• JSTS:Journal of Semiconductor Technology and Science
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• v.3 no.3
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• pp.139-144
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• 2003

We report the results of extensive mixed mode simulations and theoretical analysis to quantify the contribution of the edge direct tunneling (EDT) current on the total gate leakage current of 80nm NMOSFET with SiO2 gate dielectric. It is shown that EDT has a profound impact on basic analog circuit building blocks such as sample-hold (S/H) circuit and the current mirror circuit. A transistor design methodology with zero gate-source/drain overlap is proposed to mitigate the EDT effect. This results in lower voltage droop in S/H application and better current matching in current mirror application. It is demonstrated that decreasing the overlap length also improves the basic analog circuit performance metrics of the transistor. The transistor with zero gate-source/drain overlap, results in better transconductance, input resistance, output resistance, intrinsic gain and unity gain transition frequency.

• JSTS:Journal of Semiconductor Technology and Science
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• v.8 no.4
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• pp.302-310
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• 2008

This paper puts forward an advanced consideration on the design of scaled multiple-gate FET (MuGFET); the aspect ratio ($R_{h/w}$) of the fin height (h) to fin width (w) of MuGFET is considered with the aid of 3-D device simulations. Since any change in the aspect ratio must consider the trade-off between drivability and short-channel effects, it is shown that optimization of the aspect ratio is essential in designing MuGFET's. It is clearly seen that the triple-gate (TG) FET is superior to the conventional FinFET from the viewpoints of drivability and short-channel effects as was to be expected. It can be concluded that the guideline of w < L/3, where L is the channel length, is essential to suppress the short-channel effects of TG-FET.

• Proceedings of the Materials Research Society of Korea Conference
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• 2012.05a
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• pp.64.1-64.1
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• 2012

Next generation displays such as high performance LCD, AMOLED, flexible display and transparent display require specific TFT back-planes. For high performance TFT back-planes, low temperature poly silicon (LTPS), and metal-oxide semiconductors are studied. Flexible TFT backplanes require low temperature processible organic semiconductors. Not only development of active semiconducting materials but also design and synthesis of semiconductor corresponding gate dielectric materials are important issues in those display back-planes. In this study, we investigate the high heat resistant polymeric gate dielectric materials for organic TFT and inorganic TFT with good insulating properties and processing chemical resistance. We also controlled and optimized surface energy and morphology of gate dielectric layers for direct printing process with solution processible organic and inorganic semiconductors.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.3
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• pp.176-186
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• 1996

As the density of VLSI increases, the conventional logic testing is not sufficient to completely detect the new faults generated in design and fabrication processing. Recently, IDDQ testing becomes very attractive since it can overcome the limitations of logic testing. In this paper, G-ATPG (gyeongsang automatic test pattern genrator) is designed which is able to be adapted to IDDQ testing for combinational CMOS VLSI. In G-ATPG, stuck-at, transistor stuck-on, GOS (gate oxide short)or bridging faults which can occur within priitive gate or XOR is modelled to primitive fault patterns and the concept of a fault-sensitizing gate is used to simulate only gates that need to sensitize the faulty gate because IDDQ test does not require the process of fault propagation. Primitive fault patterns are graded to reduce CPU time for the gates in a circuit whenever a test pattern is generated. the simulation results in bench mark circuits show that CPU time and fault coverage are enhanced more than the conventional ATPG using IDDQ test.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.3
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• pp.82-88
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• 1996

A simpel formular is proposed for the analysis of gate delay of CMOS gate in the low V$_{GS}-V_{TH}$ scaling. The effects of magnitude of V$_{GS}-V_{TH}$ on gate delay can be readily found through the formula so that it can be used ot design the device parameters in the low V$_{DD}$ CMOS circuits. The measured sresutls confirm the usability of the proposed formula and quantifies the improtance of V$_{TH}$ effects on gate delay under low voltae operation. Applying the formula to the prototype NMOSFET devices representing the five generations of technology, the impacts of the V$_{GS}-V_{TH}$ on the various aspects of the circuit and device characteristics are investigated in a consistent manner.

