• Journal of Korean Vacuum Science & Technology
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• 제4권3호
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• pp.73-77
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• 2000

Single crystal and polycrystalline Si thin films were doped with phosphorus by a 2-zone diffusion method to develop the low-resistivity polycrystalline Si electrode for a hemispherical grain. Solid phosphorus source was used in order to achieve uniformly and highly doped surface region of polycrystalline Si films having rough surface morphology. In case of 2-zone diffusion method, it is proved that the heavy doping near the surface area can be achieved even at a relatively low temperature. SIMS analysis revealed that phosphorus doping concentration in case of using solid P as a doping source was about 50 times as that of phosphine source at 750$^{\circ}C$. Also, ASR analysis revealed that the carrier concentration was about 50 times as that of phosphine. In order to evaluate the electrical characteristics of doped polycrystalline Si films for semiconductor devices, MOS capacitors were fabricated to measure capacitance of polycrystalline Si films. In ${\pm}$2 V measuring condition, Si films, doped with solid source, have 8% higher $C_{min}$ than that of unadditional doped Si films and 3% higher $C_{min}$ than that of Si films doped with $PH_3$ source. The leakage current of these films was a few fA/${\mu}m^2$. As a result, a 2-zone diffusion method is suggested as an effective method to achieve highly doped polycrystalline Si films even at low temperature.

• 한국표면공학회지
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• 제29권6호
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• pp.829-833
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• 1996

Superconducting YBaCuO thin films were deposited on MgO (100) single crystal substrate by rf reactive sputtering method. Sputtering target was prepared by mixing the original powders of $Y_2O_3$, $BaCO_3$, and CuO at $830^{\circ}C$, and its composition was $YBa_2Cu_{3.3}O_x$ adding the excess CuO to compensate for the loss of Cu in the deposition process. The sputtering conditions for a high quality of YBCO thin film were: substrate temperature of 13$0^{\circ}C$; gas pressure of 10 mTorr; gas mixture ($O_2$: Ar =10: 90); distance of 2.5 inch; and rf power density of 4.87 W /$\textrm{cm}^2$. The deposition rate was 2.4~2.6 nm/min. From the RBS results, it was found that Cu and Ba contents in thin films decreased with the increase of substrate temperature. The increase of gas pressure resulted in significant deficiency of Ba elements.

• Current Applied Physics
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• 제18권11호
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• pp.1399-1402
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• 2018

Nanorod films of cobalt oxide ($Co_3O_4$) have been grown by a unique oblique angle deposition (OAD) technique in an e-beam evaporator for supercapacitor electrode applications. This technique offers a non-chemical route to achieve large aspect ratio nanorods. The fabricated electrodes at OAD $80^{\circ}$ exhibited a specific capacitance of 2875 F/g. The electrochemically active surface area was $1397cm^{-2}$, estimated from the non-Faradaic capacitive current region. Peak energy and power densities obtained for $Co_3O_4$ nanorods were 57.7 Wh/Kg and 9.5 kW/kg, respectively. The $Co_3O_4$ nanorod electrode showed a good endurance of 2000 charge-discharge cycles with 62% retention. The OAD approach for fabricating supercapacitor nanostructured electrodes can be exploited for the fabrication of a broad range of metal oxide materials.

• 한국전기전자재료학회논문지
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• 제30권3호
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• pp.133-138
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• 2017

We evaluated the structural, electrical and optical properties of tungsten (W)-doped $Ge_8Sb_2Te_{11}$ thin films. In a previous work, GeSbTe alloys were doped with different materials in an attempt to improve thermal stability. 200 mm thick $Ge_8Sb_2Te_{11}$ and W-doped $Ge_8Sb_2Te_{11}$ films were deposited on p-type Si (100) and glass substrates using a magnetron co-sputtering system at room temperature. The fabricated films were annealed in a furnace in the $0{\sim}400^{\circ}C$ temperature range. The structural properties were analyzed using X-ray diffraction (X'pert PRO, Phillips). The results showed increased crystallization temperature ($T_c$) leading to thermal stability in the amorphous state. The optical properties were analyzed using an UV-Vis-IR spectrophotometer (Shimadzu, U-3501, range : 300~3,000 nm). The results showed an increase in the crystalline material optical energy band gap ($E_{op}$) and an increase in the $E_{op}$ difference (${\Delta}E_{op}$). This is a good effect to reduce memory device noise. The electrical properties were analyzed using a 4-point probe (CNT-series). This showed increased sheet resistance ($R_s$), which reduces programming current in the memory device.

• 대한전자공학회논문지SD
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• 제38권7호
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• pp.473-478
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• 2001

강유전 물질인 Pb/sub 0.99/［(Zr/sub 0/6Sn/sub 0.4/)/0.9/Ti/sub 0.1/］0.98/Nb/sub 0.02/O₃(PNZST) 박막을 10 mole%의 과잉 PbO가 첨가된 타겟을 이용하여 La/sub 0.5/Sr/sub 0.5/CoO₃(LSCO)/Pt/Ti/SiO₂/Si 기판상에 RF 마그네트론 스퍼터링 방법으로 증착하였다. 증착된 박막에 대하여 온도와 시간을 다양하게 변화시키면서 급속 열처리(rapid thermal annealing) 한 후, 그 결정성과 전기적 특성을 조사하였다. 80 W의 RF 전력, 500 ℃의 기판온도에서 증착한 후, 급속 열처리된 박막이 페로브스카이트상으로 결정화되었으며, 650 ℃, 공기중에서 10초동안 급속 열처리된 박막이 가장 우수한 결정성을 나타내었다. 이러한 박막으로 제작된 PNZST 커패시터는 약 20 μC/㎠정도의 잔류 분극과 약 50 kV/cm 정도의 항전계를 나타내었으며, 2.2×10/sup 9/의 스위칭 후에도 잔류분극의 감소는 10 %미만이었다.

