• 전자통신동향분석
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• 제33권6호
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• pp.34-40
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• 2018

Traditionally, many researchers have conducted research on terahertz technology utilizing optical devices such as lasers. However, nanometer-scale electronic devices using silicon or III-V compound semiconductors have received significant attention regarding the development of a terahertz system owing to the rapid scaling down of devices. This enables an operating frequency of up to approximately 0.5 THz for silicon, and approximately 1 THz for III-V devices. This article reviews the recent trends of terahertz monolithic integrated circuits based on several electronic devices such as CMOS, SiGe BiCMOS, and InP HBT/HEMT, and a particular quantum device, an RTD.

• 대한전자공학회논문지
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• 제23권6호
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• pp.820-832
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• 1986

In contrast to conventional liquid phase epitaxy of GaAs, surface kinetics limited growth is predominant in selective liquid phase epitaxy. For the stripe openings in the high-index crystal-lographic directions, the well-known facet formations and the decompositions into the low index planes or smooth circular surfaces are observed depending on the growth kinetics. For the low index direction stripe, surface kinetics limited growth is evident. By a numerical calcualtion we show that these phenomena are due to the enhanced masstransport by two dimensional diffusion and growth rate anisotropy which is found to be very stdrong with cusped minima for some singular planes in the solution growth as well as in vapor phase epitaxy. Morphological stability is briefly treated in terms of diffusion and its implications on device application are stated. Tese phenomena may be common to III-V compound semiconductors as well as GaAs.

• Transactions on Electrical and Electronic Materials
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• 제18권1호
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• pp.7-12
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• 2017

This work takes place in the context of the development of a transport phenomena simulation based on group III nitrides. Gallium and boron nitrides (GaN and BN) are both materials with interesting physical properties; they have a direct band gap and are relatively large compared to other semiconductors. The main objective of this paper is to study the effect of boron content on the electron transport of the ternary compound $B_xGa_{(1-x)}N$ and the effect of the temperature of this alloy at x=50% boron percentage, specifically the piezoelectric, acoustic, and polar optical scatterings as a function of the energy, and the electron energy and drift velocity versus the applied electric field for different boron compositions ($B_xGa_{(1-x)}N$), at various temperatures for $B_{0.5}Ga_{0.5}N$. Monte carlo simulation, was employed and the three valleys of the conduction band (${\Gamma}$, L, X) were considered to be non-parabolic. We focus on the interactions that do not significantly affect the behavior of the electron. Nevertheless, they are introduced to obtain a quantitative description of the electronic dynamics. We find that the form of the velocity-field characteristic changes substantially when the temperature is increased, and a remarkable effect is observed from the boron content in $B_xGa_{(1-x)}N$ alloy and the applied field on the dynamics of holders within the lattice as a result of interaction mechanisms.

• 한국인터넷방송통신학회논문지
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• 제24권4호
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• pp.121-127
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• 2024

본 논문에서는 다중 위상배열 구조의 위성통신단말 송수신모듈 적용을 위한 핵심부품인 FEM(Front-End Module) MMIC를 구성품인 전력증폭기 (PA: Power Amplifier)와 저잡음증폭기 (LNA: Low Noise Amplifier)를 단일칩으로 설계하여 제작, 검증하였다. Win-semiconductors사의 화합물반도체 공정인 GaAs PP10 (100nm) 공정을 사용하여 제작하였으며, 전용 시험보드를 이용하여 운용 주파수 대역 7.2-10.5GHz 동작, 출력 1W, 잡음지수 1.5dB 이하의 특성을 확보하였다. 개발된 FEM MMIC는 단일칩으로도 활용이 가능하며, 구성품인 PA, LNA도 각각의 소자로도 활용이 가능하다. 개발된 소자는 해외 부품의 국산화 대체와 X대역을 사용하는 민수/군수의 다양한 응용분야에서 사용될 것이다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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• pp.327.1-327.1
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• 2014

Nitrides-on-silicon structures are considered to be an excellent candidate for unique design architectures and creating devices for high-power applications. Therefore, a lot of effort has been concentrating on growing high-quality III-nitrides on Si substrates, mostly Si(111) and Si(001) substrates. However, there are several fundamental problems in the growth of nitride compound semiconductors on silicon. First, the large difference in lattice constants and thermal expansion coefficients will lead to misfit dislocation and stress in the epitaxial films. Second, the growth of polar compounds on a non-polar substrate can lead to antiphase domains or other defective structures. Even though the lattice mismatches are reached to 16.9 % to GaN and 19 % to AlN and a number of dislocations are originated, Si(111) has been selected as the substrate for the epitaxial growth of nitrides because it is always favored due to its three-fold symmetry at the surface, which gives a good rotational matching for the six-fold symmetry of the wurtzite structure of nitrides. Also, Si(001) has been used for the growth of nitrides due to a possible integration of nitride devices with silicon technology despite a four-fold symmetry and a surface reconstruction. Moreover, Si(110), one of surface orientations used in the silicon technology, begins to attract attention as a substrate for the epitaxial growth of nitrides due to an interesting interface structure. In this system, the close lattice match along the [-1100]AlN/[001]Si direction promotes the faster growth along a particular crystal orientation. However, there are insufficient until now on the studies for the growth of nitride compound semiconductors on Si(110) substrate from a microstructural point of view. In this work, the microstructural properties of nitride thin layers grown on Si(110) have been characterized using various TEM techniques. The main purpose of this study was to understand the atomic structure and the strain behavior of III-nitrides grown on Si(110) substrate by molecular beam epitaxy (MBE). Insight gained at the microscopic level regarding how thin layer grows at the interface is essential for the growth of high quality thin films for various applications.

