• Title/Summary/Keyword: InGaAlAs quantum dots

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Growth features and nucleation mechanism of Ga1-x-yInxAlyN material system on GaN substrate

  • Simonyan, Arpine K.;Gambaryan, Karen M.;Aroutiounian, Vladimir M.
    • Advances in nano research
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    • v.5 no.4
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    • pp.303-311
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    • 2017
  • The continuum elasticity model is applied to investigate quantitatively the growth features and nucleation mechanism of quantum dots, nanopits, and joint QDs-nanopits structures in GaInAlN quasyternary systems. We have shown that for GaInAlN material system at the critical strain of ${\varepsilon}^*=0.039$ the sign of critical energy and volume is changed. We assume that at ${\varepsilon}={\varepsilon}^*$ the mechanism of the nucleation is changed from the growth of quantum dots to the nucleation of nanopits. Obviously, at small misfit (${\varepsilon}$ < ${\varepsilon}^*$), the bulk nucleation mechanism dominates. However, at ${\varepsilon}$ > ${\varepsilon}^*$, when the energy barrier becomes negative as well as a larger misfit provides a low-barrier path for the formation of dislocations, the nucleation of pits becomes energetically preferable. The free energy of mixing for $Ga_{1-x-y}In_xAl_yN$ quasiternary system was calculated and studied and its 3D sketch was plotted.

Structural and Optical Characteristics of InAs/InAlGaAs Quantum Dots Grown on InP/InGaAs/InP Distributed Feedback Grating Structure (InP/InGaAs/InP 분포귀환형 회절격자 위에 성장된 InAs/InAlGaAs 양자점의 구조적.광학적 특성)

  • Kwack, H.S.;Kim, J.S.;Lee, J.H.;Hong, S.U.;Choi, B.S.;Oh, D.K.;Cho, Y.H.
    • Journal of the Korean Vacuum Society
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    • v.15 no.3
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    • pp.294-300
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    • 2006
  • We fabricated the distributed feedback (DFB) InP/InGaAs/InP grating structures on InP (100) substrates by metal-organic chemical vapor deposition, and their structural properties were investigated by atomic force microscopy and scanning electron microscopy. Self-assembled InAs/InAlGaAs quantum dots (QDs) were grown on the InP/InGaAs/InP grating structures by molecular beam epitaxy, and their optical properties were compared with InAs/InAlGaAs QDs without grating structure. The duty of the grating structures was about 30%. The PL peak position of InAs/InAlGaAs QDs grown on the grating structure was 1605 nm, which was red-shifted by 18 nm from that of the InAs/InAlGaAs QDs without grating structure. This indicates that the formation of InAs/InAlGaAs QDs was affected by the existence of the DFB grating structures.

Design and Growth of InAs Multi-Quantum Dots and InGaAs Multi-Quantum Wells for Tandem Solar Cell (텐덤형 태양전지를 위한 InAs 다중 양자점과 InGaAs 다중 양자우물에 관한 연구)

  • Cho, Joong-Seok;Kim, Sang-Hyo;HwangBoe, Sue-Jeong;Janng, Jae-Ho;Choi, Hyon-Kwang;Jeon, Min-Hyon
    • Journal of the Korean Vacuum Society
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    • v.18 no.5
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    • pp.352-357
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    • 2009
  • The InAs multi-quantum dots (MQDs) solar cell and InGaAs multi-quantum wells (MQWs) solar cell to cover 1.1 eV and 1.3 eV were designed by 1D poisson, respectively. The MQDs and MQWs of 5, 10, 15 layers were grown by molecular beam epitaxy. The photo luminescence results showed that the 5 period stacked MQDs have the highest intensity at around 1.1 eV with 57.6 meV full width at half maximum (FWHM). Also we can observe 10 period stacked MQWs peak position which has highest intensity at 1.31 eV with 12.37 meV FWHM. The density and size of QDs were observed by reflection high energy electron diffraction pattern and atomic force microscope. Futhermore, AlGaAs/GaAs sandwiched tunnel junctions were modified according to the width of GaAs layer on p-type GaAs substrates. The structures with GaAs width of 30 nm and 50 nm have backward diode characteristics. In contrast, tunnel diode characteristics were observed in the 20 nm of that of sample.

