• Journal of Sensor Science and Technology
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• v.26 no.4
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• pp.292-296
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• 2017

It has become ever harder to design reliable circuits with each nanometer technology node under normal operation conditions, a transistor device can be affected by various aging effects resulting in performance degradation and eventually design failure. The reliability (aging) effect has traditionally been the area of process engineers. However, in the future, even the smallest of variations can slow down a transistor's switching speed, and an aging device may not perform adequately at a very low voltage. Because of such dilemmas, the transistor aging is emerging as a circuit designer's problem. Therefore, in this paper, the impact of aging effects on the delay and power dissipation of digital circuits by using nanomneter MOSFET power gating structure has been analyzed.. Based on this analyzed aging models, a reliable digital circuits can be designed.

• Journal of KIISE:Software and Applications
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• v.32 no.1
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• pp.62-73
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• 2005

Evolvable Hardware is the technique that obtains target function by adapting reconfigurable digital' devices to environment in real time using evolutionary computation. It opens the possibility of automatic design of hardware circuits but still has the limitation to produce complex circuits. In this paper, we have analyzed the fitness landscape of evolvable hardware and proposed a speciation technique of evolving diverse individuals simultaneously, proving the efficiency empirically. Also, we show that useful extra functions can be obtained by analyzing diverse circuits from the speciation technique.

• Journal of the Korean Institute of Telematics and Electronics
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• v.24 no.2
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• pp.347-354
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• 1987

Timing simulators are widely used nowadays for analyzing large-scale MOS digital circuits, which, however, have several limitations such as nonconvergence and/or in accuracy for circuits containing tightly coupled feedback elements or loops. This paper describes a new timing simulator which aims at solving these problems. The algorithm employed is based on the wave-form relaxation method, but exploits the signal flow along the feedback loops. Each of feedback loops is treated as one circuit block and then local iterations are performed to enhance the timing simulation. With these techniques, out simulator can analyze the MOS digital circuits with up to 5-20 times of the magnitude speed improvemnets as compared to SPICE2, while maintaining the accuracy.

• Proceedings of the Korean Institute of Intelligent Systems Conference
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• 2003.09a
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• pp.58-61
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• 2003

This paper proposes e-Learning environments far digital circuit experiment. The e-Learning environments are implemented as a WBT system that includes the circuits monitoring system and the students management system. In the WBT client-server system, the instructor represents the server and students represent clients. The client computers are equipped with a digital circuit training board and connected to the server on the World Wide Web. The training board consists of a Programmable Logic Device (PLD) and measuring instruments. The instructor can reconfigure the PLD with various circuit designs from the server so that students can investigate signals from the training board. The instructor can monitor the progress of the students using Joint Test Action Grouo(JTAG) technology. We implement the WBT system and a courseware fo digital circuits and evaluation the environments.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.6
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• pp.230-238
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• 1996

In this paper, digital corrction and calibration circuit for a high-resolution CMOS pipelined A/D converter are proposed. The circuits were actually applied to a 12 -bit 4-stage pipelined A/D converter which was implemented in a 0.8${\mu}$m p-well CMOS process. The proposed digital correction logic is based on optimum multiplexer and two nonoverlapping clock phases resulting in a small die area snd a modular pipelined architecture. The propsoed digital calibration logic which consists of calibration control logic, error averaging logic, and memory can effectively perform self-calibration with little modifying analog functional bolcks of a conventional pipelined A/D conveter.

• Proceedings of the Korean Institute of Intelligent Systems Conference
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• 1993.06a
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• pp.968-971
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• 1993

Fuzzy inference system which inferences and processes the Fuzzy information is designed using digital voltage mode neural circuits. The digital fuzzification circuit is designed to MIN,MAX circuit using CMOS neural comparator. A new defuzzification method which uses the center of area of the resultant fuzzy set as a defuzzified output is suggested. The method of the center of area(C. O. A) search for a crisp value which is correspond to a half of the area enclosed with inferenced membership function. The center of area defuzzification circuit is proposed. It is a simple circuit without divider and multiflier. The proposed circuits are verified by implementing with conventional digital chips.

• Proceedings of the KIPE Conference
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• 2007.07a
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• pp.135-137
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• 2007

A phase shifted full-bridge PWM converter (PSFBC) has been used as the most popular topology for many applications. But, for the reasons of the cost and performance, the control circuits for the PSFBC have generally been implemented using analog circuits. The studies on the digital control of the PSFBC were recently presented. However, they considered only the digital implementation of the analog controller. This paper presents the modeling and design of the digital controller for the PSFBC in the discrete time domain. The discretized PSFBC model is first derived considering the sampling effect. Based on this model, the digital controller is directly designed in discrete time domain. The simulation and experimental results are provided to verify the proposed modeling and controller design.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.7
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• pp.584-592
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• 2003

6H-SiC MOSFETs and digital ICs have been fabricated and characterized. PMOS devices are fabricated on an n-type epilayer while the NMOS devices are fabricated on implanted p-wells. NMOS and PMOS devices use a thermally grown gate oxide. SiC MOSFETs are fabricated using different impurity activation methods such as high temperature and newly proposed laser annealing methods. Several digital circuits, such as resistive road NMOS inverters, CMOS inverters, resistive road NMOS NANDs and NORs are fabricated and characterized.

• Journal of The Korean Association of Information Education
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• v.13 no.3
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• pp.341-349
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• 2009

In this paper, we proposed an Electric Circuit manipulation method to identify easily results of Digital Logic Circuits. Using this method for computer science educations, we can feasibly instruct and understand principles of a Digital Logic Circuit which is a basis of real Digital systems. Furthermore, we developed an PBL-based education program for Digital Logic Circuit concept and Boolean Algebra concept by applying the proposed Electric Circuit manipulation method and by explaining real life Digital Instrument examples. The experimental results are analyzed in views of the problem-solving ability and suitability of allocating degrees of difficulties to the developed Digital Logic Circuit problems.

• Journal of information and communication convergence engineering
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• v.11 no.1
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• pp.56-61
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• 2013

Modern integrated circuits (ICs) are becoming an integrated parts of analog, digital, and radio frequency (RF) circuits. Testing these RF circuits on a chip is an important task, not only for fabrication quality control but also for tuning RF circuit elements to fit multi-standard wireless systems. In this paper, RF test circuits suitable for embedded testing are introduced: RF power detectors, power control circuits, directional couplers, and six-port reflectometers. Various types of embedded RF power detectors are reviewed. The conventional approach and our approach for the RF power control circuits are compared. Also, embedded tunable active directional couplers are presented. Then, six-port reflectometers for embedded RF testing are introduced including a 77-GHz six-port reflectometer circuit in a 130 nm process. This circuit demonstrates successful calibrated reflection coefficient simulation results for 37 well distributed samples in a Smith chart. The details including the theory, calibration, circuit design techniques, and simulations of the 77-GHz six-port reflectometer are presented in this paper.