• Current Optics and Photonics
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• v.4 no.3
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• pp.193-199
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• 2020

In this paper we propose a dark-field digital holographic microscopy system based on 360-degree oblique illumination. This setup is constructed without using a dark-field objective. The principle of 360-degree oblique illumination of vortex beam and dark-field digital holographic microscopy are introduced theoretically and experimentally. By analyzing the reconstructed image of a dark-field digital hologram of a USAF 1951 target, it is proved that the imaging resolution can be improved by this method. And also, comparison and analysis are made on the reconstructed image of a bright-dark field digital hologram of a pumpkin stem slice, the result shows that the imaging contrast is also enhanced with this method, and it is effective for dark-field digital holographic microscopy imaging of large transparent biological samples.

• Proceedings of the Korea Association of Crystal Growth Conference
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• 1997.06a
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• pp.219-222
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• 1997

The principle of dark field imaging is comprehensively discussed using real images of dislocations, stacking faults and gettering phenomena due to defects obtained by Cz Si wafers and LEC semi-insulating GaAs crystals. Resulution of dark field imaging is improved by Fourier transformation of Fraunhofer diffraction pattern obtained at an out-of focusing position of an objective lens.

• Applied Microscopy
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• v.45 no.1
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• pp.23-31
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• 2015

Dark field (DF) transmission electron microscopy image has become a popular characterization method for two-dimensional material, graphene, since it can visualize grain structure and multilayer islands, and further provide structural information such as crystal orientation relations, defects, etc. unlike other imaging tools. Here we present microstructure of graphene, particularly, using DF imaging. High-angle grain boundary formation wass observed in heat-treated chemical vapor deposition-grown graphene on the Si substrate using patch-quilted DF imaging processing, which is supposed to occur by strain around multilayer islands. Upon the crystal orientation between layers the multilayer islands were categorized into the oriented one and the twisted one, and their local structure were compared. In addition information from each diffraction spot in selected area diffraction pattern was summarized.

• Current Optics and Photonics
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• v.5 no.1
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• pp.40-44
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• 2021

In this paper, LED arrays with segmented mirrors and a mask are presented as a new dark-field illuminator for reflective Fourier ptychographic microscopy (FPM). The illuminator can overcome the limitations of the size and the position of samples that the dark-field illuminator using a parabolic mirror has had. The new concept was demonstrated by measuring a USAF 1951 target, and it resolved a pattern in group 10 element 6 (274 nm) in the USAF target. The new design of the dark-field illuminator can enhance competitiveness of the reflective FPM as a versatile measurement method in industry.

• Applied Microscopy
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• v.41 no.3
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• pp.215-222
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• 2011

We discuss the experimental procedure for extracting reliable phase information from a defocus series of transmission electron microscopy (TEM) dark-field images using the transport of intensity equation (TIE). Taking InGaN/GaN multi-quantum well light-emitting diode as a model system, various factors affecting the final result of reconstructed phase such as TEM sample preparation, TEM imaging condition, image alignment, the correction of defocus values and the use of high frequency pass filter are evaluated. The obtained phase of wave function was converted to the geometric phase of the corresponding lattice planes, which was then used for the two-dimensional mapping of lattice strain following the dark-field inline holography (DIH) routine. The strain map obtained by DIH after optimized image processing is compared with that obtained by the geometric phase analysis of high resolution TEM (HRTEM) image, manifesting that DIH yields more accurate and reliable strain information than HRTEM-based GPA.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.06a
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• pp.192-193
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• 2006

The wet coating process could easily be made from large area film with printing paste mixed with semiconductor and binder material at room temperature. Semiconductor film fabricated about 25mm thickness was evaluated by field emissions-canning electron microscopy (FE-SEM). X-ray performance data such as dark current, sensitivity and signal to noise ratio (SNR) were evaluated. The $Hgl_2$ semiconductor was shown in much lower dark current than the others, but the best sensitivity. In this paper, reactivity and combination character of semiconductor and binder material that affect electrical and X-ray detection properties would prove out though experimental results.

