• Journal of the Korean Magnetics Society
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• v.17 no.6
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• pp.246-252
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• 2007

This paper describes the effect of the mixing ratio of starting materials and the growth parameters of magnetic garnet films by LPE on the properties of the films and suggests the conditions to obtain the films suitable for the Faraday rotators of the optical CTs. The properties of the films investigated for the evaluation of the films were thickness, surface morphology, X-ray diffraction, lattice constant, lattice mismatch between film and substrate (single crystal nonmagnetic wafer), and Faraday rotation angle. Optical CTs have been fabricated and evaluated using the films grown.

• Journal of the Optical Society of Korea
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• v.17 no.5
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• pp.415-422
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• 2013

White-light phase-shifting interferometry (WLPSI) is widely recognized as a standard method to measure shapes with high resolution over a long distance. In practical applications, WLPSI, however, is associated with some degree of ambiguity of its phase, which occurs due to a phase delay, which is the offset between the phase of the fringes and the fringe envelope peak position. In this paper, a new algorithm is proposed for the determination of a fringe order suitable for samples in which the phase delay mainly occurs due to noise, diffraction and a steep angle. The concepts of the decouple factor and the connectivity are introduced and a method for calculating the decouple factor and the connectivity is developed. With the phase-unwrapping procedure which considers these values, it is demonstrated that our algorithm determines the correct fringe order. To verify the performance of the algorithm, a simulation was performed with the virtual step height under noise. Some specimens such as step height standard and a column spacer with a steep angle are also measured with a Mirau interference microscope, after which the algorithm is shown to be effective and robust.

• International Journal of Precision Engineering and Manufacturing
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• v.8 no.2
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• pp.20-25
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• 2007

This paper describes a second-generation dual sine-grid surface encoder for 2-D position measurements. The surface encoder consisted of a 2-D grid with a 2-D sinusoidal pattern on its surface, and a 2-D angle sensor that detected the 2-D profile of the surface grid The 2-D angle sensor design of previously developed first-generation surface encoders was based on geometric optics. To improve the resolution of the surface encoder, we fabricated a 2-D sine-grid with a pitch of $10{\mu}m$. We also established a new optical model for the second-generation surface encoder that utilizes diffraction and interference to generate its measured values. The 2-D sine-grid was fabricated on a workpiece by an ultra precision lathe with the assistance of a fast tool servo. We then performed a UV-casting process to imprint the sine-grid on a transparent plastic film and constructed an experimental setup to realize the second-generation surface encoder. We conducted tests that demonstrated the feasibility of the proposed surface encoder model.

• Korean Journal of Optics and Photonics
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• v.14 no.3
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• pp.244-248
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• 2003

When confocal lenses are applied to a digital holography system, the interference pattern of a larger object size can be recorded on CCD. The angle of incoming light to the CCD can be reduced by the ratio of the two focal lengths of confocal lenses. The recordable spatial frequency is limited by the unit cell size of the CCD. Therefore the spatial frequency of interference on the CCD is lowered by reduction of the incoming light angle. By using confocal lenses , another merit can be achieved that the area of the zero order diffraction is reduced by the square of the ratio of two focal lengths at the numerical reconstruction.

• International Journal of Advanced Culture Technology
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• v.10 no.4
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• pp.460-469
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• 2022

Increasing interest in the metaverse world these days, interest in realistic content such as 3D displays is growing. In particular, hologram images seen in movies provide viewers with an immersive display that cannot be seen in conventional 2D images. Since the first discovery of holography by Dennis Gabor in 1948, this technology has developed rapidly. Spatially, this beginning of technology like Optical hologram called analog hologram and Digital hologram such as computer-generated hologram (CGH). In analog and digital holograms, a recording angle and a recording wavelength are having important role when reproducing and display hologram. In the hologram, diffraction of light causes by unexpected formed by the synthesis from interference with object and reference light. When recording, the incident light information and mismatched reproduction light reconstruct the hologram in an undesirable direction. Reproduction light that is out of sync with incident light information with initial condition of recording will cause reconstructed image in an undesirable direction. Therefore, we analyze the holographic interference pattern generated by hologram recording in volume holograms using photopolymer and analyze the characteristics that vary depending on the angle of the reproduced light. This is expected to be used as a basic research on various holographic application that may cause as holograms are applied to industries in the future.