• 통합자연과학논문집
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• 제13권3호
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• pp.87-91
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• 2020

Molybdenum carbide (MoC_x) thin films (TFs) were deposited by reactive radio frequency (rf) magnetron co-sputtering in high vacuum chamber. We compared the properties of MoC_x thin films as the rf power changed on C target. The result of alpha step measurement showed that the thickness of the MoC_x TFs varied from163.3 to 194.86 nm as C power was increased from 160 to 200 W. The crystallinity of MoC_x such as b-Mo₂C, Mo₂C, and diamond like carbon (DLC) structures were observed by XRD. The oxidation states of Mo and C were determined using high resolution XPS spectra of Mo 3d and C 1s were deconvoluted. Molybdenum was consisted of Mo, Mo⁴⁺, and Mo⁶⁺ species. And C was deconvoluted to C-Mo, C, C-O, and C=O species.

• 열처리공학회지
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• 제23권1호
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• pp.17-22
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• 2010

The enhancement of adhesion for Cr film on polycarbonate (PC) substrate with electron irradiation treatment was considered. The electron treatment changes the contact angle of the PC substrates. As increase the electron energy from 300 eV to 900 eV, the contact angle decreases from $90^{\circ}$ to $60^{\circ}C$. It is supposed that electron treatment changes the chemical property of PC substrate into hydrophilic one. The micro surface roughness was also affected by electron treatment. The PC substrates irradiated with intense electron beam of 900 eV show the rougher surface than those of other PC substrates. Cr thin films deposited on the PC substrate treated with electron irradiation at 900 eV show the higher adhesion than that of the Cr thin film deposited untreated bare PC substrates.

• 한국표면공학회지
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• 제34권5호
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• pp.503-509
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• 2001

Thin films of hydrogenated amorphous silicon (a-Si : H) and hydrogenated amorphous silicon carbide (a-SiC:H) of different compositions were deposited on Si(100) wafer and glass by RF plasma-enhanced chemical vapor deposition (RF-PECVD). In the present work, we have investigated the effects of the RF power on the properties, such as optical band gap, transmittance and crystallinity. The Raman data show that the a-Si:H material consists of an amorphous and crystalline phase for the co-presence of two peaks centered at 480 and $520 cm^{-1}$ . The UV-VIS data suggested that the optical energy band gap ($E_{g}$ ) is not changed effectively with RF power and the obtained $E_{g}$(1.80eV) of the $\mu$c-Si:H thin film has almost the same value of a-Si:H thin film (1.75eV), indicating that the crystallity of hydrogenated amorphous silicon thin film can mainly not affected to their optical properties. However, the experimental results have shown that$ E_{g}$ of the a-SiC:H thin films changed little on the annealing temperature while $E_{g}$ increased with the RF power. The Raman spectrum of the a-SiC:H thin films annealed at high temperatures showed that graphitization of carbon clusters and microcrystalline silicon occurs.

• 전기화학회지
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• 제2권1호
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• pp.46-49
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• 1999

Electron-beam 증발장치를 이용하여 리튬 박막 2차 전지 양극용 lithium cobalt oxide 박막을 제조하였다. Stainless steel -기판 위에 입혀진 $LiCoO_2$ 박막은 열처리 과정을 거쳐 잘 발달된 hexagonal 구조의 (003)면을 나타냈으며, 3.9 V 부근에서 전위 평탄 영역이 나타났다. $LiCoO_2$, 박막은 증착속도가 증가함에 따라 Li/co 조성비가 양론비에 근접하였으며, $15{\AA}/s$의 증착속도로 제작한 경우 높은 방전용량을 나타내었다. 열처리 온도가 증가함에 따라 용량이 증가하여 $700^{\circ}C$에서 최대 값을 나타내었으나, 그 이상의 온도에서는 기판과의 반응 때문에 방전용량이 현저히 감소하였다. 박막 내부의 리튬과 코발트의 불균일한 조성은 초기 방전용량의 감소를 가져왔다.

• 대한화학회지
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• 제62권2호
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• pp.118-123
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• 2018

The hexagonal tungsten bronze $Cs_xWO_3$ nanoparticle was synthesized by a chemical coprecipitation method of ammonium tungstate and $Cs_2CO_3$ in acidic condition. This synthetic method for cesium tungsten bronze is reported for the first time as far as we know. The synthesized $Cs_xWO_3$ as precipitated showed a weak crystallinity of hexagonal unit cell with a crystallite size of about 4 nm without annealing. When the synthesized $Cs_xWO_3$ was annealed in $N_2$ atmosphere, the crystallinity and crystallite size systematically increased maintaining the typical hexagonal tungsten bronze structure as the annealing temperature increased. The analyzed Cs content in the bronze was about 0.3 vs W, which is very close to the theoretical maximum value, 1/3 in cesium tungsten bronze. According to XPS analysis, the reduced tungsten ions existed as both the forms of $W^{5+}$ and $W^{4+}$ and the contents systematically increased as the annealing temperature increased up to $800^{\circ}C$. The $Cs_xWO_3$ thin films on PET substrate were also prepared by a wet-coating method using the ball-milled solution of the annealed $Cs_xWO_3$ nanoparticles at various temperatures. The near-infrared shielding property of these thin films increased systematically as the annealing temperature increased up to $800^{\circ}C$ as expected with the increased contents of reduced tungsten ions.