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검색결과 185건 처리시간 0.041초

Synthesis and Characterization of Langastie-type Materials

  • An, Jin-Ho;Yoon, Won-Ki;Kynug Joo;Auh, Keun-Ho
    • 한국결정성장학회:학술대회논문집
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    • 한국결정성장학회 1998년도 PROCEEDINGS OF THE 14TH KACG TECHNICAL MEETING AND THE 5TH KOREA-JAPAN EMGS (ELECTRONIC MATERIALS GROWTH SYMPOSIUM)
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    • pp.115-119
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    • 1998
  • Possibilities of substitution was investigated in the Langadite({{{{ {La }_{3 } {Ga }_{ 5}{SiO }_{14 }}}}}) system.{{{{{TiO}_{2 }}}}} was substitutes for{{{{{SiO}_{2 }}}}} followed by the substitution of{{{{{Nd}_{2 }{O}_{3}}}}}fo{{{{{La}_{2 }{O}_{3}}}}}. An effort to replace GeO2, which is reported to have been substitution for{{{{{SiO}_{2 }}}}} in the Langasit e system, for{{{{{TiO}_{2 }}}}} i n{{{{{ Nd}_{ 3} {Ga }_{5 } {TiO }_{14 } }}}} was also undertaken. In another experiment,{{{{{ Y}_{ 2}{ O}_{3 } }}}} was substituted for{{{{{ La}_{2 } {O }_{ 3} }}}}. All of substitution possibilities were investigated through solid state reactions and analyzed with XRD. Further analysis was carried out with an SEM. Lastly, the dielectric constants of the sintered body were measured.

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GROWTH AND CHARACTERIZATIONS OF $La_3Ga_5SiO_{14}$ SINGLE CRYSTALS AND SINTERED BODY FOR THE APPLICATIONS OF FILER AND RESONATOR

  • Jung, Il-Hyoung;Kyung Joo;Shim, Kwang-Bo;Auh, Keun-Ho
    • 한국결정성장학회:학술대회논문집
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    • 한국결정성장학회 1998년도 PROCEEDINGS OF THE 15TH KACG TECHNICAL MEETING-PACIFIC RIM 3 SATELLITE SYMPOSIUM SESSION 4, HOTEL HYUNDAI, KYONGJU, SEPTEMBER 20-23, 1998
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    • pp.73-77
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    • 1998
  • Langasite(La3Ga5SiO14) is a new piezoelectric material which is similar to quartz, LN(LiNbO3) and LT(LiTaO3) in its acoustic behavior. In this study, pure Langasite and Langasite family groups were synthesized by the solid state reactions in air. For the synthesis process, diffusion species were investigated and sintered body of synthesized powders were studied on dielectric property according to surface microstructures.

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양자간섭소자를 위한 InGaAs/InGaAsP/InP 양자점 분자구조 연구 (Study on InGaAs/InGaAsP/InP Quantum-dot Molecules for Quantum Interference devices)

  • 김진석;김은규;정원국
    • 한국진공학회지
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    • 제15권2호
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    • pp.186-193
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    • 2006
  • 유기금속화학기상증착법으로 InGaAs/InGaAsP/InP 양자점 분자구조를 두 양자점 층간의 거리가 10 nm가 되도록 성장하여 성장된 구조에 대해 C-V, DLTS 및 PL 등의 전기 광학적 물성측정을 하였다. 그 결과 큰 양자점은 작은 양자점과 비교하여 장벽물질의 전도대역 가장자리로부터 먼 쪽에 에너지 준위가 형성되어 있음을 확인하였다. 큰 쪽 양자점에는 최소한 2개 이상의 에너지 준위에 운반자를 포획시킬 수 있음이 확인되었는데, -4 V의 역전압 하에서 측정된 양자점 분자구조의 에너지 준위는 장벽 가장자리로부터 0.35, 0.42, 0.45 eV 의 깊이에 각각 존재하였다. 인가된 전압의 변화에 대하여 약한 전기장 하에서는 양자점 분자구조의 에너지 준위들이 서로 결합되어 있다가 전기장이 증가하면서 이들 두 에너지 준위가 확연히 분리되는 모습을 확인할 수 있었다.

Zinc Gallate (ZnGa2O4)박막 형광체의 합성과 발광특성 (Synthesis and Photoluminescence Characteristics of Zinc Gallate (ZnGa2O4) Thin Film Phosphors)

  • 김수연;윤영훈;최성철
    • 한국세라믹학회지
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    • 제44권1호
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    • pp.32-36
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    • 2007
  • Zinc gallate $(ZnGa_2O_4)$ thin film phosphors have been formed on ITO glass substrates by a sol-gel spinning coating method. For the formation of the film phosphors, the starting materials of zinc acetate dihydrate, gallium nitrate hydrate and 2-methoxyethanol as a solution were used. The thin films deposited were firstly dried at $100^{\circ}C$ and fired at $500^{\circ}C\;or\;600^{\circ}C$ for 30 min and then, annealed $500^{\circ}C\;or\;600^{\circ}C$ at for 30 min under an annealing atmosphere of 3% $H_2/Ar$. The thin films deposited on ITO glass plates showed the (220), (222), (400), (422), (511), and (440) peaks of spinel structure as well as the (311) peak indicating a standard powder diffraction pattern. The surface morphologies of the thin film phosphors were observed with a firing and an annealing condition. The $ZnGa_2O_4$ film phosphors showed the blue emission spectra around 410 nm as well as the emission spectra in the UV region (360-380 nm).

