• 한국정보디스플레이학회:학술대회논문집
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• 2009.10a
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• pp.470-473
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• 2009

We have developed a novel driving method, Six times Rate Driving(SRD) for the purpose of making cost competitive TFT-LCD. By applying SRD method to an a-Si TFT-LCD, the driving rate was increased six times as it was named but the number of data lines and so its D-Ics were reduced to one sixth of the conventional one which resulted in the cost saving of that much. We also newly designed the gate driver in order to avoid any expansion of the bezel width caused by applying SRD. Our newly developed driving technology, SRD was successfully applied to 7.0-inch WSVGA (1024 ${\times}$ 600) TFT-LCD which can be driven with only one data D-IC and here introduced.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.389-392
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• 2004

A new dithering algorithm, "Hi-FRC", to enable full (16,777,216) color display on LCD panel with 6-bit source D-IC's is presented. The conventional FRC can display only 16,194,277 colors. In addition, The LCD panel with Hi-FRC can meet the color grayscale linearity of TCO '03 because it can improve the color shift problem.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.6
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• pp.111-118
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• 2008

In this paper, novel latch-up prevention method that employs power-up sequential switches has been proposed to relieve latch-up problem in liquid crystal display (LCD) driver ICs. These sequential switches are inserted in the 2'nd and 3'rd boosting stages, and are used to short the emitter-base terminals of parasitic p-n-p-n circuit before relevant boosting stages are activated during power-up sequence. To verily the performance of the proposed method, test chips were designed and fabricated in a 0.13-um CMOS process technology. The measurement results indicated that, while the conventional LCD driver If entered latch-up mode at $50^{\circ}C$ accompanying a significant amount of excess current, the driver IC adopting the proposed method showed no latch-up phenomenon up to $100^{\circ}C$ and maintained normal current level of 0.9mA.

• Proceedings of the KIPE Conference
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• 2004.07a
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• pp.321-324
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• 2004

This paper presents a package IC containing some components of DC/DC converter block for mobile phone's sub OLED(Organic Light Emitting Display). Package IC contains a load switch, a control IC, a diode, a switch for on/off operation, and a switch for changing output voltage. It operates with switching frequency of 100kHz, within the range of input voltage, $3.2V\~5.5V$. Duty ratio can be changed up to $93\%$, and maximum power efficiency is $85\%$. This package IC is loaded onto three model of 1.2W mobile phone's sub-OLED.

• Proceedings of the IEEK Conference
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• 2006.06a
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• pp.997-998
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• 2006

This paper proposes an design of the OLED(Organic Light Emitting Diodes) driver IC using novel verification method. This method using the HDL(hardware description language) simulator, PLI(Programing Language Interface) and image viewer. The proposed method can be used efficiently to function verification in display driver IC.

• 제어로봇시스템학회:학술대회논문집
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• 2001.10a
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• pp.107.3-107
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• 2001

This paper is concerned with the development of a simple digital stethoscope system for diagnosis of cardiac disorders. This system consists of an electronic stethoscope, IC sound recorder and a notebook computer. The cardiac sound is easily acquired by the electronic stethoscope and then recorded in IC memory stick so that the digital cardiac signal can be simply transmitted to the computer for signal display, disease diagnosis, and personal history record. A software is built with functions displaying the sound graphically and replaying the sound clearly. Further, a neural network recognition system for automatic diagnosis of cardiac disorders is also added to the software.

• 한국정보디스플레이학회:학술대회논문집
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• 2005.07a
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• pp.301-302
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• 2005

A low-power gate driver IC, which can be used for TFT-LCD application, is proposed. The short-circuit current of the output buffer is greatly reduced. An experimental prototype gate driver implemented in a $0.35-{\mu}m$ CMOS technology demonstrates that the power reduction of 16 % is obtained.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2008.10a
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• pp.592-595
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• 2008

This paper presents development of automatic image quality register optimization system using mobile TFT-LCD (Thin Film Transistor-Liquid Crystal Display) driver IC and embedded software. It optimizes automatically gamma adjustment and voltage setting registers in mobile TFT-LCD driver IC to improve gamma correction error, adjusting time, flicker noise and contrast ratio. Developed algorithms and embedded software are generally applicable for most of the TFT-LCD modules. The proposed optimization system contains module-under-test (MUT, TFT-LCD module), control program, multimedia display tester for measuring luminance, flicker noise and contrast ratio, and control board for interface between PC and TFT-LCD module. The control board is designed with DSP and FPGA, and it supports various interfaces such as RGB and CPU.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.47 no.3
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• pp.13-18
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• 2010

This work proposes and characterizes switched-capacitor type cyclic digital-to-analog converter for display data driving. The proposed digital-to-analog converter composes simple structure, and can be implemented for low-power, small area display driver ICs. By circuit level simulations, it is verified that the op-amp input referred offset is attenuated at the DAC output and the circuit performance is robust at 0.5% of capacitor mismatch.

• Journal of the Semiconductor & Display Technology
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• v.19 no.2
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• pp.82-87
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• 2020

In this paper, we introduce the novel idea to improve the B/W usage efficiency of on-chip networks used for TAM to test multiple DRAMs. In order to avoid the local bottleneck of test packets caused by an ATE, we make test patterns using microcode-based instructions within ATE and adopt a test bus to transmit test responses from DRAM DFT (Design for Testability) called Test Generator (TG) to ATE. The proposed test platform will contribute to increasing the test economics of memory IC industry.