• KIPS Transactions on Software and Data Engineering
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• v.10 no.9
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• pp.339-348
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• 2021

In recent software defect prediction research, defect prediction between cross projects and cross-version projects are actively studied. Cross-version defect prediction studies assume WP(Within-Project) so far. However, in the CV(Cross-Version) environment, the previous work does not consider the distribution difference between project versions is important. In this study, we propose an automated Bayesian optimization framework that considers distribution differences between different versions. Through this, it automatically selects whether to perform transfer learning according to the difference in distribution. This framework is a technique that optimizes the distribution difference between versions, transfer learning, and hyper-parameters of the classifier. We confirmed that the method of automatically selecting whether to perform transfer learning based on the distribution difference is effective through experiments. Moreover, we can see that using our optimization framework is effective in improving performance and, as a result, can reduce software inspection effort. This is expected to support practical quality assurance activities for new version projects in a cross-version project environment.

• Journal of the Semiconductor & Display Technology
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• v.19 no.4
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• pp.59-64
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• 2020

In this paper, we found the solution using data based machine learning regression method to check the pore shape, to solve the problem of the experiment quantity occurring when producing scaffold with the 3d printer. Through experiments, we learned secured each print condition and pore shape. We have produced the scaffold from scaffold pore shape defect prediction model using multiple linear regression method. We predicted scaffold pore shapes of unsecured print condition using the manufactured scaffold pore shape defect prediction model. We randomly selected 20 print conditions from various predicted print conditions. We print scaffold five times under same print condition. We measured the pore shape of scaffold. We compared printed average pore shape with predicted pore shape. We have confirmed the prediction model precision is 99 %.

• Journal of Korean Institute of Industrial Engineers
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• v.21 no.3
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• pp.371-385
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• 1995

The yield of semiconductor chips is dependent not only on the average defect density but also on the distribution of defects over a wafer. The distribution of defects leads to consider a cluster index. This paper briefly reviews the existing yield prediction models ad proposes a new cluster index, which utilizes the information about the defect location on a wafer in terms of the coefficient of variation. An extensive simulation is performed under a variety of defect distributions and a yield prediction model is derived through the regression analysis to relate the yield with the proposed cluster index and the average number of defects per chip. The performance of the proposed simulation-based yield prediction model is compared with that of the well-known negative binomial model.

• Journal of the Korean Data and Information Science Society
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• v.19 no.2
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• pp.609-620
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• 2008

There may be several parallel equipments having the same function in a multi-stage manufacturing process, which affect the product quality differently and have significant differences in defect rate. The product quality may depend on what equipments it has been processed as well as what process variable values it has. Applying one model ignoring the presence of different equipments may distort the prediction of defect rate and the identification of important quality variables affecting the defect rate. We propose a procedure for data segmentation when constructing models for predicting the defect rate or for identifying major process variables influencing product quality. The proposed procedure is based on the principal component analysis and the analysis of variance, which demonstrates a better performance in predicting defect rate through a case study with a PDP manufacturing process.

• KIPS Transactions on Software and Data Engineering
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• v.7 no.6
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• pp.205-220
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• 2018

Software defect prediction is helpful for allocating valuable project resources effectively for software quality assurance activities thanks to focusing on the identified fault-prone modules. If historical data collected within a company is sufficient, a Within-Project Defect Prediction (WPDP) can be utilized for accurate fault-prone module prediction. In case a company does not maintain historical data, it may be helpful to build a classifier towards predicting comprehensible fault prediction based on Cross-Project Defect Prediction (CPDP). Since CPDP employs different project data collected from other organization to build a classifier, the main obstacle to build an accurate classifier is that distributions between source and target projects are not similar. To address the problem, because it is crucial to identify effective similarity measure techniques to obtain high performance for CPDP, In this paper, we aim to identify them. We compare various similarity measure techniques. The effectiveness of similarity weights calculated by those similarity measure techniques are evaluated. The results are verified using the statistical significance test and the effect size test. The results show k-Nearest Neighbor (k-NN), LOcal Correlation Integral (LOCI), and Range methods are the top three performers. The experimental results show that predictive performances using the three methods are comparable to those of WPDP.