• Proceedings of the KIPE Conference
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• 2012.07a
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• pp.230-231
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• 2012

This paper describes a gate driver that operates numerous semiconductor switch in the solide-state pulsed power modulator. the proposed gate driver is designed to receive both the isolated drive-power and the on/off pulse signals through the transformer. Moreover, the IGBT-switch can be quickly turned off by adding protection circuit. Therefore it protects the IGBT-switch from the arc condition that frequently occurs in high-voltage pulse application. To comprehend operating characteristic of each IGBT-switch in pulse output condition, the device consisting of a high efficiency soft-switching capacitor charger and two series stacking IGBT-switch is developed. Finally, the relability of the proposed gate driver and the device for its test are proved through PSpice simulation and experiments.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2016.10a
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• pp.616-618
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• 2016

Four types of structure of tunnel field-effect transistors (TFETs) have been investigated by TCAD simulation. Pocket and L-shaped TFETs are better performance than single-gate and double-gate TFETs in terms of on-current and subthreshold swing. New guideline of TFETs is presented for the structure design.

• Proceedings of the KIPE Conference
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• 2019.07a
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• pp.248-250
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• 2019

입자가속기는 물질의 미세 구조를 밝히기 위해 기본 입자를 가속, 충돌시키는 장치로 최근 암치료 등 의학적 용도로도 이용되고 있다. 그러나 고속으로 고압을 인가시켜야 하는 장치인 만큼 기존에 명확히 설립된 회로가 없다. 이에 본 논문에서는 Ion gate를 등가회로로 구성하여 Fast Switch 장치의 기본 회로를 제안 및 분석, 실험하였다. 또한 기본 회로에서 발생하는 문제들을 개선하고자 RC Input filter와 기타 파라미터들의 설계와 Fast switch와 Ion gate를 잇는 wire 내의 기생성분을 고찰하였고 Ion gate 구동을 위해 기준이 되는 명확한 Fast switch 회로를 제안한다.

• Journal of IKEEE
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• v.3 no.2 s.5
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• pp.161-167
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• 1999

3-input neuron-MOSFET inverters and 3-bit D/A converters using enhancement type device have been designed and fabricated by using standard 2-poly CMOS process. The voltage transfer curve and the noise margin of neuron-MOSFET inverters have been measured and characterized as the same method in normal CMOS inverters. From the theoretical calculation of the effects of coupling ratio on the voltage transfer curve and noise margin, we set up the design guideline for the gate oxide thickness and input gate layout in neuron-MOSFET inverters. BT using one of input gates as a control gate, we can design and fabricate the neuron-MOSFET D/A converter without offset voltage.

• Journal of Sensor Science and Technology
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• v.29 no.1
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• pp.68-73
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• 2020

This paper proposes an asynchronous circuit design methodology using a new Single Gate Sleep Convention Logic (SG-SCL) with advantages such as low area overhead, low power consumption compared with the conventional null convention logic (NCL) methodologies. The delay-insensitive NCL asynchronous circuits consist of dual-rail structures using {DATA0, DATA1, NULL} encoding which carry a significant area overhead by comparison with single-rail structures. The area overhead can lead to high power consumption. In this paper, the proposed single gate SCL deploys a power gating structure for a new {DATA, SLEEP} encoding to achieve low area overhead and low power consumption maintaining high performance during DATA cycle. In this paper, the proposed methodology has been evaluated by a liquid state machine (LSM) for pattern and digit recognition using FPGA and a 0.18 ㎛ CMOS technology with a supply voltage of 1.8 V. the LSM is a neural network (NN) algorithm similar to a spiking neural network (SNN). The experimental results show that the proposed SG-SCL LSM reduced power consumption by 10% compared to the conventional LSM.