• Title/Summary/Keyword: Etch angle

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Removal of Aspect-Ratio-Dependent Etching by Low-Angle Forward Reflected Neutral-Beam Etching (Low-Angle Forward Reflected Neutral Beam Etching을 이용한 Aspect-Ratio-Dependent Etching 현상의 제거)

  • Min Kyung-Seok;Park Byoung-Jae;Yeom Geun-Young;Kim Sung-Jin;Lee Jae-Koo
    • Journal of the Korean Vacuum Society
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    • v.15 no.4
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    • pp.387-394
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    • 2006
  • In this study, the effect of using a neutral beam formed by low-angle forward reflection of a reactive ion beam on aspect-ratio-dependent etching (ARDE) has been investigated. When a SF6 Inductively Coupled Plasma and $SF_6$ ion beam etching are used to etch poly-Si, ARDE is observed and the etching of poly-Si on $SiO_2$ shows a higher ARDE effect than the etching of poly-Si on Si. However, by using neutral beam etching with neutral beam directionality higher than 70 %, ARDE during poly-Si etching by $SF_6$ can be effectively removed, regardless of the sample conditions. The mechanism for the removal of ARDE via a directional neutral beam has been demonstrated through a computer simulation of different nanoscale features by using the two-dimensional XOOPIC code and the TRIM code.

The effect of adhesive thickness on microtensile bond strength to the cavity wall (와동벽에서 접착제의 두께가 미세인장 결합강도에 미치는 영향)

  • Lee, Hwa-Eon;Kim, Hyeon-Cheol;Hur, Bock;Park, Jeong-Kil
    • Restorative Dentistry and Endodontics
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    • v.32 no.1
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    • pp.9-18
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    • 2007
  • The purposes of this study were to examine the variability of adhesive thickness on the different site of the cavity wall when used total-etch system without filler and simplified self-etch system with filler and to evaluate the relationship between variable adhesive thickness and microtensile bond strength to the cavity wall. A class I cavity in six human molars was prepared to expose all dentinal walls. Three teeth were bonded with a filled adhesive, $Clearfil^{TM}$ SE bond ana the other three teeth were bonded with unfilled adhesives, $Scotchbond^{TM}$ Multi Purpose. Morphology and thickness of adhesive layer were examined using fluorescence microscope. Bonding agent thickness was measured at three points along the axial cavity wall edge of cavity margin (rim). halfway down each cavity wall (h1f), internal angle of the cavity (ang). After reproducing the adhesive thickness at rim, h1f and ang, micro-tensile bond strength were evaluated. For both bonding agents, adhesive thickness of ang was significantly thicker than that of rim and h1f (P <0.05). As reproduced the adhesive thickness, microtensile bond strength was increased as adhesive thickness was increased in two bonding agents. Adhesive thickness of internal angle of the cavity was significantly thicker than that of the cavity margin and the halfway cavity wall for both bonding agents. Microtensile bond strength of the thick adhesive layer at the internal angle of the cavity was higher than that of the thin adhesive layer at 1,he cavity margin and the halfway cavity in the two bonding systems.

Dissolution of Mo/Al Bilayers in Phosphoric Acid

  • Kim, In-Sung;Chon, Seung-Whan;Kim, Ky-Sub;Jeon, Il-Cheol
    • Bulletin of the Korean Chemical Society
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    • v.24 no.11
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    • pp.1613-1617
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    • 2003
  • In the phosphoric acid based etchant, the dissolution rates of Mo films were measured by microgravimetry and the corrosion potentials of Mo and Al were estimated by Tafel plot method with various concentrations of nitric acid. Dissolution rate of Mo increased with the nitric acid concentration and reached a limiting value at high concentration of nitric acid in ambient condition. Corrosion potentials of Mo and Al shifted to positive direction and the difference between potentials of both metals was about 1,100 mV and 1,200 mV with 1% and above 4% of $HNO_3$, respectively. For a Mo/Al bilayers, the dissolution rate inversion is the main reason for good taper angle in shower etching process. Taper angles are observed by scanning electron microscope (SEM) after wet etching process for Mo/Al layered films with different concentrations of $HNO_3$. In the etch side profile, it was found that Al corroded faster than Mo below 4% of $HNO_3$ in dip etching process, however, Mo corroded faster above 4%. Trend for variation of taper angle of etched side of Mo/Al layered film can be explained by considering the effect corrosion rates of both metals with various concentrations of $HNO_3$.