Structural characteristics and electronic properties of GaN with $N_V,\;O_N,\;and\;N_V-O_N$: first-principles calculations

  • Lee, Sung-Ho;Chung, Yong-Chae
    • 한국결정성장학회지
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    • 제17권5호
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    • pp.192-195
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    • 2007
  • Structural and electronic properties of bulk GaN with nitrogen vacancy($V_N$), oxygen substitution on nitrogen site($O_N$), and complex of nitrogen vacancy and oxygen substitution on nitrogen site($V_N-O_N$) were investigated using the first principle calculations. It was found that stability of defect formation is dependent on the epilayer growth conditions. The complex of $V_N-O_N$ is energetically the most favorable state in a condition of Ga-rich, however, oxygen substitution in nitrogen site is the most favorable state in N-rich condition. The electronic property of complex with negative charge states at $\Gamma$ point was changed from semiconductor to metal. On the contrary, the properties of nitrogen vacancy except for neutral charge state have shown the semiconductor characteristics at $\Gamma$ point. In the oxygen substitution on nitrogen site, the energy differences between conduction band minimum and Fermi level were smaller than that of defect-free GaN.

Si 기판 GaSb 기반 p-채널 HEMT 제작을 위한 오믹 접촉 및 식각 공정에 관한 연구 (A Study on the Ohmic Contacts and Etching Processes for the Fabrication of GaSb-based p-channel HEMT on Si Substrate)

  • 윤대근;윤종원;고광만;오재응;이재성
    • 전기전자학회논문지
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    • 제13권4호
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    • pp.23-27
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    • 2009
  • 실리콘 기판 상에 MBE (molecular beam epitaxy)로 형성된 GaSb 기반 p-channel HEMT 소자를 제작하기 위하여 오믹 접촉 형성 공정과 식각 공정을 연구하였다. 먼저 각 소자의 절연을 위한 메사 식각 공정 연구를 수행하였으며, HF기반의 습식 식각 공정과 ICP(inductively coupled plasma)를 이용한 건식 식각 공정이 모두 사용되었다. 이와 함께 소스/드레인 영역 형성을 위한 오믹 접촉 형성 공정에 관한 연구를 진행하였으며 Ge/Au/Ni/Au 금속층 및 $300^{\circ}C$ 60초 RTA공정을 통해 $0.683\;{\Omega}mm$의 접촉 저항을 얻을 수 있었다. 더불어 HEMT 소자의 게이트 형성을 위한 게이트 리세스 공정을 AZ300 현상액과 citric산 기반의 습식 식각을 이용하여 연구하였으며, citric산의 경우 소자 구조에서 캡으로 사용된 GaSb와 베리어로 사용된 AlGaSb사이에서 높은 식각 선택비를 보였다.

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Polarity of freestanding GaN grown by hydride vapor phase epitaxy

  • Lee, Kyoyeol;Auh, Keun-Ho
    • 한국결정성장학회지
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    • 제11권3호
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    • pp.106-111
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    • 2001
  • The freestanding GaN substrates were grown by hydride vapor phase epitaxy (HVPE) on (0001) sapphire substrate and prepared by using laser induced lift-off. After a mechanical polishing on both Ga and N-surfaces of GaN films with 100$\mu\textrm{m}$ thick, their polarities have been investigated by using chemical etching in phosphoric acid solution, 3 dimensional surface profiler and Auger electron spectroscopy (AES). The composition of the GaN film measured by AES indicted that Ga and N terminated surfaces have the different N/Ga peak ratio of 0.74 and 0.97, respectively. Ga-face and N-face of GaN revealed quite different chemical properties: the polar surfaces corresponding to (0001) plane are resistant to a phosphoric acid etching whereas N-polar surfaces corresponding to(0001) are chemically active.

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Epitaxial Growth of Three-Dimensional ZnO and GaN Light Emitting Crystals

  • Yang, Dong Won;Park, Won Il
    • 한국세라믹학회지
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    • 제55권2호
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    • pp.108-115
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    • 2018
  • The increasing demands for three-dimensional (3D) electronic and optoelectronic devices have triggered interest in epitaxial growth of 3D semiconductor materials. However, most of the epitaxially-grown nano- and micro-structures available so far are limited to certain forms of crystal arrays, and the level of control is still very low. In this review, we describe our latest progress in 3D epitaxy of oxide and nitride semiconductor crystals. This paper covers issues ranging from (i) low-temperature solution-phase synthesis of a well-regulated array of ZnO single crystals to (ii) systematic control of the axial and lateral growth rate correlated to the diameter and interspacing of nanocrystals, as well as the concentration of additional ion additives. In addition, the critical aspects in the heteroepitaxial growth of GaN and InGaN multilayers on these ZnO nanocrystal templates are discussed to address its application to a 3D light emitting diode array.