• Transactions of The Korea Fluid Power Systems Society
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• v.5 no.4
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• pp.32-37
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• 2008

For the bucket tip position control of the excavator, a traditional hydraulic excavator system was exchanged into an electro-hydraulic one. EPPR valves are attached to the traditional MCV and hydraulic joysticks are replaced by electronic ones to develop the electro-hydraulic system. To control the electronic pump with a good performance, the control logic for the pump is deduced from the AMESim simulation and the experimental method on the test bench. To get a good position control performance of the excavator bucket tip, PI+AntiWindup controller is selected as a position controller. The experimental results showed the good controllability for the electro-hydraulic excavator system on the test bench.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.06a
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• pp.499-499
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• 2008

High voltage transformer of Diagnostic X-ray system has been contributed to wiping out disease to get a good quality images from patients. High voltage transformer of diagnostic X-ray system has been usefully used for diagnostic purpose but if high voltage transformer performances are deteriorated, low quality image will be archived. In this case, operator has to exposure to get a more good quality images. In this case, unexpected radiation could be exposed to patient and it is very harmful to the patient. And I would like to design and make equipment to checkable high voltage transformer performance after that I wish to test and study what it is most influences in radiation output quality.

• The Journal of the Korea institute of electronic communication sciences
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• v.17 no.4
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• pp.587-594
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• 2022

This paper analyzed radio link throughput performance by applying radio link simulation and test equipment because there is limit in train filed test in 420 km/h high speed environment. According to the radio performance analysis, the throughput performance is slightly degraded in QPSK and 16QAM modulation schemes. But throughput performance is highly degraded in 64QAM modulation scheme.

• Proceedings of the International Microelectronics And Packaging Society Conference
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• 2004.09a
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• pp.93-99
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• 2004

At present, LG Electronics pushes ahead to eliminate the Pb(Lead) -a hazardous material- from all products. Especially, we have performed to select the optimum standard composition of lead free alloy for the application to products for about 3 years from 2000. These days, we have the chance for applying to the mass-production. This project constructed the system for applying the lead free solders on consumer electronic products, which is one of the major products of the LG Electronics. To select the lead free solders with corresponding to the product features, we have passed through the test and applied with Sn-3.0Ag-0.5Cu alloy system to our products, and for the application to the high melting temperature composition, we secured the thermal resistance of the many parts and substrate and optimized the processing conditions. We have operated the temperature cycling test and the high temperature storage test under the standards to confirm the reliability of the products. On these samples, we considered the consequence of our decision by the operating test. For the long life time of the product, we have operated the temperature cycling test at $-45^{\circ}C-+125^{\circ}C$, 1 cycle/hour, 1000 cycles. Also we have tested the tin whisker growth about lead free plating on lead finish. We have analyzed with the SEM, EDS and any other equipment for confirming the failure mode at the joint and the tin whisker growth on lead free finish.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.119-119
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• 2010

Among the various factors influencing the service life of the electric equipment, the performance of dielectric insulation materials has an important role to determine their whole service life. In order to determine the degradation of insulating materials immersed in extremely low temperature media such as liquid nitrogen, the abrupt temperature change from cryogenic to normal room temperature should be considered. But the assessments of low-temperature aging test method for the dielectric materials immersed in liquid nitrogen considering these conditions were not fully reported. Therefore, for the fundamental step to establish the suitable degradation test methods for cryogenic dielectric materials, we focused on the evaluation of ageing test methods for dielectric materials exposed to low temperature environments considering thermal shock by cool-down and warm up test.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.20 no.5
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• pp.87-92
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• 2019

This study is the analysis of causes of printed circuit board (PCB) in collective protection equipment failure and quality improvement. The equipment is a component of the weapon system currently in operation and serves to defend against enemy chemical and biological attack as well as heating and cooling functions. However, during operation in the military, fans of condensate assembly failed to operate. The cause of the failure is the burning of PCB. It was found that the parts were heated according to the continuous cooling operation under the high temperature environmental conditions. Accordingly, the electronic components exposed to high temperature were deteriorated and destroyed. To solve this problem, PCB apply to heatsink. The performance test of improved PCB has been completed. Futhermore system compatibility, positive pressure maintenance and noise test were performed. This improvement confirmed that no faults have occurred in PCB so far. Therefore, the quality of the equipment has improved.

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.2
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• pp.184-193
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• 2015

This paper proposes a cost-efficient and automatic method for large data acquisition from a test chip without expensive equipment to characterize random process variation in an integrated circuit. Our method requires only a test chip, a personal computer, a cheap digital-to-analog converter, a controller and multimeters, and thus large volume measurement can be performed on an office desk at low cost. To demonstrate the proposed method, we designed a test chip with a current model logic driver and an array of 128 current mirrors that mimic the random process variation of the driver's tail current mirror. Using our method, we characterized the random process variation of the driver's voltage due to the random process variation on the driver's tail current mirror from large volume measurement data. The statistical characteristics of the driver's output voltage calculated from the measured data are compared with Monte Carlo simulation. The difference between the measured and the simulated averages and standard deviations are less than 20% showing that we can easily characterize the random process variation at low cost by using our cost-efficient automatic large data acquisition method.

• Proceedings of the KIEE Conference
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• 2008.11a
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• pp.373-375
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• 2008

TTCN-3(Testing & Test Control Notation Version 3) defined in EISI(2001) are the standardized test specification and test implementation language of applicable for all kinds of black-box testing for reactive and distributed system, telecom systems, Mobile system, Internet, CORBA based system, java, XML, etc. This paper using the TTCN-3 on an Electric Power IT Protocol DLMS(Device Language Message Specification) standards for the implementation of the device equipment test the suitability of the protocol.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.29 no.10
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• pp.635-640
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• 2016

This paper dealt with the deterioration characteristics and an on-line diagnosis equipment for SPDs (surge protective devices). An accelerated aging test was carried out using a $8/20{\mu}s$ standard lightning impulse current to analyze the changes of electrical characteristics and to propose the diagnostic parameters and the criterion for deterioration of ZnO varistor which is the core component of SPDs. Based on the experimental results, an on-line diagnosis equipment for SPD was fabricated, which can measure the total leakage current, reference and clamping voltage. The leakage current measurement circuit was designed using a low-noise amplifier and a clamp type ZCT. A linear controller, the leakage current measurement part and a HVDC were used in the measurement of reference voltage. The measurement circuit of clamping voltage consisted of a surge generator and a coupling circuit. In a calibration process, measurement error of the prototype equipment was less than 3%.

• Journal of Advanced Navigation Technology
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• v.21 no.5
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• pp.459-465
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• 2017

In this paper, we introduce the design consideration of the lightning induced transient protection circuit for the indirect lightning strike on the avionics equipment. The lightning induced surge voltage, which is so-called as indirect effects of lightning, may cause a functional failure or physical damage to the electrical and electronic equipment of aircraft. In order to protect the electrical and electronic equipment of aircraft from the indirect effects of lightning, we should analyze the effect of lightning strike on aircraft and consider applying protection design for each avionics device. However, lightning induced transient protection circuits can have unintended consequences because parasitic inductance elements are exist in PCB and TVS diodes. In this paper, we introduce the design method of the protection circuit considering the parasitic inductance of the protection circuit. In addition, we show the result of verification test performed to validate the protection circuits for indirect effects of lightning.