• Journal of the Korean Society of Radiology
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• v.12 no.1
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• pp.17-22
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• 2018

Multilayer mirrors are optical elements that can replace single crystal optical elements such as silicon or germanium, and they have artificial diffraction plane of a thickness of several nanometers. We examined the first Bragg angle and the reduction of reflectivity by variation of layer thickness in a W/Si multilayer mirror of small d-spacing. A W/Si multilayer mirror for an incidence angle of $0.55^{\circ}$ and an energy of 17.5 keV was designed and showed a maximum reflectivity of 72.67%. When the thickness of tungsten or silicon layer was simultaneously changed, the first Bragg angle was shifted and the reflectivity was reduced. When there was a change in thickness for one layer of W/Si multilayer, no change in the reflectivity was showed but the unevenness of the envelope was observed. Reduction of reflectivity was also observed at random Gaussian thickness variations. It is possible to predict the tolerance of multilayer mirror by examining the reflectivity degradation according to the thickness change in the W/Si multilayer mirror of small d-spacing.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.10 no.4
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• pp.318-323
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• 2000

The intercalated compounds of alkylsulfonates into hydrated zinc were synthesized. From the high temperature powder X-ray diffraction (HTXRD), FT-IR, and molecular size, the temperature dependence of orientation for the intercalated alkylsulfonates were determined. In the temperatures range 1, alkylsulfonates were intercalated into hexa aqua zinc layer with the bilayer structure of $32.9^{\circ}$angle for ${Zn(H_2O_4]^{2+}[C_nH_{2n+1}SO_3]_2\;^-$. In the temperatures range 2, alkylsulfonates were intercalated into tetra aqua zinc layer with the bilayer structure of $55.2^{\circ}$angle for ${Zn(C_nH_{2n+1}SO_3)_2$. In the temperatures range 3, alkylsulfonates were directly bonded to zinc ion with the bilayer structure of $76.5^{\circ}$angle for ${Zn(C_nH_{2n+1}SO_3)_2$.

• Transactions on Electrical and Electronic Materials
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• v.16 no.2
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• pp.95-98
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• 2015

Organic polymer dielectric thin films of styrene and vinyl acetate were prepared by the plasma polymerization deposition technique and applied for the fabrication of an organic thin film transistor device. The structural properties of the plasma polymerized thin films were characterized by Fourier-transform infrared spectroscopy, X-ray diffraction, atomic force microscopy, and contact angle measurement. Investigation of the electrical properties of the plasma polymerized thin films was carried out by capacitance-voltage and current-voltage measurements. The organic thin film transistor device with gate dielectric of the plasma polymerized thin film revealed a low operation voltage of −10V and a low threshold voltage of −3V. It was confirmed that plasma polymerized thin films of styrene and vinyl acetate could be applied to functional organic thin film transistor devices as the gate dielectric.

• Transactions on Electrical and Electronic Materials
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• v.13 no.4
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• pp.204-207
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• 2012

Epoxy nanocomposite was synthesized through the exfoliation of organoclay in an epoxy matrix, which was composed of diglycidyl ether of bisphenol A (DGEBA), 4,4'-methylene dianiline (MDA) and malononitrile (MN). Organoclay was prepared by treating the montmorillonite with octadecyl trimethyl ammonium bromide (ODTMA). The exfoliation of the organoclay was estimated by wide angle X-ray diffraction (WAXD) analysis. In order to measure the cure rate of DGEBA/MDA (30 phr)/MN (5 phr)/organoclay (3 phr), differential scanning calorimetry (DSC) analysis was performed at various heating rates, and the data were interpreted by Kissinger equation. Thermal degradation kinetics of the epoxy nanocomposite were studied by thermogravimetric analysis (TGA), and the data were introduced to the Ozawa equation. The activation energy for cure reaction was 45.8 kJ/mol, and the activation energy for thermal degradation was 143 kJ/mol.

• Transactions on Electrical and Electronic Materials
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• v.13 no.2
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• pp.85-88
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• 2012

Studies on the effects of layered silicate content on the AC electrical treeing and breakdown behaviors of epoxy/layered silicate nanocomposites were carried out in needle-plate electrode geometry. Wide-angle X-ray diffraction (WAXD) analysis and transmission electron microscopy (TEM) observation showed that 1 wt% of the multilayered silicate was fully exfoliated into nano-sized monolayers in the epoxy matrix however, over 3 wt% of the silicate was in an intercalated state. When 1 wt% layered silicates were incorporated, an electrical tree was initiated in 439 min and propagated at a speed of 2.3 ${\mu}m$/min after applying 781.4 kV/mm, representing a decreased in starting initiation time by a factor of 11.0 and increase in propagation speed by a factor 8.2 in comparison with neat epoxy resin. These values were in great decline after the layered silicate content was increased to 3wt% which implies that the exfoliated silicate blocked the tree initiation and propagation processes effectively. However the effect was largely decreased in the intercalated state.