the normal stress level. In this paper, when the mean of the prior distribution of a parameter is known in Weibull lifetime model with censored failure time data, we study various estimating methods to obtain the empirical Bayes estimator of a parameter from the empirical Bayes approach under the normal stress level by considering the fact that the Bayes estimator is the function of prior parameters and of the acceleration parameter representing the effect of acceleration. And we compare the performance of several empirical Bayes estimators of a parameter in terms of the Bayes risk.

• Journal of the Korean Data and Information Science Society
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• v.8 no.1
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• pp.21-30
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• 1997

In accelerated life tests, the failure time of an item is observed under a high stress level, and based on the time the performances of items are investigated at the normal stress level. In this paper, when the mean of the prior of a failure rate is known in the exponential lifetime distribution with censored accelerated failure time data, we utilize the empirical Bayesian method by using the moment estimators in order to estimate the parameters of the prior distribution and obtain the empirical Bayesian predictive density and predictive intervals for a future observation under the normal stress level.

• International Journal of Reliability and Applications
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• v.13 no.1
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• pp.19-35
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• 2012

This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.