A study on the taping techniques of functional golf inner-wear for improving golf swing trajectory & shot distance (골프 스윙궤적 및 비거리 향상을 위한 기능성 골프 이너웨어의 테이핑 기법 연구)

  • Jungwoo Kim
    • The Research Journal of the Costume Culture
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    • v.32 no.1
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    • pp.58-69
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    • 2024
  • The purpose of this study was to develop the Functional golf inner-wear by preventing the injuries and enhancing the performance of the Golf swing by checking the influence of the wearing of the functional golf inner-wear considering golf characteristics on the Swing trajectory and Shot distance. Functional inner-wear effective for golf swing was manufactured using the sports taping method. Changes in driver and iron swing before and after wearing the functional golf inner-wear manufactured in this way were measured using trackman equipment. Measurement variables were limited to Club Speed, Attack Angle, Club Path, Ball Speed, Smash Factor, and Priority. Before and after wearing functional golf inner-wear, there were statistically significant differences in driver club speed, iron club speed, driver etch angle, iron club pass, driver ball speed, driver smash factor, iron smash factor, driver carry, iron carry, and right shoulder joint proprioceptive sensory ability. As a result, functional golf inner-wear is effective for ball speed, impact, and carry by increasing club speed and efficient swing. Future research will focus on the development of functional golf that can improve the swing ability in a short game that plays an important role in the golf game through various sports taping grafting technique, textile, special material, film, Research on functional golf inner-wear.

Analysis of Chemical and Morphological Changes of Phenol Formaldehyde-based Photoresist Surface caused by O2 Plasma

  • Shutov, D.A.;Kang, Seung-Youl;Baek, Kyu-Ha;Suh, Kyung-Soo;Min, Nam-Ki;Kwon, Kwang-Ho
    • Transactions on Electrical and Electronic Materials
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    • v.8 no.5
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    • pp.211-214
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    • 2007
  • Chemical and morphological changes of phenol formaldehyde-based photoresist after $O_2$ radiofrequency(RF) plasma treatment depending on exposure time and source power were investigated. It was found that etch rate of photoresist sharply increased after discharge turn on and reached a limit with increase in plasma exposure time. Contact angle measurements and X-ray photoelectron spectroscopy(XPS) analysis showed that the surface chemical structure become nearly constant after 15 sec of the treatment. Atomic force microprobe(AFM) measurements were shown that surface roughness was increased with plasma exposure time.

A Study on Pattern Formation of Ultra Definition Display Panel Applying Phosphoric Acid (인산을 적용한 Ultra Definition 디스플레이 패널의 패턴 형성에 관한 연구)

  • Kim, Min-Su;Cho, Ur Ryong
    • Journal of the Semiconductor & Display Technology
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    • v.13 no.3
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    • pp.13-19
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    • 2014
  • Phosphoric acid was used as etching agent instead of conventional peroxide - based chemicals for forming pattern of ultra definition display. Etchant was synthesized by mixing etching agent, oxidation agent, buffer solution, and additive into solvent, deionized water. Thicknesses of copper, main metal of ultra definition display, for etching, were 10,000 and $30,000{{\AA}}$. Etch stop of good low skew for proper pattern formation has been occurred at the content ratio of phosphoric acid 60 - 64%, nitric acid 4 - 5%, additive(potassium acetate) 1 - 3%. Buffer solution(acetic acid) decreased the metal contact angle $63.07^{\circ}$ to $42.49^{\circ}$ for benefiting pattern formation. Content variations on four components (phosphoric acid, nitric acid, acetic acid, potassium acetic acid) of the etchant with storage time were within 3 wt% after 24 hrs of etching work.

Preventing Plasma Degradation of Plasma Resistant Ceramics via Surface Polishing (내플라즈마성 세라믹의 표면연마를 통한 플라즈마 열화방지)

  • Jae Ho Choi;Young Min Byun;Hyeong Jun Kim
    • Journal of the Semiconductor & Display Technology
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    • v.22 no.3
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    • pp.130-135
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    • 2023
  • Plasma-resistant ceramic (PRC) is a material used to prevent internal damage in plasma processing equipment for semiconductors and displays. The challenge is to suppress particles falling off from damaged surfaces and increase retention time in order to improve productivity and introduce the latest miniaturization process. Here, we confirmed the effect of suppressing plasma deterioration and reducing the etch rate through surface treatment of existing PRC with an initial illumination level of 200 nm. In particular, quartz glass showed a decrease in etch rate of up to 10%. Furthermore, it is believed that micro-scale secondary particles formed on the microstructure of each material grow as crystals during the fluoridation process. This is a factor that can act as a killer defect when dropped, and is an essential consideration when analyzing plasma resistance. The plasma etching suppression effect of the initial illumination is thought to be due to partial over etching at the dihedral angle of the material due to the sputtering of re-emission of Ar+-based cations. This means that plasma damage due to densification can also be interpreted in existing PRC studies. The research results are significant in that they present surface treatment conditions that can be directly applied to existing PRC for mass production and a new perspective to analyze plasma resistance in addition to simple etching rates.

