• Proceedings of the IEEK Conference
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• 2006.06a
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• pp.645-646
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• 2006

The oscillation amplitude of a probe tip is an important parameter to determine the resolution of atomic force microscopy (AFM) techniques. In this work, we introduce a new method for the measurement of the oscillation amplitude of a quartz tuning fork tip sub-nanometer resolution.

• Safety and Health at Work
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• v.7 no.4
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• pp.347-353
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• 2016

Background: This study aimed to investigate the relation between key strike forces and musculoskeletal symptoms (MSS). Moreover, this study presents a key strike force measurement method to be used in a workplace setting. The correlation between key strike force characteristics and MSS was previously studied, but the measurement methods used either a single-key switch or force platforms applied under the keyboard. Most of the studies were conducted in a laboratory setting. The uniqueness of measurement methods in the current study is their ability to measure forces applied to a specific key in a workplace setting and to provide more information about specific key strike forces during typing. Methods: Twenty-four healthy computer workers were recruited for the study. The demographic questionnaire, and self-reported questionnaires for psychosocial status (General Nordic Questionnaire for Psychological and Social Factors at Work) and for detecting MSS were filled up, which later helped in dividing the participants into two groups (12 participants with pain and 12 without pain). Participants typed a predetermined text that utilized the instrumented keys multiple times. The dynamic forces applied to the keys were recorded and collected, using four thin and flexible force sensors attached to the preselected keys according to their location. Results: The results demonstrated that participants with high levels of MSS, specifically in the back and neck, in the last year exerted significantly higher key strike forces than those with lower levels of symptoms (p < 0.005). Conclusion: The key strike force exerted while typing on a keyboard may be a risk factor for MSS, and should therefore be considered in ergonomic evaluations and interventional programs.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.3 no.2
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• pp.53-59
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• 2004

In this paper, we propose a new multi-purpose Scanning Force Microscope (SFM) system. The system can be used for nano/micro-scratching, in-process profile measurement, and observation of potential surface defects which occur during the scratching in air or liquid. Experimental results of nano/micro-scratching show that the smallest scratching depth can be controlled to be 10nm, which corresponds to the stability of the SFM system. Profile measurements of nano/micro-scratching surfaces have also been performed by the method of on-machine measurement and in-process measurement. Two measurement results were in good agreement with each other. The maximum difference was approximately 10 nm, which was mainly caused by the sampling repeatability error that influences the measurement accuracy Also, micro-defects on the micro-scratching surface were successfully detected by the SFM system. It was confirmed that the number of micro-defects increases when the surface is subjected to a cyclic bending load. The maximum depth was less than 100nm.

• Journal of the Korean Society for Aeronautical & Space Sciences
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• v.48 no.7
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• pp.489-495
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• 2020

An accelerometer-based system was designed and constructed for drag measurement in a shock tunnel. Drag coefficient of a conical model was measured under a Mach 6 flow condition. A simple and intuitive calibration method was presented to compensate for the friction force of the drag measurement system, and the results of the measurement were compared with computational fluid dynamics in which the simple conical model was analyzed. The influence of drag measurement interference by supports of various shapes was identified and the design was presented to minimize. The drag coefficient measurement using the modified support showed that the error of the drag coefficient by the support was decreased.

• Tribology and Lubricants
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• v.29 no.2
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• pp.91-97
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• 2013

Quantifying the nanoscale force between the atomic force microscopy (AFM) probe of a force-sensing cantilever and the sample is one of the challenges faced by AFM researchers. The normal force calibration is straightforward; however, the lateral force is complicated due to the twisting motion of the cantilever. Force measurement in a liquid environment is often needed for biological applications; however, calibrating the force of the AFM probes for those applications is more difficult owing to the limitations of conventional calibration methods. In this work, an accurate nondestructive lateral force calibration method using multiple pivot loading was proposed for liquid environment. The torque sensitivity at the location of the integrated probe was extrapolated based on accurately measured torque sensitivities across the cantilever width along a few cantilever lengths. The uncertainty of the torque sensitivity at the location of the integrated tip was about 13%, which is significantly smaller than those for other calibration methods in a liquid environment.

