• Proceedings of the IEEK Conference
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• summer
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• pp.199-203
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• 2004

In this paper, we only describe the digital block of two-channel 18-bit analog-to-digital (A/D) converter employing sigma-delta method and xl28 decimation. The device contains two fourth comb filters with 1-bit input from sigma­delta modulator. each followed by a digital half band FIR(Finite Impulse Response) filters. The external analog sigma-delta modulators are sampled at 6.144MHz and the digital words are output at 48kHz. The fourth-order comb filter has designed 3 types of ways for optimal power consumption and signal-to-noise ratio. The following 3 digital filters are designed with 12tap, 22tap and 116tap to meet the specification. These filters eliminate images of the base band audio signal that exist at multiples of the input sample rate. We also designed these filters with 8bit and 16bit filter coefficient to analysis signal-to-noise ratio and hardware complexity. It also included digital output interface block for I2S serial data protocol, test circuit and internal input vector generator. It is fabricated with 0.35um HYNIX standard CMOS cell library with 3.3V supply voltage and the chip size is 2000um by 2000um. The function and the performance have been verified using Verilog XL logic simulator and Matlab tool.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.28 no.3C
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• pp.271-278
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• 2003

In this paper, we propose a new MLP based detector which has low circuit complexity and fast adaptation capability for CDMA downlink in frequency selective fading, and is easy for parameter optimization. The simplified structure of the proposed MLP is designed by making use of transmission characteristics of downlinks such that all users signals transmitted over same propagation paths and the number of channelization codes are limited. Significant performance improvement over Rake receiver can be obtained with the proposed MLP and the efficiency of the proposed MLP was compared with that of conventional MLP.

• Journal of Semiconductor Engineering
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• v.1 no.1
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• pp.57-63
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• 2020

Complementary metal-oxide-semiconductor (CMOS) technology is now facing a power scaling limit to increase integration density. Since 1970s, multi-valued logic (MVL) has been considered as promising alternative to resolve power scaling challenge for increasing information density up to peta-scale level by reducing the system complexity. Over the past several decades, however, a power-scalable and mass-producible MVL technology has been absent so that MVL circuit and system implementation have been delayed. Recently, compact MVL device researches incorporating multiple-switching characteristics in a single device such as 2D heterojunction-based negative-differential resistance (NDR)/transconductance (NDT) devices and quantum-dot/superlattices-based constant intermediate current have been actively performed. Meanwhile, wafer-scale, energy-efficient and variation-tolerant ternary-CMOS (T-CMOS) technology has been demonstrated through commercial foundry. In this review paper, an overview for MVL development history including recent studies will be presented. Then, the status and its future research direction of MVL technology will be discussed focusing on the T-CMOS technology for peta-scale information processing in semiconductor chip.

• Journal of Institute of Control, Robotics and Systems
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• v.4 no.3
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• pp.384-391
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• 1998

When a device is mounted on the PCB, it is impossible to have zero defects due to many unpredictable problems. Among these problems, devices with bent corner leads due to mis-handling and which are not placed at a given point measured along the axis are principal problem in SMT(Surface Mounting Technology). It is obvious that given the complexity of the inspection task, the efficiency of a human inspection is questionable. Thus, new technologies for inspection of SMD(Surface Mounting Device) should be explored. An example of such technologies is the Automated Visual Inspection(AVI), wherein the vision system plays a key role to correct this problem. In implementing vision system, high-speed and high-precision are indispensable for practical purposes. In this paper, a new algorithm based on the Radon transform which uses a projection technique to inspect the FIC(Flat Integrated Circuit) device is proposed. The proposed algorithm is compared with other algorithms by measuring the position error(center and angle) and the processing time for the device image, characterized by line scan camera.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.1
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• pp.61-71
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• 2003