Time-resolved Photoluminescence Study of Seven-stacked InAs/InAlGaAs Quantum Dots

  • O, Jae-Won;Gwon, Se-Ra;Ryu, Mi-Lee;Jo, Byeong-Gu;Kim, Jin-Su
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.08a
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    • pp.265-265
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    • 2011
  • 자발형성법으로 InP (001) 기판에 성장한 InAs/InAlGaAs 양자점(QDs: quantum dots)의 광학적 특성을 PL (photoluminescence)와 TRPL (time-resolved PL)을 이용하여 분석하였다. InAs QDs 시료는 single layer InAs QDs (QD1)과 7-stacked InAs QDs (QD2)를 사용하였다. 두 시료 모두 저온 (10 K)에서 1,320 nm에서 PL 피크가 나타나고, 온도가 증가함에 따라 PL 피크는 적색편이 (red-shift)를 보였다. 양자점의 온도를 10 K에서 300 K까지 증가하였을 때 QD1은 178 nm 적색편이 하였으며, PL 스펙트럼 폭은 온도가 증가함에 따라 증가하였다. 그러나 QD2는 264 nm 적색편이를 보였으며 PL 스펙트럼의 폭은 QD1 시료와 반대로 온도가 증가함에 따라 감소하였다. QD2의 아주 넓은 PL 스펙트럼 폭과 매우 큰 적색편이는 InAs 양자점 크기의 변화가 QD1에 비해 훨씬 크기 때문이다. QD2의 경우 InAs 층수(layer number)가 증가함에 따라 InAs QD의 크기가 점차 증가하므로 QD 크기의 변화가 single layer인 QD1 시료보다 훨씬 크다. QD1의 PL 소멸은 파장이 증가함에 따라 점차 느려지다가 PL 피크 근처에서 가장 느린 소멸 곡선을 보이고, 파장이 더 증가하였을 때 PL 소멸은 점차 빠르게 소멸하였다. 그러나 QD2의 PL 소멸곡선은 파장이 증가함에 따라 점차 빠르게 소멸하였다. 이것은 QD2는 양자점 크기의 변화가 매우 크기 때문에 (lateral size=18~29 nm, height=2.8~5.9 nm) 방출파장이 증가함에 따라 양자점 사이의 파동함수의 겹침이 증가하여 캐리어의 이완이 증가하기 때문으로 설명된다. 온도에 따른 TRPL 결과는 두 시료 모두 10 K에서 150 K 까지는 소멸시간이 증가하였고, 150 K 이후부터는 소멸시간이 감소하였다. 온도가 증가함에 따라 소멸시간이 증가하는 것은 양자점에서 장벽과 WL (wetting layer)로 운반자(carrier)의 이동, 양자점들 사이에 열에 의해 유도된 운반자의 재분배 등으로 인한 발광 재결합으로 설명할 수 있다. 150 K 이상에서 소멸시간이 감소하는 것은 열적효과에 의한 비발광 재결합 과정에 의한 운반자의 소멸이 증가하기 때문이다. 온도에 따른 TRPL 결과는 두 시료 모두 150 K까지는 발광재결합이 우세하고, 150 K 이상에서 비발광재겹합이 우세하게 나타났다.

