• 조명전기설비학회논문지
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• 제25권8호
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• pp.82-87
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• 2011

Induction motor is most widely used as the driving power in the industrial site. Induction motor current is composed of two parts, magnetizing current and load current. Load current uses energy what is doing the work. Load current varies with load variance but magnetizing current is constant, regardless of load variation. Magnetizing current needs for establishing the rotating magnetic field of induction motor and lags behind the voltage. Generally capacitor is used for power-factor compensation of inductive load. Self-excitation occurs when the capacitive reactive current from the capacitor is greater than the magnetizing current of the induction motor. When this occurs, excessive voltages can result on the terminals of the motor. This excessive voltage can cause insulation degradation and ultimately result in motor insulation failure. In this paper, we analyzed that how the magnetizing current and condenser current is operating at the allowable limit by the load variation. Condenser current is below allowable limit of magnetizing current but magnetizing current is above allowable limit at the lower load operation condition.

• JSTS:Journal of Semiconductor Technology and Science
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• 제4권4호
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• pp.269-274
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• 2004

Current delivery system, in which the analog current produced by a unique DAC circuit is stored into a current-memory circuit and delivered in a time-divided sequence, shows variation of output current as low as 4% in a current source data-driver IC for AM-OLED driven by a current-programmed method without any fuse repairing after fabrication. This driver IC has 54 outputs and can sink constant current as low as 3 ${\mu}A$ with 6-bit analog levels. Such a low current level without variation can hardly be obtained by an ordinary MOS transistor because the current level is in the sub-threshold region and changes exponentially with threshold voltage variation. Thus we adopted a current mirror circuit composed of bipolar transistors to supply well-controlled current within a nano-ampere range.

• Journal of information and communication convergence engineering
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• 제7권1호
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• pp.57-61
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• 2009

This paper has presented the subthreshold current model of FinFET using the potential variation in the doped channel based on the analytical solution of three dimensional Poisson's equation. The model has been verified by the comparison with the data from 3D numerical device simulator. The variation of subthreshold current with front and back gate bias has been studied. The variation of subthreshold swing and threshold voltage with front and back gate bias has been investigated.

• 한국환경과학회지
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• 제12권9호
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• pp.943-948
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• 2003

Variation of the polar front in the East Sea is studied using temperature and dissolved oxygen data obtained from Japan Meteorological Agency from 1972 to 1999. Variation of the polar front in the East Sea has a close relation to the variation of the Tsushima Warm Current (TWC). When the TWC spreads widely in the East Sea, polar front moves northward. The spatial variation of the polar front is greater in the southwestern area of the East Sea and the northern area of Tsugaru Strait where the variation of the TWC's distribution area is greater than those in others of the East Sea. Hence, in the southeastern area of the East Sea, that is, between near Noto peninsula and Tsugaru Strait, the spatial variation of the polar front is not so wide as in the southwestern area because the flow of TWC is stable.

• 전기학회논문지
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• 제57권8호
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• pp.1470-1477
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• 2008

In this paper, a new detection method of series arc-fault signals occurring at the wiring of home appliances is proposed. The discrete wavelet transform was used for the numerical analysis of the variation rate in peak, RMS, noise energy, shoulder of the arc-fault current wave. As a results, the arc distinction threshold value of these variation rates was about 0.1 in most cases. The arc-fault current of the loads with the active PFC circuit showed a high rate of variation in noise energy and shoulder, but arc-fault current of the loads without the active PFC circuit showed a high rate of variation in peak and RMS. The arc fault current in resistive loads showed a high rate of variation in shoulder.

• 한국정보기술학회 영문논문지
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• 제8권2호
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• pp.59-67
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• 2018

The minimum power supply voltage of a typical bandgap current reference (BGCR) is limited by operating temperature and input common mode range (ICMR) of a feedback amplifier. A new BGCR using a bandgap voltage generator (BGVG) is proposed to minimize the effect of temperature, supply voltage, and process variation. The BGVG is designed with proportional to absolute temperature (PTAT) characteristic, and a feedback amplifier is designed with weak-inversion transistors for low voltage operation. It is verified with a $0.18-{\mu}m$ CMOS process with five corners for MOS transistors and three corners for BJTs. The proposed circuit is superior to other reported current references under temperature variation from $-40^{\circ}C$ to $120^{\circ}C$ and power supply variation from 1.2 V to 1.8 V. The total power consumption is $126{\mu}W$ under the conditions that the power supply voltage is 1.2 V, the output current is $10{\mu}A$, and the operating temperature is $20^{\circ}C$.