Interconnect test for highly integrated environments like SoC, becomes more important as the complexity of a circuit increases. This importance is from two facts, test time and complete diagnosis. Since the interconnect test between IPs is based on the scan technology such as IEEE1149.1 and IEEE P1500, it takes long test time to apply test vectors serially through a long scan chain. Complete diagnosis is another important issue because a defect on interconnects are shown as a defect on a chip. But generally, interconnect test algorithms that need the short test time can not do complete diagnosis and algorithms that perform complete diagnosis need long test time. A new interconnect test algorithm is developed. The new algorithm can provide a complete diagnosis for all faults with shorter test length compared to the previous algorithms.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.41 no.6
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• pp.27-35
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• 2004

Finite or Galois fields have been used in numerous applications such as error correcting codes, digital signal processing and cryptography. These applications often require exponetiation on GF(2$^{m}$ ) which is a very computationally intensive operation. Most of the existing methods implemented the exponetiation by iterative methods using repeated multiplications, which leads to much computational load, or needed much hardware cost because of their structural complexity in implementing. In this paper, we present an effective VLSI architecture for exponentiation on GF(2$^{m}$ ). This circuit computes the exponentiation by multiplying product terms, each of which corresponds to an exponent bit. Until now use of this type algorithm has been confined to a primitive element but we generalize it to any elements in GF(2$^{m}$ ).

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2004.05b
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• pp.59-63
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• 2004

In this paper, we have developed a 2-port resistive frequency mixer for the retrodirective active array. The circuit topology is consisted of 2-port to avoid the complexity of LO and RF signal combination, using a pseudomorphic HEMT device. The operating frequencies are 4.0 GHz, 2.01 GHz, and 1.99 GHz for LO, RF, and IF, respectively. Conversion loss is measured to be -1㏈ and 1-㏈ compression point -15 ㏈m at the LO power of -10 ㏈m.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2010.05a
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• pp.809-811
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• 2010

In most floating-point operations related with 3D graphic applications for mobile devices, properly approximated data calculations with reduced complexity and low power are preferable to exactly rounded floating-point operations with unnecessary preciseness with cost. Among all the sophisticated floating-point arithmetic operations, multiplication and division are the most complicated and time-consuming, and they can be transformed into addition and subtraction repectively by adopting the logarithmic conversion. In this process, the most important factor for performance is how high we can make an approximation of the logarithm conversion. In this paper, we cover the trends in studying the logarithm conversion circuit designs. We also discuss the important factor in design issues and the applicable fields in detail.

• Korean Journal of Remote Sensing
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• v.20 no.1
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• pp.57-64
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• 2004

In GIS-based network analysis, topological measure of network structure can be considered as one of important factors in the urban transportation analysis. Related to this measure, it is known that the connectivity indices such as alpha index and gamma index, which mean degree of network connectivity and complexity on a graph or a circuit, provide fundamental information. On the other hand, shimbel index is one of GIS-based spatial metrics to characterize degree of network concentration. However, the approach using these quantitative indices has not been widely used in practical level yet. In this study, an application program, in complied as extension, running on ArcView- GIS is implemented and demonstrated case examples using basic layers such as road centerline and administrative boundary. In this approach, geo-spatial imagery can be effectively used to actual applications to determine the analysis zone, which is composed of networks to extract these indices. As the results of the implementation and the case examples, it is notified that alpha and gamma indices as well as shimbel index can be used as referential data or auxiliary information for urban planning and transportation planning.

• KSCI Review
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• v.2 no.1
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• pp.121-129
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• 1995

Fault simulation of logic circuits is an important part of the test-generation process. It is used for the propose of generation fault dictionaries or for the verification of the adequacy of tests. In this paper, a backtrace fault simulation is proposed to test generation. This is consists of 3 part ; initialization phase for given circuit, backtrace fault simulation phase to find fault list and reevaluation phase to list event. The main idea of this algorithm is to retain a minimum fault list by cutting uncontrollable lines of path when a logic event occurs in backward tracing phases. And the simulator is revaluates a fault list associated with the output of an element only if logic event occurs at any of its inputs when a list event occurs at one of its primary inputs. It reguires a O(n) memory space complexity. where n is a number of signal lines for the given circuits. Several examples are given to illustrate the power of this algorithm.