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Improved Uniformity of GaAs/AlGaAs DBR Using the Digital Alloy AlGaAs Layer (디지털 합금 AlGaAs층을 이용하여 제작된 GaAs/AlGaAs DBR의 균일도 향상)

  • Cho, N.K.;Song, J.D.;Choi, W.J.;Lee, J.I.;Jeon, Heon-Su
    • Journal of the Korean Vacuum Society
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    • v.15 no.3
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    • pp.280-286
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    • 2006
  • A distributed Bragg reflector (DBR) for the application of $1.3{\mu}m$ vertical cavity surface emitting laser (VCSEL) has grown by digital-alloy AlGaAs layer using the molecular beam epitaxy (MBE) method. The measured reflection spectra of the digital-alloy AlGaAs/GaAs DBR have uniformity in 0.35% over the 1/4 of 3-inch wafer. Furthermore, the TEM image showed that the composition and the thickness of the digital-alloy AlGaAs layer in AlGaAs/GaAs DBR was not affected by the temperature distribution over the wafer whole surface. Therefore, the digital-alloy AlGaAs/GaAs DBR can be used to get higher yield of VCSEL with the active medium of InAs quantum dots whose gain is inhomogeneously broadened.

Electrical Property in InAn/GaAs Quantum Dot Infrared Photodetector with Hydrogen Plasma Treatment (수소화 처리된 InAs/GaAs 양자점 적외선 수광소자의 전기적 특성)

  • Nam H.D.;Song J.D.;Choi W.J.;Cho W.J.;Lee J.I.;Choe J.W.;Yang H.S.
    • Journal of the Korean Vacuum Society
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    • v.15 no.2
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    • pp.216-222
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    • 2006
  • In this paper, we investigated the effect of hydrogen-plasma (H-plasma) treatment on the electrical and optical properties of a quantum dot infrared photodetector (QDIP) with a 5-stacked InAs dots in an InGaAs/GaAs well structure and $Al_{0.3}Ga_{0.7}As/GaAs$ SL (superlattice) current blocking layer. It has been observed that H-plasma treatment didn't affect the band structure of QDIP. It has been also observed that the H-plasma treatment on the QDIP not only enhance the electrical property of QDIP by curing the defect channels in $Al_{0.3}Ga_{0.7}As/GaAs$ SL but also introduce defects in QDIP structure. The H-plasma treatment for 10 min with 20 W of RF power provided the lowest dark current, which made it possible to measure the photo-current (PC) of QDIP whose PC was not detectable without the H-plasma treatment due to the high dark current.

InP 기판에 형성한 InAs/InAlGaAs 양자점의 광학적 특성

  • Lee, Ha-Min;Jo, Byeong-Gu;Choe, Il-Gyu;Park, Dong-U;Lee, Gwan-Jae;Lee, Cheol-Ro;Kim, Jin-Su;Han, Won-Seok;Im, Jae-Yeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.194.2-194.2
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    • 2015
  • 본 논문에서는 InP 기판에 자발형성법 (Self-assembled Mode)으로 성장한 InAs/InAlGaAs 양자점(Quantum Dots)의 외부 열처리 온도에 따른 광학적 특성을 논의한다. 분자선증착기 (Molecular Beam Epitaxy, VH80MBE)로 5주기 적층구조를 갖는 InAs/InAlGaAs 양자점 시료 (기준시료)를 성장 후 온도 의존성 및 여기광세기 의존성 포토루미네슨스 (photoluminescence, PL) 분광법으로 기본특성을 평가하였다. 양자점 시료를 $500{\sim}800^{\circ}C$에서 열처리를 수행하고 광학적 특성을 열처리 전과 비교하여 분석하였다. $550^{\circ}C$에서 열처리한 InAs/InAlGaAs 양자점 시료의 저온 (11K) PL 파장은 1465 nm를 보였으며, 이는 열처리를 하지 않은 기준시료의 1452 nm 보다 13 nm 장파장으로 이동하였다. 열처리 온도가 $700^{\circ}C$ 이상인 경우, 양자점 PL 파장이 다시 단파장으로 이동하는 현상을 보였지만 여전히 열처리하지 않은 기준시료보다 장파장을 나타내었다. $700^{\circ}C$에서 열처리한 양자점 시료의 저온 PL 광세기는 기준시료보다 15.5배 더 크게 나타났으며, 주변 온도가 증가할수록 더디게 감소하는 것을 확인할 수 있었다. 온도의존성 PL로부터 구한 활성화에너지 (Activation Energy)는 $700^{\circ}C$ 열처리 온도의 경우 175.9 meV를 나타내었다. InAs/InAlGaAs 양자점 시료의 열처리 온도에 따른 광특성 변화를 InAs 양자점과 InAlGaAs 장벽층 계면에서 III족 원소인 In, Al 및 Ga의 상호확산과 결함이 완화되는 현상으로 해석할 수 있다.

