1 |
Wagner, K., Cheng, P., and Vezenov, D., "Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy," Langmuir, Vol. 27, pp. 4635-4644, 2011.
DOI
ScienceOn
|
2 |
Ryu, S. and Franck, C., "In Situ Hydrodynamic Lateral Force Calibration of AFM Colloidal Probes," Langmuir, Vol. 27, pp. 13390-13399, 2011.
DOI
ScienceOn
|
3 |
Higgins, M. J., Proksch, R., Sader, J. E., Polcik, M., Endoo, S. M., Cleveland, J. P., and Jarvis, S. P., "Noninvasive Determination of Optical Lever Sensitivity in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 77, pp. 013701, 2006.
DOI
ScienceOn
|
4 |
Green, C. P., Lioe, H., Cleveland, J. P., Proksch, R., Mulvaney, P., and Sader, J. E., "Normal and Torsional Spring Constants of Atomic Force Microscope Cantilevers," Rev. Sci. Instrum., Vol. 75, pp. 1988- 1996, 2004.
DOI
ScienceOn
|
5 |
Chung, K. H., Shaw, G. A., and Pratt, J. R., "Accurate Noncontact Calibration of Colloidal Probe Sensitivities in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 80, pp. 065107, 2009.
DOI
ScienceOn
|
6 |
John R. Taylor. An Introduction Error Analysis: The Study of Uncertainties in Physical Measurements. Sausalito, Caifornia: University Science Books, 1996.
|
7 |
Binnig, G., Quate, C. F., and Gerber, C., "Atomic Force Microscope," Phys Rev Lett, Vol. 56, pp. 930- 933, 1986.
DOI
ScienceOn
|
8 |
Chung, K. H., Bhadriraju, K., Spurlin, T. A., Cook, R. F., and Plant, A. L., "Nanomechanical Properties of Thin Films of Type I Collagen Fibrils," Langmuir, Vol. 26, pp. 3629-3636, 2010.
DOI
ScienceOn
|
9 |
Mahaffy, R. E., Shih, C. K., MacKintosh, F. C., and KAs, J., "Scanning Probe-Based Frequency-Dependent Microrheology of Polymer Gels and Biological Cells," Phys Rev Lett, Vol. 85, pp. 880-883, 2000.
DOI
ScienceOn
|
10 |
Stan, G., Krylyuk, S., Davydov, A. V., Levin, I., and Cook, R. F., "Ultimate Bending Strength of Si Nanowires," Nano Lett., Vol. 12, pp. 2599-2604, 2012.
DOI
ScienceOn
|
11 |
Hutter, J. L. and Bechhoefer, J., "Calibration of Atomic-Force Microscope Tips," Rev. Sci. Instrum., Vol. 64, pp. 1868-1873, 1993.
DOI
ScienceOn
|
12 |
Torii, A., Sasaki, M., Hane, K., and Okuma, S., "A Method for Determining the Spring Constant of Cantilevers for Atomic Force Microscopy," Meas Sci Technol, Vol. 7, pp. 179-184, 1996.
DOI
ScienceOn
|
13 |
Gates, R. S. and Reitsma, M. G., "Precise Atomic Force Microscope Cantilever Spring Constant Calibration using a Reference Cantilever Array," Rev. Sci. Instrum., Vol. 78, pp. 086101, 2007.
DOI
ScienceOn
|
14 |
Sader, J. E., Chon, J. W. M., and Mulvaney, P., "Calibration of Rectangular Atomic Force Microscope Cantilevers," Rev. Sci. Instrum., Vol. 70, pp. 3967- 3969, 1999.
DOI
|
15 |
Cain, R. G., Biggs, S., and Page, N. W., "Force Calibration in Lateral Force Microscopy," J. Colloid Interface Sci., Vol. 227, pp. 55-65, 2000.
DOI
ScienceOn
|
16 |
Sader, J. E. and Green, C. P., "In-Plane Deformation of Cantilever Plates with Applications to Lateral Force Microscopy," Rev. Sci. Instrum., Vol. 75, pp. 878-883, 2004.
DOI
ScienceOn
|
17 |
Ogletree, D. F., Carpick, R. W., and Salmeron, M., "Calibration of Frictional Forces in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 67, pp. 3298- 3306, 1996.
DOI
ScienceOn
|
18 |
Varenberg, M., Etsion, I., and Halperin, G., "An Improved Wedge Calibration Method for Lateral Force in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 74, pp. 3362-3367, 2003.
DOI
ScienceOn
|
19 |
Li, Q., Kim, K. -., and Rydberg, A., "Lateral Force Calibration of an Atomic Force Microscope with a Diamagnetic Levitation Spring System," Rev. Sci. Instrum., Vol. 77, pp. 065105, 2006.
DOI
ScienceOn
|
20 |
Chung, K. H. and Reitsma, M. G., "Note: Lateral Force Microscope Calibration using Multiple Location Pivot Loading of Rectangular Cantilevers," Rev. Sci. Instrum., Vol. 81, pp. 026104, 2010.
DOI
ScienceOn
|
21 |
Wang, F. and Zhao, X., "Effect of Contact Stiffness on Wedge Calibration of Lateral Force in Atomic Force Microscopy," Rev. Sci. Instrum., Vol. 78, pp. 043701, 2007.
DOI
ScienceOn
|