• 제목/요약/키워드: Control Chart

검색결과 702건 처리시간 0.027초

비정규 공정에서의 누적합 관리도 적용에 관한 연구 (A Study on the Application of CUSUM Control Charts under Non-normal Process)

  • 김종걸;엄상준;최성원
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2011년도 추계학술대회
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    • pp.535-549
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    • 2011
  • Control chart is most widely used in SPC(Statistical Process Control), Recently it is a critical issue that the standard control chart is not suitable to non-normal process with very small percent defective. Especially, this problem causes serious errors in the reliability procurement, such as semiconductor, high-precision machining and chemical process etc. Procuring process control technique for non-normal process with very small percent defective and perturbation is becoming urgent. Control chart technique in non-normal distribution become very important issue. In this paper, we investigate on research trend of control charts under non-normal distribution with very small percent defective and perturbation, and propose some variable-transformation methods applicable to CUSUM control charts in non-normal process.

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SFC로 설계된 공정제어에서 Remote Control에 의한 선택 시퀀스 제어 방법 (A Method of Select Sequence Control by Remote Control in Process Control designed by SFC)

  • 유정봉
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2007년도 심포지엄 논문집 정보 및 제어부문
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    • pp.134-136
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    • 2007
  • Sequential Function Chart(SFC) is very easy to grasp the sequential flow of control logic and has the compatability for a maintenance, In process control, when an error is occurred, to execute other routine by force, we control the process by remote control. In this paper, we proposed the method of select sequence control by remote control in process control designed by Sequential Function Chart(SFC).

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변량표본크기와 변량표본추출구간을 이용한$\bar{X}$관리도의 경제적 설계 (An Economic Design of $\bar{X}$ Control Charts with Variable Sample Size and Sampling Interval)

  • 김계완;윤덕균
    • 품질경영학회지
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    • 제28권3호
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    • pp.18-30
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    • 2000
  • Recent studies have shown that the $\bar{X}$ chart with variable sampling intervals(VSI) and the $\bar{X}$ chart with variable sample size(VSS) are much quicker than Shewhart $\bar{X}$ chart in detecting shiks in the process. Shewhart $\bar{X}$ chart has been beneficial to detect large shifts but it is hard to apply Shewhart $\bar{X}$ chart in detecting moderate shifts in the process mean. In this article the $\bar{X}$ chart using variable sample size(VSS) and variable sampling Intervals(VSI) has been proposed to supplement the weak point mentioned above. So the purpose of this paper is to consider finding the design parameters which minimize expected loss costs for unit process time and measure the performance of VSSI(variable sample size and sampling interval) $\bar{X}$ chart. It is important that assignable causes be detected to maintain the process controlled. This paper has been studied under the assumption that one cycle is from starting of the process to eliminating the assignable causes in the process. The other purpose of this article is to represent the expected loss costs in one cycle with three process parameters(sample size, sampling interval and control limits) function and find the three parameters.

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A Note on the Robustness of the X Chart to Non-Normality

  • Lee, Sung-Im
    • Communications for Statistical Applications and Methods
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    • 제19권5호
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    • pp.685-696
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    • 2012
  • These days the interest of quality leads to the necessity of control charts for monitoring the process in various fields of practical applications. The $\overline{X}$ chart is one of the most widely used tools for quality control that also performs well under the normality of quality characteristics. However, quality characteristics tend to have nonnormal properties in real applications. Numerous recent studies have tried to find and explore the performance of $\overline{X}$ chart due to non-normality; however previous studies numerically examined the effects of non-normality and did not provide any theoretical justification. Moreover, numerical studies are restricted to specific type of distributions such as Burr or gamma distribution that are known to be flexible but can hardly replace other general distributions. In this paper, we approximate the false alarm rate(FAR) of the $\overline{X}$ chart using the Edgeworth expansion up to 1/n-order with the fourth cumulant. This allows us to examine the theoretical effects of nonnormality, as measured by the skewness and kurtosis, on $\overline{X}$ chart. In addition, we investigate the effect of skewness and kurtosis on $\overline{X}$ chart in numerical studies. We use a skewed-normal distribution with a skew parameter to comprehensively investigate the effect of skewness.

와이블 고장모형 하에서의 이중샘플링 T2 관리도의 경제적-통계적 설계 (이중샘플링 T2 관리도의 경제적-통계적 설계) (Economic-Statistical Design of Double Sampling T2 Control Chart under Weibull Failure Model)

  • 홍성옥;이민구;이주호
    • 품질경영학회지
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    • 제43권4호
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    • pp.471-488
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    • 2015
  • Purpose: Double sampling $T^2$ chart is a useful tool for detecting a relatively small shift in process mean when the process is controlled by multiple variables. This paper finds the optimal design of the double sampling $T^2$ chart in both economical and statistical sense under Weibull failure model. Methods: The expected cost function is mathematically derived using recursive equation approach. The optimal designs are found using a genetic algorithm for numerical examples and compared to those of single sampling $T^2$ chart. Sensitivity analysis is performed to see the parameter effects. Results: The proposed design outperforms the optimal design of the single sampling $T^2$ chart in terms of the expected cost per unit time and Type-I error rate for all the numerical examples considered. Conclusion: Double sampling $T^2$ chart can be designed to satisfy both economic and statistical requirements under Weibull failure model and the resulting design is better than the single sampling counterpart.