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Slit Wafer Etching Process for Fine Pitch Probe Unit

  • Han, Myeong-Su;Park, Il-Mong;Han, Seok-Man;Go, Hang-Ju;Kim, Hyo-Jin;Sin, Jae-Cheol;Kim, Seon-Hun;Yun, Hyeon-U;An, Yun-Tae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.08a
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    • pp.277-277
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    • 2011
  • 디스플레이의 기술발전에 의해 대면적 고해상도의 LCD가 제작되어 왔다. 이에 따라 LCD 점등검사를 위한 Probe Unit의 기술 또한 급속도로 발전하고 있다. 고해상도에 따라 TFT LCD pad가 미세피치화 되어가고 있으며, panel의 검사를 위한 Probe 또한 30 um 이하의 초미세피치를 요구하고 있다. 따라서, 초미세 pitch의 LCD panel의 점등검사를 위한 Probe Unit의 개발이 시급하가. 본 연구에서는 30 um 이하의 미세피치의 Probe block을 위한 Slit wafer의 식각 공정 조건을 연구하였다. Si 공정에서 식각율과 식각깊이에 따른 profile angle의 목표를 설정하고, 식각조건에 따라 이 두 값의 변화를 관측하였다. 식각실험으로 Si DRIE 장비를 이용하여, chamber 압력, cycle time, gas flow, Oxygen의 조건에 따라 각각의 단면 및 표면을 SEM 관측을 통해 최적의 식각 조건을 찾고자 하였다. 식각율은 5um/min 이상, profile angle은 $90{\pm}1^{\circ}$의 값을 목표로 하였다. 이 때 최적의 식각조건은 Etching : SF6 400 sccm, 10.4 sec, passivation : C4F8 400 sccm, 4 sec의 조건이었으며, 식각공정의 Coil power는 2,600 W이었다. 이러한 조건의 공정으로 6 inch Si wafer에 공정한 결과 균일한 식각율 및 profile angle 값을 보였으며, oxygen gas를 미량 유입함으로써 식각율이 균일해짐을 알 수 있었다. 결론적으로 최적의 Slit wafer 식각 조건을 확립함으로써 Probe Unit을 위한 Pin 삽입공정 또한 수율 향상이 기대된다.

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Dry Etching Characteristics of LiNbO3 Single Crystal for Optical Waveguide Fabrication (광도파로 제작을 위한 단결정 LiNbO3 건식 식각 특성)

  • Park, Woo-Jung;Yang, Woo-Seok;Lee, Han-Young;Yoon, Dae-Ho
    • Journal of the Korean Ceramic Society
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    • v.42 no.4
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    • pp.232-236
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    • 2005
  • The etching characteristics of a $LiNbO_{3}$ optical waveguide structure have been investigated using neutral loop discharge plasma with the mixture of $C_{3}F_{8}$ and Ar and the bias power parameters. The etching rate and profile angle of optical waveguide with etching parameters were evaluated by scanning electron microscopy. Also, the etching RMS roughness was evaluated by atomic force microscopy. From the results of optimum etching conditions are the $C_{3}F_{8}$ gas flow ratio of 0.2 and the bias power of 300 W.

A STUDY ON THE BOND STRENGTH OF RESIN-RETAINED PROTHESIS WITH VARIOUS CAST RETAINER DESIGNS (주조체의 설계 변화에 따른 수지접착형 보철물의 접착강도에 관한 연구)

  • Joo Dae-Won;Chang Ik-Tae;Kim Kwang-Nam
    • The Journal of Korean Academy of Prosthodontics
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    • v.30 no.4
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    • pp.508-525
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    • 1992
  • The purpose of this study was to evaluate the effect of some resistance form designs on the bond strength of resin-retained prosthesis. Six sub-groups are designed in natural teeth group and resin teeth group . The framework designs in natural teeth group: 1) no groove preparation 2) groove at the center of distal surface 3) groove at the distobuccal line angle 4) 45 degree lateral load with no groove 5) 45 degree lateral load with center groove 6) splint two teeth with no groove. The framework designs in resin teeth group: 1) no groove preparation 2) groove at the center of distal surface 3) groove at the distobuccal line angle 4) metal covered the 1/2 of distal surface 5) metal covered the 1/2 of mesial surface 6) metal extended over the 114 of buccal surface. Specimens were treated electrolytic etching by Oxy-Etch and cemented with Panavia EX. Failure load was measured by Instron. Another 30 specimens were carried out fatigue tests by MTS 810 fatigue testing machine for 5000 cycles at different load level. The following results were obtained from this study. 1. The failure load was significantly increased by resistance forms. 2. The failure load was not increased by increase of total surface area bonded with teeth. The distal surface area played an important role in failure load. 3. In 45 degree lateral load group, the failure load was decreased significantly than that of in vertical load group. 4. Bond failure modes between static test and fatigue test exhibited no differences.

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