• 제목/요약/키워드: Chip on Glass (COG)

검색결과 39건 처리시간 0.058초

횡방향 열초음파 본딩 기법을 이용한 COG 접합 (Chip on Glass Interconnection using Lateral Thermosonic Bonding Technology)

  • 하창완;윤원수;박금생;김경수
    • 한국정밀공학회지
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    • 제27권7호
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    • pp.7-12
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    • 2010
  • In this paper, chip-on-glass(COG) interconnection with anisotropic conductive film(ACF) using lateral thermosonic bonding technology is considered. In general, thermo-compression bonding which is used in practice for flip-chip bonding suffers from the low productivity due to the long bonding time. It will be shown that the bonding time can be improved by using lateral thermosonic bonding in which lateral ultrasonic vibration together with thermo-compression is utilized. By measuring the internal temperature of ACF, the fast curing of ACF thanks to lateral ultrasonic vibration will be verified. Moreover, to prove the reliability of the lateral thermosonic bonding, observation of pressured mark by conductive particles, shear test, and water absorption test will be conducted.

ACF를 이용한 COG 접합 공정에서 도전볼의 음영비와 접촉 저항과의 관계 (Relationship between Contrast Ratio of Conductive Particle and Contact Resistance on COG Bonding using ACF)

  • 진송완;정영훈;최은수;김보선;윤원수
    • 한국정밀공학회지
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    • 제31권9호
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    • pp.831-838
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    • 2014
  • Chip on glass (COG) bonding using anisotropic conductive film (ACF) is a key technology to assemble a driver IC onto a LCD glass panel. In this paper, an experimental investigation was conducted to investigate the correlation between contact resistance and characteristics of image taken by machine vision based inspection system. The results show that the contact resistance was strongly influenced by the contrast ratio of conductive particle rather than the number of conductive particles. Also, number of conductive particles whose contrast ratio is below 0.75 is crucial for determining the quality of the assembled samples. On the other hand, in the result of high temperature high humidity storage test, the contrast ratio of samples was increased. However, in the case of open-circuit samples after temperature humidity storage test, the number of conductive particles whose contrast ratio is above 0.75 was more than that of the closed-circuit samples.

COG(chip on glass) 구조에서 유리를 투과하는 레이저 조사 방식에 의한 area array type 패키지의 마운팅 공정

  • 이종현;김원용;이용호;김영석
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2001년도 The IMAPS-Korea Workshop 2001 Emerging Technology on packaging
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    • pp.119-126
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    • 2001
  • Chip-on-glass(COG) mounting of area array electronic packages was attempted by heating the rear surface of a contact pad film deposited on a glass substrate. The pads consisted of an adhesion(i.e. Cr or Ti) and a top coating layer(i.e. Ni or Cu) was heated by an UV laser beam transmitted through the glass substrate. The laser energy absorbed on the pad raised the temperature of a solder ball which is in physical contact with the pad, forming a reflowed solder bump. The effects of the adhesion and top coating layer on the laser reflow soldering were studied by measuring temperature profile of the ball during the laser heating process. The results were discussed based on the measurement of reflectivity of the adhesion layer. In addition, the microstructures of solder bumps and their mechanical properties were examined.

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마그네틱 펄스 용접 및 성형기공 (Magnetic Pulse Solutions)

  • 박삼수
    • 한국레이저가공학회:학술대회논문집
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    • 한국레이저가공학회 2006년도 추계학술발표대회 논문집
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    • pp.53-81
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    • 2006
  • A COG(Chip on Glass) bonding process that is one of display packaging technology and bonds between driver IC chip and a glass panel using ACF(Anisotropic Conductive Film)has been investigated by using diode laser. This method is possible to raise cure temperature of ACF within one second and can reduce the total process time for COG bonding by a conventional method such as a hot plate. Also we can get good pressure mark on the surface of electrodes and higher bonding strength than that by convention method. Results show that laser COG bonding can give low pressure bonding and decrease a warpage of panel. We believe that it can be applied to fine pitch module.

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COG 칩의 얼라인을 위한 영역분할 패턴매칭 (The Area Segmentation Pattern Matching for COG Chip Alignment)

  • 김은석;왕지남
    • 한국정보통신학회논문지
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    • 제9권6호
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    • pp.1282-1287
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    • 2005
  • 수 마이크로 단위로 계측되는 반도체 COG의 불량 검사에 있어서 칩 얼라인은 검사의 정확성을 높이는데 매우 중요한 역할을 한다. 본 논문에서는 칩 얼라인의 정확성을 높이기 위해서 영역분할 패턴매칭 방법을 제안한다. 영역분할 패턴매칭 방법은 세분화 된 영역 내의 특징치들과 영역들 간의 상관관계를 비교하여 매칭된다. 그리고 불량 패턴으로 인한 매칭오류를 최소화 하기 위해서 패턴 주위의 3영역을 학습시킨다. 제안된 방법은 분할 된 영역에서 특징치를 찾기 때문에 매칭 시간을 단축시키는 효과와 정확성을 높일 수 있는 이점을 가지고 있다.