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Effect of Growth Methods of InAs Quntum Dots on Infrared Photodetector Properties (InAs 양자점 형성 방법이 양자점 적외선 소자 특성에 미치는 효과)

  • Seo, Dong-Bum;Hwang, Je-hwan;Oh, Boram;Noh, Sam Kyu;Kim, Jun Oh;Lee, Sang Jun;Kim, Eui-Tae
    • Korean Journal of Materials Research
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    • v.28 no.11
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    • pp.659-662
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    • 2018
  • We report the properties of infrared photodetectors based on two kinds of quantum dots(QDs): i) 2.0 ML InAs QDs by the Stranski-Krastanov growth mode(SK QDs) and ii) sub-monolayer QDs by $4{\times}[0.3ML/1nm\;In_{0.15}Ga_{0.85}As]$ deposition(SML QDs). The QD infrared photodetector(QDIP) structure of $n^+-n^-(QDs)-n^+$ is epitaxially grown on GaAs (100) wafers using molecular-beam epitaxy. Both the bottom and top contact GaAs layers are Si doped at $2{\times}10^{18}/cm^3$. The QD layers are grown with Si doping of $2{\times}10^{17}/cm^3$ and capped by an $In_{0.15}Ga_{0.85}As$ layer at $495^{\circ}C$. The photoluminescence peak(1.24 eV) of the SML QDIP is blue-shifted with respect to that (1.04 eV) of SK QDIPs, suggesting that the electron ground state of SML QDIP is higher than that of the SK QDIP. As a result, the photoresponse regime(${\sim}9-14{\mu}m$) of the SML QDIP is longer than that (${\sim}6-12{\mu}m$) of the SK QDIP. The dark current of the SML QDIP is two orders of magnitude smaller value than that of the SK QDIP because of the inserted $Al_{0.08}Ga_{0.92}As$ layer.

Atomistic simulation of surface passivated wurtzite nanowires: electronic bandstructure and optical emission

  • Chimalgi, Vinay U.;Nishat, Md Rezaul Karim;Yalavarthi, Krishna K.;Ahmed, Shaikh S.
    • Advances in nano research
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    • v.2 no.3
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    • pp.157-172
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    • 2014
  • The three-dimensional Nano-Electronic Modeling toolkit (NEMO 3-D) is an open source software package that allows the atomistic calculation of single-particle electronic states and optical response of various semiconductor structures including bulk materials, quantum dots, impurities, quantum wires, quantum wells and nanocrystals containing millions of atoms. This paper, first, describes a software module introduced in the NEMO 3-D toolkit for the calculation of electronic bandstructure and interband optical transitions in nanowires having wurtzite crystal symmetry. The energetics (Hamiltonian) of the quantum system under study is described via the tight-binding (TB) formalism (including $sp^3$, $sp^3s^*$ and $sp^3d^5s^*$ models as appropriate). Emphasis has been given in the treatment of surface atoms that, if left unpassivated, can lead to the creation of energy states within the bandgap of the sample. Furthermore, the developed software has been validated via the calculation of: a) modulation of the energy bandgap and the effective masses in [0001] oriented wurtzite nanowires as compared to the experimentally reported values in bulk structures, and b) the localization of wavefunctions and the optical anisotropy in GaN/AlN disk-in-wire nanowires.