• JSTS:Journal of Semiconductor Technology and Science
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• v.2 no.3
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• pp.226-232
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• 2002

This paper explains a technique to improve the fault coverage of oscillation-test [1-5] for linear analog circuits. The transient behavior of the virtual ground is monitored during oscillation to extract information of the circuit. The limitation of the oscillation-test is analyzed, and an efficient signature analysis technique is proposed to maximize the fault coverage. The experimental result proves that the parametric fault coverage can be significantly increased by the proposed technique.

• Journal of Power Electronics
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• v.14 no.2
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• pp.217-225
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• 2014

This paper deals with the optimization of the driving techniques for the ZVT synchronous buck converter proposed in [1]. Two new gate drive circuits are proposed to allow this converter to operate by only one control signal as a 12V voltage regulator module (VRM). Voltage-driven method is applied for the synchronous rectifier. In addition, the control signal drives the main and auxiliary switches by one driving circuit. Both of the circuits are supplied by the input voltage. As a result, no supply voltage is required. This approach decreases both the complexity and cost in converter hardware implementation and is suitable for practical applications. In addition, the proposed SR driving scheme can also be used for many high frequency resonant converters and some high frequency discontinuous current mode PWM circuits. The ZVT synchronous buck converter with new gate drive circuits is analyzed and the presented experimental results confirm the theoretical analysis.

• Journal of electromagnetic engineering and science
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• v.13 no.3
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• pp.141-150
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• 2013

Multiplexers based on isolation circuits made of metamaterial lines are proposed and studied. The new approach provides unique advantageous features beneficial to system designer. For instance, there is no need to modify the filters used in multiplexers. Also, the design process is straightforward. In this paper, two types of multiplexers based on metamaterial isolation circuits are presented, and their operation concepts are explained. Also, theories and design process of isolation circuits are presented to help readers design and fabricate proposed multiplexers. For verifying the concepts, two types of triplexers and two types of quadruplexers are designed and fabricated. All filters used in the multiplexers are commercial surface acoustic wave filters. The measured results are well matched with the simulation results.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.48 no.5
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• pp.339-343
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• 1999

This paper reports the characteristics of poly-Si TFT unitary CMOS circuits fabricated with various techniques, in order to investigate the optimum process conditions. The active films were deposited by PECVD and LPCVD using $SiH_4\; and\; Si_2H_6$ as source gas, and annealed by SPC and ELA methods. The impurity doping of the oource and drain electrodes was performed by ion implantation and ion shower. In order to investigate the AC characteristics of the poly-Si TFTs processed with various methods, we have examined the current driving characteristics of the polt-Si TFT and the frequency characteristics of 23-stage CMOS ring oscillators. Ithas been observed that the circuits fabricated using $Si_2H_6$ with low-temperature process of ELA exhibit high switching speed and current driving performances, thus suitable for real application of large area electronics.

• ETRI Journal
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• v.43 no.4
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• pp.728-745
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• 2021

Carbon nanotube field-effect transistors (CNTFETs) have been widely studied as a promising technology to be included in post-complementary metal-oxide-semiconductor integrated circuits. Despite significant advantages in terms of delay and power dissipation, the fabrication process for CNTFETs is plagued by fault occurrences. Therefore, developing a fast and accurate method for estimating the reliability of CNTFET-based digital circuits was the main goal of this study. In the proposed method, effects related to faults that occur in a gate's transistors are first represented as a probability transfer matrix. Next, the target circuit's graph is traversed in topological order and the reliabilities of the circuit's gates are computed. The accuracy of this method (less than 3% reliability estimation error) was verified through various simulations on the ISCAS 85 benchmark circuits. The proposed method outperforms previous methods in terms of both accuracy and computational complexity.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.81-84
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• 2004

Required characteristics of poly-Si TFT's are investigated for the implementation of analog circuits to be integrated on System-on-Glass (SoG). Matching requirements on resistor values, threshold voltage and mobility of poly-Si TFT's are derived as a function of the resolution of display system. Effective mobility of poly-Si TFT's required for the realization of source driver is analyzed for various panel sizes.

• Proceedings of the IEEK Conference
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• 2002.07b
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• pp.794-797
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• 2002

We consider a master-slave pulse-coupled network of bifurcating integrate-and-fire circuits. The network exhibits in-phase chaotic synchronization and various periodic synchronization phenomena. In order to analyze these phenomena precisely, we derive a one-dimensional return map. Also using a simple test circuit, typical phenomena are demonstrated in the laboratory.

• ETRI Journal
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• v.24 no.6
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• pp.473-476
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• 2002

This letter proposes an efficient kernel-based partitioning algorithm for reducing area and power dissipation in combinational circuit designs using don't-care sets. The proposed algorithm decreases power dissipation by partitioning a given circuit using a kernel extracted from the logic. The proposed algorithm also reduces the area overhead by minimizing duplicated gates in the partitioned sub-circuits. The partitioned subcircuits are further optimized utilizing observability don't-care sets. Experimental results for the MCNC benchmarks show that the proposed algorithm synthesizes circuits that on the average consume 22.5% less power and have 12.7% less area than circuits generated by previous algorithms based on a precomputation scheme.

• Journal of information and communication convergence engineering
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• v.15 no.4
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• pp.237-243
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• 2017

This paper presents an analysis of the electromagnetic interference of a heterogeneous power bus where electromagnetic bandgap (EBG) cells are irregularly arranged. To mitigate electrical-noise coupling between high-speed circuits, the EBG structure is placed between parallel plate waveguide (PPW)-based power buses on which the noise source and victim circuits are mounted. We examine a noise suppression characteristic of the heterogeneous power bus in terms of scattering parameters. The characteristics of the dispersion and scattering parameters are compared in the sensitivity analysis of the EBG structure. Electric field distributions at significant frequencies are thoroughly examined using electromagnetic simulation based on a finite element method (FEM). The noise suppression characteristics of the heterogeneous power bus are demonstrated experimentally. The heterogeneous power bus achieves significant reduction of electrical-noise coupling compared to the homogeneous power buses that are adopted in conventional high-speed circuit design. In addition, the measurements show good agreement with the FEM simulation results.

• Proceedings of the KIEE Conference
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• 1995.11a
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• pp.376-378
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• 1995

A method is presented for the design and fabrication of the temperature compensation circuits on the Clark electrodes for measuring the dissolved oxygen(DO) concentration. The discussion includes a method of the sensor interface circuits for the DO sensor. Typical polarograms for the DO probes under test using this sensor circuits are presented. High accuracy over 99 % of the I to V conversion using the proposed circuit is verified. Temperature dependence for the test DO probe is well compensated automatically using the thermistor($2k\Omega,\;25^{\circ}C$) in series with correction resistor in the feedback loop of the op-amp circuit in the temperature range of the 0-50$^{\circ}C$.