• Journal of IKEEE
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• v.22 no.3
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• pp.585-589
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• 2018

Consumer demand for high quality image/video services led to growing trend in image quality enhancement study. Therefore, recent years was a period of substantial progress in this research field. Through careful observation of the image quality after processing by image enhancement algorithms, we perceived that the dark region in the image usually suffered loss of contrast to a certain extent. In this paper, the low-light stretch preprocessing algorithm is, hence, proposed to resolve the aforementioned issue. The proposed approach is evaluated qualitatively and quantitatively against the well-known histogram equalization and Photoshop curve adjustment. The evaluation results validate the efficiency and superiority of the low-light stretch over the benchmarking methods. In addition, we also propose the 255MHz-capable hardware implementation to ease the process of incorporating low-light stretch into real-time imaging systems, such as aerial surveillance and monitoring with drones and driving aiding systems.

• Journal of radiological science and technology
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• v.38 no.1
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• pp.39-49
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• 2015

One of properties which X-ray and Neutron can be applied nondestructive test is penetration into the object with interaction leads to decrease in intensity. X-ray interaction with the matter caused by electrons, Neutron caused by atoms. They share applications in nondestructive test area because of their similarities of interaction mechanism. Grating interferometer is the one of applications produces phase contrast image and dark field image. It is defined by Talbot interferometer and Talbot-Lau interferometer according to Talbot effect and Talbot-Lau effect respectively. Talbot interferometer works with coherence beam like X-ray, and Talbot-Lau has an effect with incoherence beam like Neutron. It is important to expect the interference in grating interferometer compared normal nondestructive system. In this paper, simulation works are conducted according to Talbot and Talbot-Lau interferometer in case of X-ray and Neutron. Variation of interference intensity with X-ray and Neutron based on wave theory is constructed and calculate elements consist the system. Additionally, Talbot and Talbot-Lau interferometer is simulated in different kinds of conditions.

• The Bulletin of The Korean Astronomical Society
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• v.40 no.1
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• pp.84.3-85
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• 2015

We report a small-scale EUV bright loop associated with the evolution of the fine-scale magnetic discontinuity in the photosphere. Our analysis was carried out by using the high spatial resolution data taken with InfraRed Imaging Magnetograph (IRIM) and the Fast Imaging Solar Spectrograph (FISS). As a result, an extremely narrow dark lane of the intense horizontal magnetic field (width ~ 300 km) is detected parallel to the boundary of the magnetic pore, which is one of the footpoints of the small-scale bright coronal loop. We find that the variation of the net linear polarization inside the dark lane is closely related to the intensity variations of the coronal loop. Based on our results, we suggest that small-scale atmospheric heating such as bright coronal loop seen above the complex pore group may be strongly affected by the evolution of the fine-scale magnetic discontinuity in the photosphere. This is a nice example of solar atmospheric heatings associated with the fine-scale magnetic discontinuity in the photosphere.

• Proceedings of the Korean Geotechical Society Conference
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• 2010.03a
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• pp.1324-1333
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• 2010

This paper is used in a recent civil engineering field in three-dimensional laser-meter tiles using thermal imaging cameras for the weathered rock slopes precisely measured indirectly, to the degree that began in the will. In the field is difficult to access the degree of weathering of the rock slope to the existing direct way to compensate for the shortcomings of 3D Terrestrial Laser Scanner and weathering characteristics of rocks using thermal imaging cameras to get the information to analyze the degree of rock weathering is. Intensity of 3D TLS and the thermal camera with image analysis to analyze the degree of weathering of bedrock in the field of core drilling targeting indoor laboratory tests were analyzed through the study. Granite, gneiss, sandstone, much of the cancerous samples, each experiment has a 40 per category, each of which 30 were used to analyze the data collected. That degree of rock weathering, the rock, depending on the strength of the Intensity values can change, depending on the level of thermal imaging camera, also weathered the changes in temperature could see. Intensity is the strength of weak rocks, the more value decrease, the temperature of the thermal imaging camera through the swell Intensity and notice that the temperature had an inverse relationship. Intensity value of the low strength of weak rock, but the value came out of the rocks have been proved to be largely dependent on the contrast. The contrast of the surface rocks are weathered dark Intensity values lower temperature to swell the contrary, the degree of weathering can be distinguished.