Browse > Article
http://dx.doi.org/10.4313/JKEM.2016.29.10.635

Deterioration Characteristics and an On-Line Diagnostic Equipment for Surge Protective Devices  

Park, Kyoung-Soo (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University)
Wang, Guoming (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University)
Hwang, Seong-Cheol (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University)
Kim, Sun-Jae (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University)
Kil, Gyung-Suk (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.29, no.10, 2016 , pp. 635-640 More about this Journal
Abstract
This paper dealt with the deterioration characteristics and an on-line diagnosis equipment for SPDs (surge protective devices). An accelerated aging test was carried out using a $8/20{\mu}s$ standard lightning impulse current to analyze the changes of electrical characteristics and to propose the diagnostic parameters and the criterion for deterioration of ZnO varistor which is the core component of SPDs. Based on the experimental results, an on-line diagnosis equipment for SPD was fabricated, which can measure the total leakage current, reference and clamping voltage. The leakage current measurement circuit was designed using a low-noise amplifier and a clamp type ZCT. A linear controller, the leakage current measurement part and a HVDC were used in the measurement of reference voltage. The measurement circuit of clamping voltage consisted of a surge generator and a coupling circuit. In a calibration process, measurement error of the prototype equipment was less than 3%.
Keywords
SPD; Deterioration characteristics; Leakage current; Reference voltage; Clamping voltage;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 R. B. Standler, Protection of Electronic Circuits from Overvoltages, 1st ed. (John Wiley & Sons, New York, 1989) p. 133-138.
2 A. Haddad and D. F. Warne, Advances in High Voltage Engineering, 1st ed. (The Institution of Engineering and Technology, London, 2004) p. 201-205. [DOI: http://dx.doi.org/10.1049/PBPO040E]
3 Y. S. Kim, Trans. Electr. Electro. Mater., 16, 317 (2015). [DOI: http://dx.doi.org/10.4313/TEEM.2015.16.6.317]   DOI
4 S. G. Lee, H, M. Cho, J. D. Lee, and S. M. Park, J. Korean Inst. Electr. Electron. Mater. Eng., 18, 1111 (2005).
5 S. S. Kim, H. G. Cho, T. G. Park, C. H. Park, S. Y. Jung, and B. K. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 15, 190 (2002).
6 G. S. Kil, J. S. Han, J. Y. Song, M. J. Kim, J. B. Kim, and H. G. Cho, J. Tras. Korean Inst. Electr. Eng., 51C, 152 (2002).
7 J. H. Lee, J. S. Han, G. S. Kil, J. W. Kwon, D. Y. Song, and N. S. Choi, J. Korean Ins. Infor. Commu. Eng., 4, 793 (2000).
8 J. S. Han, M. Eng. Thesis, p. 35-51, Korea Maritime and Ocean University, Busan (2003).
9 G. S. Kil and Y. S. Kim, J. Korean Soc. Marine Eng., 21, 387 (1997).