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Koch CT, Ozdol VB, van Aken PA: An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices. Appl Phys Lett 96 : 091901, 2010.
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Koch CT, Single W, Hoschen R, Ruhle M, Essers E, Benner G, Matijevic M: SESAM: Exploring the frontiers of electron microscopy. Microsc Microanal 12 : 506-514, 2006.
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Mitome M, Ishizuka K, Bando Y: Quantitativeness of phase measurement by transport of intensity equation. J Elec Micro 59(1) : 33-41, 2010.
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Ozdol VB, Koch CT, van Aken PA: A non damaging electron microscopy approach to map In distribution in InGaN light-emitting diodes. J Appl Phys 108 : 056103-3, 2010.
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Allen LJ, Oxley MP, Ishizuka K: Electron microscope Cs correction using iterative wave-function reconstruction. Microscopy and Analysis 52 : 5-7, 2006.
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Hytch MJ, Houdellier F, Hue F, Snoeck E: Nanoscale holographic interferometry for strain measurements in electronic devices. Nature 453 : 1086-1090, 2008.
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Ishizuka K, Allman B: Phase measurement of atomic resolution image using transport of intensity equation. J Elec Micro 54(3) : 191-197, 2005.
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Koch CT: A flux-preserving non-linear inline holography reconstruction algorithm for partially coherent electrons. Ultramicroscopy 108 : 141-150, 2008.
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