• Journal of the Korean Data and Information Science Society
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• 제8권2호
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• pp.261-270
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• 1997

This paper is proposed the parametric empirical Bayes(EB) confidence intervals which corrects the deficiencies in the naive EB confidence intervals of the scale parameter in the Weibull distribution under item-censoring scheme. In this case, the bootstrap EB confidence intervals are obtained by the parametric bootstrap introduced by Laird and Louis(1987). The comparisons among the bootstrap and the naive EB confidence intervals through Monte Carlo study are also presented.

• 산업경영시스템학회지
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• 제36권3호
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• pp.1-7
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• 2013

This paper is a case study of reliability assessment with field warranty data of Clutch Master Cylinder (CMC) in hydraulic clutch system. We estimate lifetime distribution using field warranty data which contain much useful information for understanding reliability of the system in the real-world environments. However, the estimated parameters are far from existing reference values, which seems to be caused right censored field warranty data. To modify the parameters, we use the information of the durability test which is performed to verify that the lifetime of the item meets the required level. After that, we can observe that the modified parameters are closer to the existing reference values. This case study shows a possible idea to supplement lack of right censored field warranty data and its applicability.

• 대한산업공학회지
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• 제28권4호
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• pp.368-378
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• 2002

As more companies are equipped with data aquisition systems for their products, huge amount of field warranty data has been accumulated. We focus on the case when the field data for a given product comprise with the number of sales and the number of the first failures for each period. The number of censored items and their ages are assumed to be given. This type of data are incomplete in the sense that the age of a failed item is unknown. We construct a model for this type of data and propose an algorithm for nonparametric maximum likelihood estimation of the product reliability. Unlike the nonhomogeneous Poisson process(NHPP) model, our method can handle the data with censored items as well as those with small population. A few examples are investigated to characterize our model, and a real field warranty data set is analyzed by the method.

• Journal of the Korean Data and Information Science Society
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• 제4권
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• pp.65-74
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• 1993

Suppose that we have two populations(or systems), say ${\Pi}_{1}\;and\;{\Pi}_{2}$, to be tested. A random sample of size n from each population is taken and the test for each system will be terminated when the first r failures among n random samples are observed. This kind of test is caned the type-II censored (or item-censored) testing without replacement. Under this scheme we consider the problem of estimating the unknown parameters of interests and the reliability for a given time t for each population.

• Journal of Advanced Marine Engineering and Technology
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• 제40권2호
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• pp.131-137
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• 2016

In reliability analysis, it is quite common for the failure of any individual or item to be attributable to more than one cause. Moreover, observed data are often censored. Recently, progressive hybrid censoring schemes have become quite popular in life-testing problems and reliability analysis. However, a limitation of the progressive hybrid censoring scheme is that it cannot be applied when few failures occur before time T. Therefore, generalized progressive hybrid censoring schemes have been introduced. In this article, we derive the likelihood inference of the unknown parameters under the assumptions that the lifetime distributions of different causes are independent and exponentially distributed. We obtain the maximum likelihood estimators of the unknown parameters in exact forms. Asymptotic confidence intervals are also proposed. Bayes estimates and credible intervals of the unknown parameters are obtained under the assumption of gamma priors on the unknown parameters. Different methods are compared using Monte Carlo simulations. One real data set is analyzed for illustrative purposes.

• 품질경영학회지
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• 제25권3호
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• pp.11-21
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• 1997

The mean residual life(MRL) function gives the expected remaining life of a item at age t. In particular F is said to be an increasing intially then decreasing MRL(IDMRL) distribution if there exists a turing point $t^*\ge0$ such that m(s)$\le$ m(t) for 0$$\le s$\le$ t $t^*$, m(s)$\ge$ m(t) for $t^*\le$ s$\le$ t. If the preceding inequality is reversed, F is said to be a decreasing initially then increasing MRL(DIMRL) distribution. Hawkins, et al.(1992) proposed test of H0 : F is exponential versus$H_1$: F is IDMRL, and $H_0$ versus $H_1$' : F is DIMRL when turning point is unknown. Their test is based on a complete random sample $X_1$, …, $X_n$ from F. In this paper, we generalized Hawkins-Kochar-Loader test to random censored data.

• 품질경영학회지
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• 제22권3호
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• pp.99-110
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• 1994

The strength-stress model has been widely used in a variety of areas including testing the reliability of the item or design procedures. This model was first introduced in 1950's and can be found on various applications in civil, aerospace engineering etc. This paper considers the strength-stress model in detail and proposes an estimator which deals with the reliability estimation problem based on censored observations in the strength variables.

• Journal of the Korean Data and Information Science Society
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• 제8권2호
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• pp.183-194
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• 1997

이 논문의 목적은 제2종 중도절단자료된 가속수명 자료가 형상모수를 고정시킨 와이블분포를 한다는 가정에서 데이터에 대한 경험적베이즈 방법을 이용하여 분석하는데 있다. 이 논문에서는 적률추정법과 최우추정법을 이용한 경험적 베이지안 방법을 제안하고, Pathak등에 의해 제안된 경험적베이지안 방법과 비교한다. 특히, 인위적 자료를 이용한 모의 실험을 통하여 추정량들을 추정된 베이즈위험측면에서 비교한다.

• Journal of the Korean Data and Information Science Society
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• 제8권1호
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• pp.21-30
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• 1997

가속수명시험에서 강한충격수준에서 부품들의 고장시간이 관측되고 가속화된 고장시간을 토대로 정상충격수준에서 부품들의 성능을 조사한다. 본 논문은 지수수명분포에서 중도절단된 가속수명자료를 이용하여 고장률의 사전분포의 평균을 알 때, 정상조건하에서 하나의 미래 관찰치의 예측문제를 사전분포의 모수에 대하여 적률추정량을 이용하는 경험적 베이즈 접근방법을 적용시켜 경험적 베이즈 예측분포와 예측구간에 대하여 연구하였다.

• International Journal of Reliability and Applications
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• 제13권1호
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• pp.19-35
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• 2012

This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.