• Journal of KIISE:Computing Practices and Letters
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• v.15 no.8
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• pp.596-600
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• 2009

To support an efficient management of software verification and validation activities, many defect prediction models have been proposed based on object oriented metrics. They usually adopt logistic regression analysis, And, they state that the correctness of prediction is about 60${\sim}$70%, We performed a similar experiment with Eclipse 3.3 to check their prediction effectiveness, However, the result shows that correctness is about 40% which is much lower than the original results. We also found that univariate logistic regression analysis produces better results than multivariate logistic regression analysis.

• Journal of the Korean Society for Nondestructive Testing
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• v.27 no.5
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• pp.383-392
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• 2007

In this paper, we study the prediction of depth and width of a defect in steam generator tube in nuclear power plant using neural network. To this end, we first generate eddy current testing (ECT) signals for 4 defect patterns of SG tube: I-In type, I-Out type, V-In type, and V-Out type. In particular, we generate 400 ECT signals for various widths and depths for each defect type by the numerical analysis program based on finite element modeling. From those generated ECT signals, we extract new feature vectors for the prediction of defect size, which include the angle between the two points where the maximum impedance and half the maximum impedance are achieved. Using the extracted feature vector, multi-layer perceptron with one hidden layer is used to predict the size of defects. Through the computer simulation study, it is shown that the proposed method achieves decent prediction performance in terms of maximum error and mean absolute percentage error (MAPE).

• International Journal of Computer Science & Network Security
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• v.22 no.10
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• pp.11-16
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• 2022

Applying predictive analytics to predict software defects has improved the overall quality and decreased maintenance costs. Many supervised and unsupervised learning algorithms have been used for defect prediction on publicly available datasets. Most of these datasets suffer from an imbalance in the output classes. We study the impact of class imbalance in the defect datasets on the efficiency of the defect prediction model and propose a CPP method for handling imbalances in the dataset. The performance of the methods is evaluated using measures like Matthew's Correlation Coefficient (MCC), Recall, and Accuracy measures. The proposed sampling technique shows significant improvement in the efficiency of the classifier in predicting defects.

• International Journal of Computer Science & Network Security
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• v.22 no.10
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• pp.1-10
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• 2022

Nowadays software defect prediction (SDP) is most active research going on in software engineering. Early detection of defects lowers the cost of the software and also improves reliability. Machine learning techniques are widely used to create SDP models based on programming measures. The majority of defect prediction models in the literature have problems with class imbalance and high dimensionality. In this paper, we proposed Centroid and Nearest Neighbor based Class Imbalance Reduction (CNNCIR) technique that considers dataset distribution characteristics to generate symmetry between defective and non-defective records in imbalanced datasets. The proposed approach is compared with SMOTE (Synthetic Minority Oversampling Technique). The high-dimensionality problem is addressed using Ant Colony Optimization (ACO) technique by choosing relevant features. We used nine different classifiers to analyze six open-source software defect datasets from the PROMISE repository and seven performance measures are used to evaluate them. The results of the proposed CNNCIR method with ACO based feature selection reveals that it outperforms SMOTE in the majority of cases.

• Proceedings of the Korean Institute of Building Construction Conference
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• 2022.11a
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• pp.223-224
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• 2022

The occurrence of defect, one of the major risk elements, gives rise to construction delays and additional costs. Although construction companies generally prefer to use a method of identifying and classifying the causes of defects, a system for predicting the rise of defects becomes important matter to reduce this harmful issue. However, the currently used methods are kinds of reactive systems that are focused on the defects which occurred already, and there are few studies on the occurrence of defects with prediction systems. This paper is about preliminary study on the development of judgemental algorithm that informs us whether additional works related to defect issue are needed or not. Among machine learning techniques, deep neural network was utilized as prediction model which is a major component of algorithm. It is the most suitable model to be applied to the algorithm when there are 8 hidden layers and the average number of nodes in each hidden layer is 70. Ultimately, the algorithm can identify and defects that may arise in later and contribute to minimize defect frequency.