• 한국정보통신학회:학술대회논문집
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• 한국해양정보통신학회 2005년도 춘계종합학술대회
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• pp.1026-1029
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• 2005

Grating 이 형성된 SiO$_2$ 기판상에 ZnO 박막을 graphoepitaxy 법으로 형성시킬 것을 제안하고 그 가능성을 고찰하였다. Si(100) 기판상에 노광작업(photolithograpy)을 이용하여 요철구조를 형성시킨 다음 자연산화를 시켜서 SiO$_2$ 기판을 제작하였고, 제작된 요철구조 위에 열증착 법으로 Zn 를 증착 시킨 후 이를 산화 시켜서 ZnO 박막을 형성 시켰다. 또한 열처리에 의한 결정성의 변화를 관찰하기 위하여 700 ${\sim}$ 900 $^{\circ}C$에서 열처리를 하였다. 제작된 시료는 Atomic Force Microscopy (AFM)로 표면을 관찰하였으며, Photoluminescence (PL) 을 이용하여 결정성의 변화를 관찰하였다.

• 전기화학회지
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• 제8권3호
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• pp.130-134
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• 2005

본 연구에서는 그동안 전기화학적으로 합성되지 못했던 III-V족 화합물 반도체 InSb를 구연산 용액으로부터 합성하였으며 자체 제조한 AAO를 나노템플릿으로 이용하여 정전압 도금을 실시하여 InSb 나노와이어를 제조하였다 제조된 InSb나노와이어는 X선 회절분석 결과 단결정의 나노와이어는 아니었으나 정확하게 화학양론을 만족시키는 화합물임을 확인하였고, 평판 박막 상태의 InSb와는 달리 나노와이어의 길이방향으로 (220) 방향의 결정이 주로 성장하는 우선결정방위를 가지고 있음을 알 수 있었다. 또한 집합적으로 배열된 상태에서 측정된 I-V특성 곡선에서는 n형 반도체의 특성을 보이되 밴드갭이 좁고, 전자이동도가 큰 InSb고유의 특성상 반금속과 유사한 전기적 특성을 보유하고 있음을 확인하였다.

• 센서학회지
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• 제29권2호
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• pp.112-117
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• 2020

Xylene is a hazardous volatile organic compound that should be precisely measured to monitor indoor air quality. However, the selective and sensitive detection of ppm-level xylene using oxide-semiconductor gas sensors remains a challenge. In this study, pure and Cr-doped Co₃O₄ nanoparticles (NPs) were prepared using flame spray pyrolysis, and their gas-sensing characteristics to 5-ppm xylene at 250 ℃ were investigated. The 4 at% Cr-doped Co₃O₄ NPs exhibited a high gas response to 5-ppm xylene (resistance ratio to gas and air = 39.1) and negligible cross-responses to other representative and ubiquitous indoor pollutants such as ethanol, benzene, formaldehyde, carbon monoxide, and ammonia. In this paper, the enhancement of the gas response and selectivity of Co₃O₄ NPs to xylene by Cr doping was discussed in relation to the catalytic promotion of the gas-sensing reaction. This sensor can be used to monitor indoor xylene.

• 한국진공학회지
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• 제22권3호
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• pp.162-167
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• 2013

이종 p-InGaP/N-InAlGaP 접합 화합물 반도체 태양전지의 에피 구조를 제안하였다. 제안된 이종접합구조와 p-InGaP/p-GaAs/N-InAlGaP와 동종 p-InGaP/n-InGaP 접합구조 태양전지의 전류-전압 특성곡선을 시뮬레이션하고 결과를 비교분석하였다. 이종 p-InGaP/N-InAlGaP 접합구조에서 가장 높은 최대출력과 곡선인자(fill factor)를 나타내는 시뮬레이션 결과를 얻었으며 이를 바탕으로 제안된 이종접합 에피구조를 최적화하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
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• pp.973-976
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• 2004

The results of numerous studies in III-V semiconductors show that sulfur treatment improves the electrical parameters of III-V compound devices. In this article, we examine the effects of sulfidation of HgCdTe surface on the interfacial characteristics of metal-ZnS-HgCdTe structures. Different from sulfidation in III-V material, S can not be act as an impurity because II-S compounds (ZnS, CdS) generally used as passivant for HgCdTe. Our studies of sulfur-treatment on HgCdTe surface show that sulfur agent forms the S- S, II-S bonds at the surface layer. These bonds are very effective to improve the electrical properties of ZnS layer on HgCdTe by reducing the possibility of native oxides formation. After the sulfidation process, MIS capacitors of HgCdTe show great improvement in electrical properties, such as low density of fixed charge and reduced hystereisis width.