• 대한전자공학회논문지SD
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• 제46권8호
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• pp.79-85
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• 2009

본 논문에서는 온도 및 공정 보상 전류 미러(temperature and process compensation current mirror: TPC-CM)를 이용한 정밀 전류 레퍼런스를 제안하였다. 온도 변화에 영향을 받지 않는 기준 전류는 절대 온도에 비례하여 증가하는 PTAT (proportional to absolute temperature) 전류와 온도에 반비례하여 감소하는 CTAT(complementary to absolute temperature) 전류의 합으로 생성된다. 그러나 온도 계수(temperature coefficient)와 기준 전류의 크기는 공정 변화에 크게 영향을 받는다. 이런 공정 변화를 보정하기 위하여, 제안된 TPC-CM에서는 온도 계수와 기준 전류의 크기를 조절하는 두 개의 이진 가중치 전류 미러(binary weighted current mirror)를 이용하였다. 제작된 각 칩마다 PTAT 전류와 CTAT 전류를 측정한 후, 기준 전류의 크기가 온도에 상관없이 일정하도록, TPC-CM의 스위치 코드를 결정하고 그 값을 비휘발성 메모리에 저장한다. 시뮬레이션에서 TPC-CM는 공정변화 영향을 19.7%에 서 0.52%로 줄였다. 제안된 전류 레퍼런스는 3.3V 0.35um CMOS 공정을 이용하여 제작되었으며, 측정된 칩의 기준 전류 변화율은 $20^{\circ}$C${\sim}$100$^{\circ}$C에서 0.42%였다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제15권2호
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• pp.184-193
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• 2015

This paper proposes a cost-efficient and automatic method for large data acquisition from a test chip without expensive equipment to characterize random process variation in an integrated circuit. Our method requires only a test chip, a personal computer, a cheap digital-to-analog converter, a controller and multimeters, and thus large volume measurement can be performed on an office desk at low cost. To demonstrate the proposed method, we designed a test chip with a current model logic driver and an array of 128 current mirrors that mimic the random process variation of the driver's tail current mirror. Using our method, we characterized the random process variation of the driver's voltage due to the random process variation on the driver's tail current mirror from large volume measurement data. The statistical characteristics of the driver's output voltage calculated from the measured data are compared with Monte Carlo simulation. The difference between the measured and the simulated averages and standard deviations are less than 20% showing that we can easily characterize the random process variation at low cost by using our cost-efficient automatic large data acquisition method.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2002년도 하계학술대회 논문집 B
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• pp.770-772
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• 2002

In this paper, the eddy current sensor is develped for observing the ability of detecting defect with variation of frequency and velocity. The circuit designed for processing detected voltage and changing frequency is used for eddy current sensor to detect defect with variation of frequency. The ability of eddy current sensor to detect defects is studied with variation of velocity adjusted by rotating the circular plate. This study shows that the ability of eddy current sensor for detecting defect is increased and decreased by frequency. This fact means that the sensor has its best ability at a certain frequency. And the ability of eddy current sensor by velocity is decreased by increased velocity. Therefore, the eddy current sensor has to be developed with consideration of its operation velocity and frequency.

• 한국지하수토양환경학회:학술대회논문집
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• 한국지하수토양환경학회 2000년도 추계학술대회
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• pp.302-306
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• 2000

In case of applying electrokinetic remediation, magnitude of electric current is one of major factors for estimation of contaminant transport. In practice, electric current provide determination of electric conductivity based on specimen resistance. Electric current variation is produced during Electrokinetic remediation test. Electric current is decreased by expotential function according to time in condition of constant voltage. This can be interpreted as precipitation effect by OH$^{-10}$ generation in a cathode.