• 제어로봇시스템학회:학술대회논문집
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• 2001.10a
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• pp.128.5-128
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• 2001

This paper presents investigation of an arc force sensor for a robotic welding control system. Arc force sensor is employed in this research to monitor the bead geometry of the arc welding process. Arc force sensor mounted at the end of the robot wrist was employed to measure the arc force applied to the weld. Experimental configuration for measurement of arc force was used to quantify the changes in the arc force distributions of the plate being welded. A relationship between the bead dimension and the arc force distributions was established. The sensor information was used to establish a relationship between welding current and arc force. Arc force sensor have shown to be one of the most sophisticated technique to monitor perturbations that occurred during robotic arc welding process.

• Journal of the Korean Society for Precision Engineering
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• v.22 no.4
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• pp.84-91
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• 2005

We measured the pitch of one-dimensional (ID) grating specimens using a metrological atomic force microscope (M-AFM). The ID grating specimens a.e often used as a magnification standard in nano-metrology, such as scanning probe microscopy (SPM) and scanning electron microscopy (SEM). Thus, we need to certify the pitch of grating specimens fur the meter-traceability in nano-metrology. To this end, an M-AFM was setup at KRISS. The M-AFM consists of a commercial AFM head module, a two-axis flexure hinge type nanoscanner with built-in capacitive sensors, and a two-axis heterodyne interferometer to establish the meter-traceability directly. Two kinds of ID grating specimens, each with the nominal pitch of 288 nm and 700 nm, were measured. The uncertainty in pitch measurement was evaluated according to Guide to the Expression of Uncertainty in Measurement. The pitch was calculated from 9 line scan profiles obtained at different positions with 100 ㎛ scan range. The expanded uncertainties (k = 2) in pitch measurement were 0.10 nm and 0.30 nm for the specimens with the nominal pitch of 288 nm and 700 nm. The measured pitch values were compared with those obtained using an optical diffractometer, and agreed within the range of the expanded uncertainty of pitch measurement. We also discussed the effect of averaging in the measurement of mean pitch using M-AFM and main components of uncertainty.

• Journal of Korean Society of Steel Construction
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• v.25 no.1
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• pp.61-70
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• 2013

A turn-buckle is capable of adjusting the tensile force by left-hand threads and right-hand threads between tension members. There are different types of turn-buckles according to tension member and connection form but the practical and existing turn-buckles are incapable of measuring the tensile force. A turn-buckle for adjusting and measuring tensile force has therefore been developed. This study shows the ultimate strength and reliability for measurement of the new turn-buckles through finite element analysis of the developed ones. From analytic results of the new turn-buckles which have the measurement limit loads of 100kN, 200kN and 300kN, the ultimate strength is approximately five times stronger than the measurement limit capacity. Additionally, a review of the new turn-buckle, which has the measurement limit load of over 300kN, shows that there is a tendency for the size of turn-buckle to become larger. So the connection devices were designed and the loading test was conducted from the concept that the parallel connection of turn-buckle with 300kN capacity can measure the tensile force of 600kN. The results of parallel loading test show the sufficient possibility. Furthermore, the mock-up test was constructed to investigate the release of initial load and corrosion when the new turn-buckle is installed at the outdoor and exposed to rain and atmosphere.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1996.04a
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• pp.34-38
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• 1996

Cylindrical plunge grinding is widely used for final machining process of precision parts such as automobile, aircraft, measurement units. In order to make parts which have high precison accuracy and high surface integrity, it is neccessary to consider grinding characteristics. these grinding characteristics are closely related grinding force. Soin this study, to examine closely characteristics of grinding force, effects of dressing condition, depth of cut and speed ratio on grinding force are considered. As the result, It is shown that grinding forces are affected bydressing condition, depth of cut and speed ratio and that there exist threshod grinding force and it also affected by dressing conditon.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.26 no.3
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• pp.537-543
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• 2002

This paper examines a new in-process measurement system for the measurement of micro-defects on the surfaces of brittle materials by using the AFM (Atomic Force Microscopy). A new AFM scanning stage that can also perform nano-scale bending of the sample was developed by adding a bending unit to a commercially available AFM scanner. The bending unit consists of a PZT actuator and sample holder, and can perform static and cyclic three-point bending. The true bending displacement of the bending unit is approximately 1.8mm when 80 volts are applied to the PZT actuator. The frequency response of the bending unit and the stress on the sample were also analyzed, both theoretically and experimentally. Potential surface defects of the sample were successfully detected by this measurement system. It was confirmed that the number of micro-defects on a scratched surface increases when the surface is subjected to a cyclic bending load.