순환주기나 빈번한 작은 이동이 발생하는 공정관리틀 위한 Z-CUSUM 관리도 (The Z-CUSUM Control Chart for the Process with Recurring Cycles or Frequent Small Shifts)

  • 강해운;강창욱;백재원
    • 품질경영학회지
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    • 제32권2호
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    • pp.132-153
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    • 2004
  • CUSUM control charts are widely used to monitor processes with small shifts. CUSUM control charts are, however, less effective in detecting for recurring cycles or frequent small shifts in the processes. With Shewhart control charts, we have applied the variety of run rules to check the stability of process in addition to the situations that some points fall outside the control limits. In this paper, we propose the Z -CUSUM control chart for monitoring the process with recurring cycles or frequent small shifts by use of the zone concept as like the Shewhart control charts.

순환 주기나 빈번한 작은 이동이 발생하는 공정관리를 위한 Z-CUSUM 관리도 (The Z-CUSUM Control Chart for the Process with Recurring Cycles or Frequent Small Shifts)

  • 강해운;강창욱;백재원
    • 한국품질경영학회:학술대회논문집
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    • 한국품질경영학회 2004년도 품질경영모델을 통한 가치 창출
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    • pp.57-63
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    • 2004
  • CUSUM control charts are widely used to monitor processes with small shifts. CUSUM control charts, however, are less effective in detecting for recurring cycles or frequent small shifts in the process. With Shewhart control charts, we have applied the variety of run rules to check the stability of process in addition to the situations that some points fall outside the control limits. In this paper, we propose the Z-CUSUM control chart for monitoring the process with recurring cycles or frequent small shifts by use of the zone concept as like the Shewhart control charts.

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비정규 공정을 위한 공정관리도의 연구동향 분석 (Research Results and Trends Analysis on Process Control Charts for Non-normal Process)

  • 김종걸;김창수;엄상준;김형만;최성원;정동구
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2013년 춘계학술대회
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    • pp.547-556
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    • 2013
  • Control chart is most widely used in SPC(Statistical Process Control), Recently it is a critical issue that the standard control chart is not suitable to non-normal process with very small percent defective. Especially, this problem causes serious errors in the reliability procurement, such as semiconductor, high-precision machining and chemical process etc. Procuring process control technique for non-normal process with very small percent defective and perturbation is becoming urgent. Control chart technique in non-normal distribution become very important issue. In this paper, we investigate on research trend of control charts under non-normal distribution.

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VSI 런-규칙 관리도의 경제적-통계적 설계 (Economic-Statistical Design of VSI Run Rules Charts)

  • 강분규;임태진
    • 품질경영학회지
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    • 제38권2호
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    • pp.190-201
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    • 2010
  • This research proposes a method for designing VSI (Variable Sampling Interval) control charts with supplementary run rules. The basic idea is to apply various run rules and the VSI scheme to a control chart in order to increase the sensitivity. The sampling process of the VSI run rules chart is constructed by Markov chain approach. A procedure for designing the VSI run rules chart is proposed based on Lorenzen and Vance's model. Sensitivity study shows that the VSI run rules charts outperform the FSI (Fixed Sampling Interval) run rules charts for wide range of process mean shifts. A major advantage of the VSI run rules chart over other charts such as CUSUM, EWMA, and adaptive charts is it's simplicity in implementation. Some useful guidelines are proposed based on the sensitivity study.

시공간 탐지 정확성을 고려한 다변량 누적합 관리도의 비교 (Comparison of Multivariate CUSUM Charts Based on Identification Accuracy for Spatio-temporal Surveillance)

  • 이미림
    • 품질경영학회지
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    • 제43권4호
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    • pp.521-532
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    • 2015
  • Purpose: The purpose of this study is to compare two multivariate cumulative sum (MCUSUM) charts designed for spatio-temporal surveillance in terms of not only temporal detection performance but also spatial detection performance. Method: Experiments under various configurations are designed and performed to test two CUSUM charts, namely SMCUSUM and RMCUSUM. In addition to average run length(ARL), two measures of spatial identification accuracy are reported and compared. Results: The RMCUSUM chart provides higher level of spatial identification accuracy while two charts show comparable performance in terms of ARL. Conclusion: The RMCUSUM chart has more flexibility, robustness, and spatial identification accuracy when compared to those of the SMCUSUM chart. We recommend to use the RMCUSUM chart if control limit calibration is not an urgent task.